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Authors:Kristoffer Andersson: Microwave Electronics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, Sweden
Christian Fager: Microwave Electronics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, Sweden
Peter Linnér: Microwave Electronics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, Sweden
Herbert Zirath: Microwave Electronics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, Sweden
Publication title:Statistical methods for FET-model extraction
Conference:GigaHertz 2003. Proceedings from the Seventh Symposium
Publication type: Abstract and Fulltext
Issue:008
Article No.:011
Abstract:A statistical method for extracting smallsignal FET models is presented. The method is derived as a maximum likelihood estimate of the model parameters with respect to measured S-parameters. The method accounts for uncertainties both in measurements and in extracted parasitic elements. An advantage with the proposed method is that the covariance of the estimate is obtained. The covariance is then used to calculate statistical bounds of the extracted parameters. Monte-Carlo simulations are used to verify the statistical bounds of the parameters. Good agreement between theory and experiments is obtained; especially for the parasitic elements.
Language:English
Year:2003
No. of pages:4
Series:Linköping Electronic Conference Proceedings
ISSN (print):1650-3686
ISSN (online):1650-3740
File:http://www.ep.liu.se/ecp/008/011/ecp00811.pdf
Available:2003-11-06
Publisher:Linköping University Electronic Press; Linköpings universitet

REFERENCE TO THIS PAGE
Kristoffer Andersson, Christian Fager, Peter Linnér, Herbert Zirath (2003). Statistical methods for FET-model extraction, GigaHertz 2003. Proceedings from the Seventh Symposium http://www.ep.liu.se/ecp_article/index.en.aspx?issue=008;article=011 (accessed 10/20/2014)