Thin Film Physics: Fulltext Publication Portfolio

LiU > IFM > Material Physics > Thin Film Physics

Fulltext Publication Portfolio

192 publications from 2005 to 2013
Mentioned in social media 470 times*

Journal Articles

Jonas Lauridsen, Per Eklund, Jens Jensen, H Ljungcrantz, A Oberg, E Lewin, U Jansson, A Flink, H Hogberg and Lars Hultman

Microstructure evolution of Ti-Si-C-Ag nanocomposite coatings deposited by DC magnetron sputtering
Acta Materialia, 2010, 58( 20), 6592-6599.

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Web of Science® Times Cited: 6

Grzegorz Greczynski, Jens Jensen and Lars Hultman

CrNx Films Prepared by DC Magnetron Sputtering and High-Power Pulsed Magnetron Sputtering: A Comparative Study
IEEE TRANSACTIONS ON PLASMA SCIENCE, 2010, 38( 11), 3046-3056.

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Web of Science® Times Cited: 5

Galia Pozina, Li-Li Yang, Qingxiang Zhao, Lars Hultman and P G Lagoudakis

Size dependent carrier recombination in ZnO nanocrystals
APPLIED PHYSICS LETTERS, 2010, 97( 13), 131909.

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Web of Science® Times Cited: 7

Grzegorz Greczynski, Jens Jensen, J Bohlmark and Lars Hultman

Microstructure control of CrNx films during high power impulse magnetron sputtering
SURFACE and COATINGS TECHNOLOGY, 2010, 205( 1), 118-130.

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Web of Science® Times Cited: 10

Gintautas Abrasonis, Thomas Oates, Gyoergy J Kovacs, Joerg Grenzer, Per Persson, Karl-Heinz H Heinig, Andrius Martinavicius, Nicole Jeutter, Carsten Baehtz, Mark Tucker, Marcela M M Bilek and Wolfhard Moeller

Nanoscale precipitation patterns in carbon-nickel nanocomposite thin films: Period and tilt control via ion energy and deposition angle
JOURNAL OF APPLIED PHYSICS, 2010, 108( 4), 043503.

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Web of Science® Times Cited: 4

Gunilla Wingqvist, Ferenc Tasnadi, Agne Zukauskaite, Jens Birch, Hans Arwin and Lars Hultman

Increased electromechanical coupling in w-Sc_xAl_1-xN
Applied Physics Letters, 2010, 97( 11), 112902.

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Web of Science® Times Cited: 11

M Sillassen, Per Eklund, N Pryds, N Bonanos and J Bottiger

Concentration-dependent ionic conductivity and thermal stability of magnetron-sputtered nanocrystalline scandia-stabilized zirconia
SOLID STATE IONICS, 2010, 181( 23-24), 1140-1145.

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Web of Science® Times Cited: 1

G Hug, Per Eklund and A Orchowski

Orientation dependence of electron energy loss spectra and dielectric functions of Ti3SiC2 and Ti3AlC2
ULTRAMICROSCOPY, 2010, 110( 8), 1054-1058.

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Web of Science® Times Cited: 4

Johanna Rosén, Martin Dahlqvist, Sergey Simak, D R McKenzie and M M M Bilek

Oxygen incorporation in Ti2AlC: Tuning of anisotropic conductivity
APPLIED PHYSICS LETTERS, 2010, 97( 7), 073103.

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Web of Science® Times Cited: 5

Jonas Lauridsen, Per Eklund, T. Joelsson, H. Ljungcrantz, Å. Öberg, E. Lewin, U. Jansson, Manfred Beckers, Hans Högberg and Lars Hultman

High-rate deposition of amorphous and nanocomposite Ti-Si-C multifunctional coatings
Surface & Coatings Technology, 2010, 205( 2), 299-305.

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Web of Science® Times Cited: 9

Jun Lu, Jun Luo, Shi-Li Zhang, Mikael Ostling and Lars Hultman

On Epitaxy of Ultrathin Ni1-xPtx Silicide Films on Si(001)
ELECTROCHEMICAL AND SOLID STATE LETTERS, 2010, 13( 10), H360-H362.

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Web of Science® Times Cited: 6

M Sillassen, Per Eklund, N Pryds and J Bottiger

Effects of dopant concentration and impurities on the conductivity of magnetron-sputtered nanocrystalline yttria-stabilized zirconia
SOLID STATE IONICS, 2010, 181( 19-20), 864-867.

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Web of Science® Times Cited: 2

Michael Sillassen, Per Eklund, Nini Pryds, Erik Johnson, Ulf Helmersson and Jorgen Bottiger

Low-Temperature Superionic Conductivity in Strained Yttria-Stabilized Zirconia
ADVANCED FUNCTIONAL MATERIALS, 2010, 20( 13), 2071-2076.

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Web of Science® Times Cited: 17

A. Oberg, A. Kassman, B. Andre, U. Wiklund, M. Lindquist, E. Lewin, U. Jansson, Hans Högberg, T. Joelsson and H. Ljungcrantz

Conductive nanocomposite ceramics as tribological and electrical contact materials
European Physical Journal, 2010, 49( 2).

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Web of Science® Times Cited: 5

Zsolt Czigany and Lars Hultman

Interpretation of electron diffraction patterns from amorphous and fullerene-like carbon allotropes
Ultramicroscopy, 2010, 110( 7), 815-819.

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Web of Science® Times Cited: 10

Erik Lewin, Kristina Buchholt, Jun Lu, Lars Hultman, Anita Lloyd Spetz and Ulf Jansson

Carbide and nanocomposite thin films in the Ti-Pt-C system
Thin Solid Films, 2010, 518( 18), 5104-5109.

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Web of Science® Times Cited: 5

Esteban Broitman, Zs. Czigany, Grzegorz Greczynski, J. Bohlmark, R. Cremer and Lars Hultman

Industrial-scale deposition of highly adherent CNx films on steel substrates
Surface & Coatings Technology, 2010, 204( 21-22), 3349-3357.

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Web of Science® Times Cited: 5

Tobias Marten, Eyvas Isaev, Björn Alling, Lars Hultman and Igor Abrikosov

Single-monolayer SiN_x embedded in TiN: A first-principles study
Physical Review B. Condensed Matter and Materials Physics, 2010, 81( 21), 212102.

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Web of Science® Times Cited: 9

Martin Dahlqvist, Björn Alling and Johanna Rosén

Stability trends of MAX phases from first principles
Physical Review B. Condensed Matter and Materials Physics, 2010, 81( 22), 220102.

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Web of Science® Times Cited: 9

K Pedersen, J Bottiger, M Sridharan, M Sillassen and Per Eklund

Texture and microstructure of Cr2O3 and (Cr,Al)2O3 thin films deposited by reactive inductively coupled plasma magnetron sputtering
THIN SOLID FILMS, 2010, 518( 15), 4294-4298.

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Web of Science® Times Cited: 12

Grzegorz Greczynski and Lars Hultman

Time and energy resolved ion mass spectroscopy studies of the ion flux during high power pulsed magnetron sputtering of Cr in Ar and Ar/N-2 atmospheres
VACUUM, 2010, 84( 9), 1159-1170.

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Web of Science® Times Cited: 16

Carina Höglund, Jens Birch, Björn Alling, Javier Bareño, Zsolt Czigány, Per O. Å. Persson, Gunilla Wingqvist, Agne Zukauskaite and Lars Hultman

Wurtzite-structure Sc_1-xAl_xN solid solution films grown by reactive magnetron sputter epitaxy: structural characterization and first-principles calculations
Journal of Applied Physics, 2010, 107( 12), 123515.

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Web of Science® Times Cited: 14

Carina Höglund, Björn Alling, Jens Birch, Manfred Beckers, Per O. Å. Persson, Carsten Baehtz, Zsolt Czigány, Jens Jensen and Lars Hultman

Effects of volume mismatch and electronic structure on the decomposition of ScAlN and TiAlN solid solutions
Physical Review B. Condensed Matter and Materials Physics, 2010, 81( 22), 224101.

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Web of Science® Times Cited: 4

Ferenc Tasnadi, Björn Alling, Carina Höglund, Gunilla Wingqvist, Jens Birch, Lars Hultman and Igor Abrikosov

Origin of the Anomalous Piezoelectric Response in Wurtzite ScxAl1-xN Alloys
Physical Review Letters, 2010, 104( 13), 137601.

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Web of Science® Times Cited: 25

Jianqiang Zhu, Anders Eriksson, Naureen Ghafoor, M P Johansson, J Sjolen, Lars Hultman, Johanna Rosén and Magnus Odén

Characterization of worn Ti-Si cathodes used for reactive cathodic arc evaporation
JOURNAL OF VACUUM SCIENCE and TECHNOLOGY A, 2010, 28( 2), 347-353.

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Web of Science® Times Cited: 5

Martin Magnuson, Maurizio Mattesini, Carina Höglund, Jens Birch and Lars Hultman

Electronic structure of GaN and Ga investigated by soft x-ray spectroscopy and first-principles methods
Physical Review B. Condensed Matter and Materials Physics, 2010, 81, 085125.

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Web of Science® Times Cited: 4

Per Eklund, Manfred Beckers, Ulf Jansson, Hans Högberg and Lars Hultman

The M(n+1)AX(n) phases: Materials science and thin-film processing
Thin Solid Films, 2010, 518( 8), 1851-1878.

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Web of Science® Times Cited: 123

Jenny Frodelius, Per Eklund, Manfred Beckers, Per Persson, Hans Högberg and Lars Hultman

Sputter deposition from a Ti₂AlC target: Process characterization and conditions for growth of Ti₂AlC
Thin Solid Films, 2010, 518( 6), 1621-1626.

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Web of Science® Times Cited: 14

Volodymyr Khranovskyy, I Tsiaoussis, Gholamreza Yazdi, Lars Hultman and Rositsa Yakimova

Heteroepitaxial ZnO nano hexagons on p-type SiC
JOURNAL OF CRYSTAL GROWTH, 2010, 312( 2), 327-332.

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Web of Science® Times Cited: 8

Martin Dahlqvist, Björn Alling, Igor A. Abrikosov and Johanna Rosén

Phase stability of Ti₂AlC upon oxygen incorporation: A first-principles investigation
Physical Review B. Condensed Matter and Materials Physics, 2010, 81( 2), 024111-1-024111-8.

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Web of Science® Times Cited: 12

Davide Giuseppe Sangiovanni, Valeriu Chirita and Lars Hultman

Electronic mechanism for toughness enhancement in TixM1-xN (M=Mo and W)
Physical Review B. Condensed Matter and Materials Physics, 2010, 81( 10), 104107-104113.

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Web of Science® Times Cited: 12

Conference Articles

Valdas Jokubavicius, Justinas Palisaitis, Remigijus Vasiliauskas, Rositsa Yakimova and Mikael Syväjärvi

Macrodefects in cubic silicon carbide crystals
Materials Science Forum, Vols. 645-648, 2010.

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Ph.D. Theses

Niklas Gunnarsson Sarius

Surface Technology for Optical and Electrical Connectors
2010.

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Jenny Frodelius

Thick and Thin Ti₂AlC Coatings
2010.

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Carina Höglund

Growth and Phase Stability Studies of Epitaxial Sc-Al-N and Ti-Al-N Thin Films
2010.

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Licentiate Theses

Anders Eriksson

Cathodic Arc Synthesis of Ti-Si-C-N Thin Films from Ternary Cathodes
2010.

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Lars Johnson

Nanostructuring and Age Hardening in TiSiCN, ZrAlN, and TiAlN Thin Films
2010.

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