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Thin Film PhysicsIntroduction


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Fulltext Publication Portfolio


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875 publications from 2005 to 2016
Mentioned in social media 249 times*

Journal Articles

Martin Magnuson, M. Mattesini, Carina Höglund, Jens Birch and Lars Hultman
Electronic structure and chemical bonding anisotropy investigation of wurtzite AlN
 
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Physical Review B. Condensed Matter and Materials Physics, 2009, 80, 155105.
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 Web of Science® Times Cited: 15 

 

Thomas W.H. Oates, H. Sugime and S. Noda
Combinatorial surface-enhanced raman spectroscopy and spectroscopic ellipsometry of silver Island films
 
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Journal of Physical Chemistry C, 2009, 113( 12), 4820-4828.
 Web of Science® Times Cited: 19 

 

Manfred Beckers, Carina Höglund, Carsten Baehtz, R.M.S. Martins, Per O. Å. Persson, Lars Hultman and W. Möller
Erik Wallin, Peter Münger, Valeriu Chirita and Ulf Helmersson
Low-temperature alpha-alumina thin film growth: ab initio studies of Al adatom surface migration
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2009, 42( 12), 125302.
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 Web of Science® Times Cited: 7 

 

Axel Flink, R M Saoubi, Finn Giuliani, J Sjolen, T Larsson, Per Persson, M P Johansson and Lars Hultman
Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy
WEAR, 2009, 266( 11-12), 1237-1240.
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 Web of Science® Times Cited: 4 

 

Galia Pozina, David H. Trinh, Hans Högberg, M. Collin, I. Reineck and Lars Hultman
Phase identification in γ- and κ-alumina coatings by cathodoluminescence
Scripta Materialia, 2009, 61( 4), 379-382.
 Web of Science® Times Cited: 2 

 

Carina Höglund, Javier Bareno, Jens Birch, Björn Alling, Zsolt Czigany and Lars Hultman
Cubic Sc1-xAlxN solid solution thin films deposited by reactive magnetron sputter epitaxy onto ScN(111)
JOURNAL OF APPLIED PHYSICS, 2009, 105( 11), 132862.
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 Web of Science® Times Cited: 19 

 

M. Sillassen, Per Eklund, M. Sridharan, N. Pryds, N. Bonanos and J. Bottiger
Ionic conductivity and thermal stability of magnetron-sputtered nanocrystalline yttria-stabilized zirconia
Journal of Applied Physics, 2009, 105( 10), 104907.
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 Web of Science® Times Cited: 20 

 

Axel Flink, Manfred Beckers, Jacob Sjolen, Tommy Larsson, Slawomir Braun, Lennart Karlsson and Lars Hultman
The location and effects of Si in (Ti1-xSix)N-y thin films
JOURNAL OF MATERIALS RESEARCH, 2009, 24( 8), 2483-2498.
 Web of Science® Times Cited: 26 

 

Shahram Amini, Jose M Cordoba Gallego, Andrew R McGhie, Chaoying Ni, Lars Hultman and Magnus Oden
On the Stability of Mg Nanograins to Coarsening after Repeated Melting
NANO LETTERS, 2009, 9( 8), 3082-3086.
 Web of Science® Times Cited: 7 

 

R. Sanz, Jens Jensen, G. Gonzalez-Diaz, O. Martinez, M. Vazquez and M. Hernandez-Velez
Continuous and Localized Mn Implantation of ZnO
NANOSCALE RESEARCH LETTERS, 2009, 4( 8), 878-887.
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 Web of Science® Times Cited: 13 

 

Isabel Van De Keere, Sofia Svedhem, Hans Högberg, Jean Vereecken, Bengt Kasemo and Annick Hubin
In Situ Control of the Oxide Layer on Thermally Evaporated Titanium and Lysozyme Adsorption by Means of Electrochemical Quartz with Dissipation
ACS APPLIED MATERIALS and INTERFACES, 2009, 1( 2), 301-310.
 Web of Science® Times Cited: 5 

 

Y Sun, S Johnsen, Per Eklund, M Sillassen, J Bottiger, N Oeschler, P Sun, F Steglich and B B Iversen
Thermoelectric transport properties of highly oriented FeSb2 thin films
JOURNAL OF APPLIED PHYSICS, 2009, 106( 3).
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 Web of Science® Times Cited: 18 

 

Naureen Ghafoor, Fredrik Eriksson, Arkady Mikhaylushkin, Igor Abrikosov, Eric M. Gullikson, Manfred Beckers, U. Kressing, Lars Hultman and Jens Birch
Effects of O and N impurities on the nanostructural evolution during growth of Cr/Sc multilayers
Journal of Materials Research, 2009, 24( 1), 79-95.
 Web of Science® Times Cited: 2 

 

Vanya Darakchieva, T Hofmann, M Schubert, Bo Sernelius, Bo Monemar, Per Persson, Finn Giuliani, E Alves, H Lu and W J Schaff
Free electron behavior in InN: On the role of dislocations and surface electron accumulation
Applied Physics Letters, 2009, 94( 2), 022109.
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 Web of Science® Times Cited: 29 

 

Carl Hemmingsson, M Boota, R O Rahmatalla, M Junaid, Galia Pozina, Jens Birch and Bo Monemar
Growth and characterization of thick GaN layers grown by halide vapour phase epitaxy on lattice-matched AlInN templates
JOURNAL OF CRYSTAL GROWTH, 2009, 311( 2), 292-297.
 Web of Science® Times Cited: 5 

 

Maurizio Mattesini, Martin Magnuson, Ferenc Tasnádi, Carina Höglund, Igor A. Abrikosov and Lars Hultman
Elastic properties and electrostructural correlations in ternary scandium-based cubic inverse perovskites: A first-principles study
Physical Review B. Condensed Matter and Materials Physics, 2009, 79( 125122).
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 Web of Science® Times Cited: 39 

 

David Trinh, K Back, Galia Pozina, H Blomqvist, T Selinder, M Collin, I Reineck, Lars Hultman and Hans Högberg
Phase transformation in kappa- and gamma-Al2O3 coatings on cutting tool inserts
Surface & Coatings Technology, 2009, 203( 12), 1682-1688.
 Web of Science® Times Cited: 26 

 

Per Persson, Johanna Rosén, D R McKenzie and M M M Bilek
V.N. Popok, Jens Jensen, S. Vuckovic, A. Mackova and C. Trautmann
Johanna Rosén and O Warschkow
Electronic structure of amorphous indium oxide transparent conductors
 
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PHYSICAL REVIEW B, 2009, 80( 11), 115215.
 Web of Science® Times Cited: 27 

 

Björn Alling, Magnus Odén, Lars Hultman and Igor Abrikosov
Pressure enhancement of the isostructural cubic decomposition in Ti1−xAlxN
Applied Physics Letters, 2009, 95( 181906).
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 Web of Science® Times Cited: 34 

 

Gholamreza Yazdi, Per Persson, D Gogova, Lars Hultman, Mikael Syväjärvi and Rositsa Yakimova
Aligned AlN nanowires by self-organized vapor-solid growth
NANOTECHNOLOGY, 2009, 20( 49), 495304.
 Web of Science® Times Cited: 15 

 

M. Ali, Olle Svensk, Z. Zhen, S. Suihkonen, P.T. Törmä, H. Lipsanen, M. Sopanen, Klas Hjort and Jens Jensen
Reduced photoluminescence from InGaN/GaN multiple quantum well structures following 40 MeV iodine ion irradiation
 
Altmetric usage: 1

Physica. B, Condensed matter, 2009, 404( 23-24), 4925-4928.
 Web of Science® Times Cited: 5 

 

Vanya Darakchieva, N P Barradas, Mengyao Xie, K Lorenz, E Alves, M Schubert, Per Persson, Finn Giuliani, F Munnik, Ching-Lien Hsiao, L W Tu and W J Schaff
Role of impurities and dislocations for the unintentional n-type conductivity in InN
PHYSICA B-CONDENSED MATTER, 2009, 404( 22), 4476-4481.
 Web of Science® Times Cited: 12 

 

Gueorgui Kostov Gueorguiev, E Broitman, Andrej Furlan, Sven Stafström and Lars Hultman
Dangling bond energetics in carbon nitride and phosphorus carbide thin films with fullerene-like and amorphous structure
CHEMICAL PHYSICS LETTERS, 2009, 482( 1-3), 110-113.
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 Web of Science® Times Cited: 12 

 

Per Eklund, M. Sridharan, G. Singh and Jorgen Bottiger
Thermal Stability and Phase Transformations of γ-/Amorphous-Al2O3 Thin Films
Plasma processes and polymers, 2009, 6( 1), 907-911.
 Web of Science® Times Cited: 33 

 

Martin Magnuson, Erik Lewin, Lars Hultman and Ulf Jansson
Electronic structure and chemical bonding of nanocrystalline-TiC/amorphous-C nanocomposites
 
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Physical Review B. Condensed Matter and Materials Physics, 2009, 80( 235108).
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 Web of Science® Times Cited: 33 

 

E. Broitman, Andrej Furlan, Gueorgui Kostov Gueorguiev, Zs. Czigany, A M Tarditi, A J Gellman, Sven Stafström and Lars Hultman
Water adsorption on phosphorous-carbide thin films
Surface & Coatings Technology, 2009, 204( 6-7), 1035-1039.
 Web of Science® Times Cited: 7 

 

V. Mikhelashvili, B. Meyler, S. Yoffis, J. Salzman, Magnus Garbrecht, T. Cohen-Hyams, W. D. Kaplan and G. Eisenstein
A nonvolatile memory capacitor based on Au nanocrystals with HfO2 tunneling and blocking layers
Applied Physics Letters, 2009, 95( 2).
 Web of Science® Times Cited: 16 

 

Niklas Gunnarsson Sarius, P. Leisner, X Wang, M. Svensson, C. Vieider and Lars Hultman
Electrochemically based low-cost high precision processing in MOEMS packaging
Electrochimica Acta, 2009, 54( 9), 2458-2465.
 Web of Science® Times Cited: 1 

 

Conference Articles

Arturo Mendoza-Galvan, Marcin Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
Spectroscopic Ellipsometry of Bulk MAX-phases
Proceedings of the AVS 56th International Symposium & Exhibition, 2009, 2009.

Jens Jensen, Ruy Sanz, Miriam Jaafar, Manuel Hernández-Vélez, Agustina Asenjo, Anders Hallén and Manuel Vázquez

Ali Khatibi
Cr-Al-O Ternary Oxide Thin Films Deposited by Magnetron Sputtering
European Materials Research Society(EMRS), 8-10 june 2009, Strasbourg, France, 2009.

V. Mikhelashvili, B. Meyler, S. Yofis, J. Salzman, Magnus Garbrecht, T. Cohen-Hyams, W. Kaplan and G. Eisenstein

Ph.D. Theses

Licentiate Theses

Reports

Student Theses

Gustav Edman Jönsson, Hans Högberg and Lars Hultman

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*Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.
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