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Thin Film PhysicsIntroduction


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Fulltext Publication Portfolio


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1276 publications from 2005 to 2018
1261 publications at LiU from 2005 to 2018
Mentioned in social media 645 times*

Journal Articles

LiU affiliated Henrik Wiklund, Hans Arwin and Kenneth Järrendahl
A FEM-based application for numerical calculations of ellipsometric data
Physica Status Solidi (a) applications and materials science, 2008, 205( 4), 945-948.
 Web of Science® Times Cited: 2 

 

LiU affiliated P.O.A. Persson, Johanna Rosen, D.R. McKenzie, M.M.M. Bilek and Carina Höglund
A solid phase reaction between Ti Cx thin films and Al2 O3 substrates
 
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Journal of Applied Physics, 2008, 103( 6).
 Web of Science® Times Cited: 17 

 

LiU affiliated Martin Magnuson, Ola Wilhelmsson, Maurizio Mattesini, Sa Li, Rajeev Ahuja, Olle Eriksson, Hans Högberg, Lars Hultman and Ulf Jansson
Anisotropy in the electronic structure of V2GeC investigated by soft x-ray emission spectroscopy and first-principles theory
Physical Review B. Condensed Matter and Materials Physics, 2008, 78( 035117).
 Web of Science® Times Cited: 19 

 

LiU affiliated Fredrik Eriksson, Naureen Ghafoor, F. Schäfers, E. M. Gullikson, S. Aouadi, S. Rohde, Lars Hultman and Jens Birch
Atomic scale interface engineering by modulated ion-assisted deposition applied to soft x-ray multilayer optics
Applied Optics, 2008, 47( 23), 4196-4204.
 Web of Science® Times Cited: 14 

 

LiU affiliated B. Gallas, J. Rivory, Hans Arwin, F. Vidal and V.H. Etgens
Changes in optical properties of MnAs thin films on GaAs(001) induced by a- to B-phase transition
Physica Status Solidi (a) applications and materials science, 2008, 205( 4), 859-862.
 Web of Science® Times Cited: 8 

 

LiU affiliated David Huy Trinh, T. Kubart, T. Nyberg, M. Ottosson, Lars Hultman and Hans Högberg
DC Magnetron Sputtering Deposition of Nanocomposite Alumina - Zirconia Thin Films
Thin Solid Films, 2008, 516( 23), 8352-8358.
 Web of Science® Times Cited: 15 

 

LiU affiliated Noël Haddad, Enric Garcia-Caurel, Lars Hultman, Michel W Barsoum and Gilles Hug
Dielectric properties of Ti2AlC and Ti2AlN MAX phases: The conductivity anisotropy
Journal of Applied Physics, 2008, 104( 2).
 Web of Science® Times Cited: 34 

 

LiU affiliated Torun Berlind, G. K. Pribi, D. Thompson, J. O. Woollam and Hans Arwin
Effects of ion concentration on refractive indices offluids measured by the minimum deviation technique
Physica Status Solidi. C, Current topics in solid state physics, 2008, 5( 5), 1249-1252.
 Web of Science® Times Cited: 13 

 

LiU affiliated Naureen Ghafoor, Fredrik Eriksson, Per O.Å Persson, Lars Hultman and Jens Birch
Effects of ion-assisted growth on the layer definition in Cr/Sc multilayers
 
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Thin Solid Films, 2008, 516( 6), 982-990.
   Fulltext PDF 
 Web of Science® Times Cited: 11 

 

LiU affiliated Vanya Darakchieva, Manfred Beckers, Mengyao Xie, Lars Hultman, Bo Monemar, J-. F. Carlin, E. Feltin, M. Gonschorek and N. Grandjean
LiU affiliated Martin Magnuson, Maurizio Mattesini, Carina Höglund, Igor Abrikosov, Jens Birch and Lars Hultman
Electronic structure investigation of the cubic inverse perovskite Sc3AlN
 
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Physical Review B. Condensed Matter and Materials Physics, 2008, 78( 23), 235102.
 Web of Science® Times Cited: 17 

 

LiU affiliated Hans Arwin, Michal Poksinski and Knut Johansen
Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions
Physica Status Solidi (a) applications and materials science, 2008, 205( 4), 817-820.
 Web of Science® Times Cited: 16 

 

LiU affiliated Herbert Willmann, Manfred Beckers, Jens Birch, P.H. Mayrhofer, C. Mitterer and Lars Hultman
Epitaxial growth of Al-Cr-N thin films on MgO(111)
Thin Solid Films, 2008, 517( 2), 598-602.
   Fulltext PDF 
 Web of Science® Times Cited: 9 

 

LiU affiliated T. Kubart, David Huy Trinh, L. Liljeholm, Lars Hultman, Hans Högberg, T. Nyberg and S. Berg
Experiments and Modelling of Dual Reactive Magnetron Sputtering Using Two Reactive Gases
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2008, 26( 4), 565-570.
 Web of Science® Times Cited: 13 

 

LiU affiliated Björn Alling, A. Karimi, Lars Hultman and Igor Abrikosov
First-principles study of the effect of nitrogen vacancies on the decomposition pattern in cubic Ti1-xAlxN1-y
Applied Physics Letters, 2008, 92, 071903-1-071903-3.
 Web of Science® Times Cited: 27 

 

LiU affiliated Herbert Willmann, Paul H Mayrhofer, Lars Hultman and Christian Mitterer
Hardness evolution of Al-Cr-N coatings under thermal load
Journal of Materials Research, 2008, 23( 11), 2880-2885.
 Web of Science® Times Cited: 19 

 

LiU affiliated Jimmy W.P. Bakker, Hans Arwin, Ingemar Lundström and Daniel Filippini
Immunodetection using computer screen photo-assisted ellipsometry
Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5( 5), 1431-1433.
 Web of Science® Times Cited: 2 

 

LiU affiliated Naureen Ghafoor, Fredrik Eriksson, Eric M Gullikson, Lars Hultman and Jens Birch
Incorporation of nitrogen in Cr/Sc multilayers giving improved soft x-ray reectivity
Applied Physics Letters, 2008, 92( 9), 091913.
 Web of Science® Times Cited: 19 

 

LiU affiliated P H Mayrhofer, Herbert Willmann, Lars Hultman and C Mitterer
Influence of different atmospheres on the thermal decomposition of Al-Cr-N coatings
Journal of Physics D, 2008, 41( 15).
 Web of Science® Times Cited: 14 

 

LiU affiliated Hans Arwin, Agneta Askendal, Pentti Tengvall, Daniel W. Thompson and John A. Woollam
Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers
Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5( 5), 1438-1441.
 Web of Science® Times Cited: 6 

 

LiU affiliated A.A. Wronskowska, Hans Arwin, A. Bukaluk, L. Skowronski, M. Trzcinski, K. Okulewicz and A. Wronkowksi
IR-VIS-UV ellipsometry, XRD and AES investigation of In/Cu and In/Pd thin films
Physica Status Solidi. C, Current topics in solid state physics, 2008, 5( 5), 1141-1144.

 

LiU affiliated A.A. Wronkowska, L. Skowronski, A. Wronkowski, L. Zielinski, F. Firszt, A. Marasek, W. Paszkowicz and Hans Arwin
Lattice absorption of Be-containing semiconductor alloys determined by spectroscopic ellipsometry
Physica Status Solidi (a) applications and materials science, 2008, 205( 4), 849-853.
 Web of Science® Times Cited: 6 

 

LiU affiliated Vanya Darakchieva, Mengyao Xie, Ferenc Tasnadi, Igor Abrikosov, Lars Hultman, Bo Monemar, J Kamimura and K Kishino
Lattice parameters, deviations from Vegards rule, and E-2 phonons in InAlN
Applied Physics Letters, 2008, 93( 26), 261908.
 Web of Science® Times Cited: 31 

 

LiU affiliated Björn Alling, Eyvas Isaev, Axel Flink, Lars Hultman and Igor Abrikosov
Metastability of fcc-related Si-N phases
Physical Review B. Condensed Matter and Materials Physics, 2008, 78( 13), 132103-132103.
 Web of Science® Times Cited: 18 

 

LiU affiliated Jens Emmerlich, Gert Gassner, Per Eklund, Hans Högberg and Lars Hultman
Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films
Wear, 2008, 264( 11-12), 914-919.
 Web of Science® Times Cited: 27 

 

LiU affiliated B. Gallas, J. Rivory, Hans Arwin, F. Vidal and M. Stchakovsky
Monitoring the a to B-phase transition in MnAs/GaAs(001) thin films as funcion of temperature
Physica Status Solidi (a) applications and materials science, 2008, 205( 4), 863-866.
 Web of Science® Times Cited: 6 

 

LiU affiliated David Huy Trinh, M. Ottosson, M. Collin, I. Reineck, Lars Hultman and Hans Högberg
Nanocomposite Al2O3-ZrO2 thin films grown by reactive dual radio-frequency magnetron sputtering
Thin Solid Films, 2008, 516( 15), 4977-4982.
 Web of Science® Times Cited: 22 

 

LiU affiliated S. Ruppi, A. Larsson and Axel Flink
Nanoindentation hardness, texture and microstructure of a-Al2O3 and ?-Al2O3 coatings
 
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Thin Solid Films, 2008, 516( 18), 5959-5966.
 Web of Science® Times Cited: 30 

 

LiU affiliated Gueorgui Kostov Gueorguiev, Sven Stafström and Lars Hultman
Nano-wire formation by self-assembly of silicon-metal cage-like molecules
Chemical Physics Letters, 2008, 458( 1-3), 170-174.
 Web of Science® Times Cited: 9 

 

LiU affiliated M. Campoy-Quiles, J. Nelson, P.G. Etchegoin, D.D.C. Bradley, V Zhokhavets, G. Gobsch, H. Vaughan, A, Monkman, Olle Inganäs, Nils-Krister Persson, Hans Arwin, M. Garriga, M.I. Alonso, G. Herrmann, M. Becker, W. Scholdei, M. Jahja and C. Bubeck
On the determination of anistropy in polymer thin films: A comparative study of optical techniques
Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5( 5), 1270-1273.
 Web of Science® Times Cited: 18 

 

LiU affiliated E. Lewin, Per Persson, Martina Lattemann, M. Stüber, M. Gorgoi, A. Sandell, C. Ziebert, F. Schäfers, W. Braun, J. Halbritter, S. Ulrich, W. Eberhardt, Lars Hultman, H. Siegbahn, S. Svensson and U. Jansson
On the origin of a third spectral component of C1s XPS-spectra for nc-TiC/a-C nanocomposite thin films
Surface & Coatings Technology, 2008, 202( 15), 3563-3570.
 Web of Science® Times Cited: 78 

 

LiU affiliated Nilton Souxa Dantas, Hans Arwin, Gabriel Nzulu, Paulo Henrique de Olivera Rappl, Antonio Ferreira da Silva and Clas Persson
Optical characterization of rocksalt Pb1-xSnxTe alloys
physica status solidi (a): Applications and Materials Science, 2008, 205( 4), 837-840.

 

LiU affiliated Carina Höglund, Jens Birch, Manfred Beckers, Björn Alling, Zsolt Czigany, Arndt Mücklich and Lars Hultman
Sc3AlN: A New Perovskite
European Journal of Inorganic Chemistry, 2008, 2008( 8), 1193-1195.
 Web of Science® Times Cited: 16 

 

LiU affiliated A.A. Wronkowska, L. Skowronski, A. Wronkowski, F. Firszt, H. Meczynska, S. Legowski, K. Strzalkowski and Hans Arwin
Spectroscopic ellipsometry and photoluminescence investigation of Zn1-x-yBexMgySe and Cd1-x-yBexZnySe Crystals
Physica Status Solidi (a) applications and materials science, 2008, 205( 4), 854-858.
 Web of Science® Times Cited: 8 

 

LiU affiliated Christina Åkerlind, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions
Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5( 5), 1089-1092.
 Web of Science® Times Cited: 1 

 

LiU affiliated A Liebig, G Andersson, Jens Birch and B Hjorvarsson
Stability limits of superlattice growth: The case of Cr/V (001)
THIN SOLID FILMS, 2008, 516( 23), 8468-8472.
 Web of Science® Times Cited: 6 

 

LiU affiliated O. Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and U. Jansson
Structural, electrical and mechanical characterization of magnetron-sputtered V-Ge-C thin films
Acta Materialia, 2008, 56( 11), 2563-2569.
 Web of Science® Times Cited: 41 

 

LiU affiliated Axel Flink, J.M. Andersson, Björn Alling, R. Daniel, J. Sjölén, L. Karlsson and Lars Hultman
Structure and thermal stability of arc evaporated (Ti0.33Al0.67)1 − xSixN thin films
Thin Solid Films, 2008, 517( 2), 714-721.
 Web of Science® Times Cited: 33 

 

LiU affiliated Andrej Furlan, Gueorgui Kostov Gueorguiev, Zsolt Czigány, Hans Högberg, Slawomir Braun, Sven Stafström and Lars Hultman
Synthesis of phosphorus-carbide thin films by magnetron sputtering
physica status solidi (RRL) - Rapid Research Letters, 2008, 2( 4), 191-193.
 Web of Science® Times Cited: 26 

 

LiU affiliated Axel Knutsson, M.P. Johansson, Per Persson, Lars Hultman and Magnus Odén
Thermal decomposition products in arc evaporated TiAlN/TiN multilayers
Applied Physics Letters, 2008, 93( 14), 143110.
 Web of Science® Times Cited: 42 

 

LiU affiliated Anders Hörling, Jacob Sjölén, Herbert Willmann, T. Larsson, Magnus Odén and Lars Hultman
Thermal stability, microstructure and mechanical properties of Ti1 − xZrxN thin films
Thin Solid Films, 2008, 516( 18), 6421-6431.
 Web of Science® Times Cited: 50 

 

LiU affiliated Jenny Frodelius, Marie Sonestedt, Stefan Björklund, Jens-Petter Palmquist, Krystyna Stiller, Hans Högberg and Lars Hultman
Ti2AlC coatings deposited by High Velocity Oxy-Fuel spraying
Surface and Coatings Technology, 2008, 202( 24), 5976-5981.
 Web of Science® Times Cited: 42 

 

LiU affiliated Galia Pozina, Carl Hemmingsson, Peder Bergman, David Trinh, Lars Hultman and Bo Monemar
Time-resolved spectroscopy of freestanding GaN layers grown by halide vapour phase epitaxy
Superlattices and Microstructures, 2008, 43( 5-6), 605-609.
 Web of Science® Times Cited: 4 

 

LiU affiliated J. Neidhardt, C. Walter, J.M. Molina-Aldareguia, M. Herrmann, W.J. Clegg and Lars Hultman
LiU affiliated E Broitman, Gueorgui Kostov Gueorguiev, Andrej Furlan, Tien Nguyen Son, A J Gellman, Sven Stafström and Lars Hultman
Water adsorption on fullerene-like carbon nitride overcoats
Thin Solid Films, 2008, 517( 3), 1106-1110.
 Web of Science® Times Cited: 22 

 

LiU affiliated T.H. Scabarozi, Per Eklund, Jens Emmerlich, Hans Högberg, T. Meehan, P. Finkel, M.W. Barsoum, J.D. Hettinger, Lars Hultman and S.E. Lofland
Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC
Solid State Communications, 2008, 146( 11-12), 498-501.
 Web of Science® Times Cited: 25 

 

Chapters in Books

LiU affiliated Esteban Broitman, Jörg Neidhardt and Lars Hultman
Fullerene-like carbon nitride - A new form of DLC solid lubricant coatings
Tribology of diamondlike carbon films: fundamentals and applications, Springer, 2008, -664.

Conference Articles

LiU affiliated V. Karpus, G-J. Babonas, A. Reza, S. Tumenas, Hans Arwin, NN Wassmus and S. Brühne
Optical responce of si-ZnMgHo quasicrystal
10th International Conference on Quasicrystals,2008, 2008.

LiU affiliated Vanya Darakchieva, Manfred Beckers, Lars Hultman, Mengyao Xie, Bo Monemar, J.-F Carlin and N. Grandjean

 Web of Science® Times Cited: 1

LiU affiliated Vanya Darakchieva, T. Hofmann, M. Schubert, Bo Sernelius, Finn Giuliani, Mengyao Xie, Per O. A. Persson, Bo Monemar, W. J. Schaff, C.-L. Hsiao, L.-C. Chen and Y Nanishi
Unravelling the free electron behavior in InN
Optoelectronic and Microelectronic Materials and Devices, 2008, 2008.

LiU affiliated Iryna Valyukh, Hans Arwin, Vladimir Chigrinov and Sergiy Valyukh

 Web of Science® Times Cited: 2

Ph.D. Theses

Licentiate Theses

*Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.
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