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Thin Film PhysicsIntroduction


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Fulltext Publication Portfolio


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856 publications from 2005 to 2016
Mentioned in social media 240 times*

Journal Articles

T. Seppanen, Lars Hultman, Jens Birch, M. Beckers and U. Kreissig
Deviations from Vegard's rule in Al1-xInxN (0001) alloy thin films grown by magnetron sputter epitaxy
Journal of Applied Physics, 2007, 101( 4).
 Web of Science® Times Cited: 18 

 

D. Kurapov, J. Reiss, David Trinh, Lars Hultman and J.M. Schneider
Influence of the normalized ion flux on the constitution of alumina films deposited by plasma-assisted chemical vapor deposition
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25( 4), 831-836.
 Web of Science® Times Cited: 11 

 

Jörg Neidhardt and Lars Hultman
Beyond ?- C3 N4 -Fullerene-like carbon nitride: A promising coating material
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25( 4), 633-644.
 Web of Science® Times Cited: 30 

 

E. Valcheva, S. Dimitrov, Bo Monemar, H. Haratizadeh, Per Persson, H. Amano and I. Akasaki
Influence of well-width fluctuations on the electronic structure of GaN/AlxGa1-xN multiquantum wells with graded interfaces
Acta Physica Polonica. A, 2007, 112( 2), 395-400.
 Web of Science® Times Cited: 2 

 

Herbert Willmann, Manfred Beckers, Finn Giuliani, Jens Birch, P.H. Mayrhofer, C. Mitterer and Lars Hultman
Single-crystal growth of NaCl-structure Al-Cr-N thin films on MgO(0 0 1) by magnetron sputter epitaxy
Scripta Materialia, 2007, 57( 12), 1089-1092.
 Web of Science® Times Cited: 4 

 

Per Persson, S. Kodambaka, I. Petrov and Lars Hultman
Epitaxial Ti2AlN(0 0 0 1) thin film deposition by dual-target reactive magnetron sputtering
Acta Materialia, 2007, 55( 13), 4401-4407.
 Web of Science® Times Cited: 35 

 

M. Beckers, N Schell, R. M. S. Martins, A Mucklich, W. Möller and Lars Hultman
Nucleation and growth of Ti2 AlN thin films deposited by reactive magnetron sputtering onto MgO(111)
Journal of Applied Physics, 2007, 102( 7).
 Web of Science® Times Cited: 20 

 

B. Howe, J. Bareño, M. Sardela, J.G. Wen, J.E. Greene, Lars Hultman, A.A. Voevodin and I. Petrov
P.H. Mayrhofer, Lars Hultman, J.M. Schneider, P. Staron and H. Clemens
Spinodal decomposition of cubic Ti1-xAlxN: Comparison between experiments and modeling
International Journal of Materials Research, 2007, 98( 11), 1054-1059.
 Web of Science® Times Cited: 16 

 

Björn Alling, A. V. Ruban, A. Karimi, O. E. Peil, Sergey Simak, Lars Hultman and Igor Abrikosov
Mixing and decomposition thermodynamics of c-Ti1-xAlxN from first-principles calculations
 
Altmetric usage: 1

Physical Review B. Condensed Matter and Materials Physics, 2007, 75( 045123).
   Fulltext PDF 
 Web of Science® Times Cited: 107 

 

Per Eklund, Jens-Petter Palmquist, Jonas Höwing, David Trinh, Tamer El-Raghy, Hans Högberg and Lars Hultman
Ta4AlC3: Phase determination, polymorphism and deformation
Acta Materialia, 2007, 55( 14), 4723-4729.
 Web of Science® Times Cited: 48 

 

Hans Söderberg, Jens Birch, Lars Hultman and Magnus Odén
RHEED studies during growth of TiN/SiNx/TiN trilayers on MgO(001)
Surface Science, 2007, 601, 2352-2356.
 Web of Science® Times Cited: 5 

 

Dragan Adamovic, Valeriu Chirita, Peter Münger, Lars Hultman and J.E. Greene
Kinetic pathways leading to layer-by-layer growth from hyperthermal atoms: A Multibillion time step molecular dynamics study
Physical review. B, Condensed matter and materials physics, 2007, 76, 115418-115425.
 Web of Science® Times Cited: 13 

 

Per Eklund
Novel ceramic Ti-Si-C nanocomposite coatings for electrical contact applications
Surface Engineering, 2007, 23( 6), 406-411.
 Web of Science® Times Cited: 27 

 

Herbert Willmann, P.H Mayrhofer, Lars Hultman and C Mitterer
Thermal stability and age hardening of supersaturated AlCrN hard coatings
International Heat Treatment & Surface Engineering, 2007, 1( 2), 75-79.

 

Martin Magnuson, M. Mattesini, S. Li, Carina Höglund, Lars Hultman and O. Eriksson
Bonding mechanism in the nitrides Ti2AlN and TiN: An experimental and theoretical investigation
Physical Review B. Condensed Matter and Materials Physics, 2007, 76( 195127).
   Fulltext PDF 
 Web of Science® Times Cited: 35 

 

Carina Höglund, Manfred Beckers, Norbert Schell, J.v. Borany, Jens Birch and Lars Hultman
Topotaxial growth of Ti2AlN by solid state reaction in AlN/Ti(0001) multilayer thin films
Applied Physics Letters, 2007, 90( 174106).
 Web of Science® Times Cited: 21 

 

Jacob Sjölén, Lennart Karlsson, Slawomir Braun, Richard Murdey, Anders Hörling and Lars Hultman
Structure and mechanical properties of arc evaporated Ti–Al–O–N thin films
Surface & Coatings Technology, 2007, 201( 14), 6392-6403.
 Web of Science® Times Cited: 49 

 

Jens Emmerlich, Denis Music, Per Eklund, Ola Wilhelmsson, Ulf Jansson, Jochen M. Schneider, Hans Högberg and Lars Hultman
Thermal stability of Ti3SiC2 thin films
Acta Materialia, 2007, 55( 4), 1479-1488.
 Web of Science® Times Cited: 98 

 

Per Eklund, Anand Murugaiah, Jens Emmerlich, Zsolt Czigany, Jenny Frodelius, Michel W. Barsoum, Hans Högberg and Lars Hultman
Homoepitaxial growth of Ti-Si-C MAX-phase thin films on bulk Ti3SiC2 substrates
Journal of Crystal Growth, 2007, 304( 1), 264-269.
 Web of Science® Times Cited: 23 

 

Jens Emmerlich, Per Eklund, Dirk Rittrich, Hans Högberg and Lars Hultman
Electrical resistivity of Tin+1ACn (A = Si, Ge, Sn, n = 1–3) thin films
Journal of Materials Research, 2007, 22( 8), 2279-2287.
 Web of Science® Times Cited: 18 

 

Per Eklund, Manfred Beckers, Jenny Frodelius, Hans Högberg and Lars Hultman
Magnetron sputtering of Ti3SiC2 thin films from a Ti3SiC2 compound target
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25( 5), 1381-1388.
 Web of Science® Times Cited: 34 

 

Ola Wilhelmsson, Per Eklund, Finn Giuliani, Hans Högberg, Lars Hultman and Ulf Jansson
Intrusion-type deformation in epitaxial Ti3SiC2/TiCx nanolaminates
Applied Physics Letters, 2007, 91( 12), 123124.
 Web of Science® Times Cited: 10 

 

Per Eklund, Torbjörn Joelsson, Henrik Ljungcrantz, Ola Wilhelmsson, Zsolt Czigany, Hans Högberg and Lars Hultman
Microstructure and electrical properties of Ti-Si-C-Ag nanocomposite thin films
Surface and Coatings Technology, 2007, 201( 14), 6465-6469.
 Web of Science® Times Cited: 15 

 

Per Eklund, Hans Högberg and Lars Hultman
Epitaxial TiC/SiC multilayers
Physica status solidi (RRL): rapid research letters, 2007, 1( 3), 113-115.
 Web of Science® Times Cited: 11 

 

Hans Söderberg, Axel Flink, Jens Birch, Per Persson, Manfred Beckers, Lars Hultman and Magnus Odén
Growth and characterization of TiN/SiN(001) superlattice films
Journal of Materials Research, 2007, 22( 11), 3255-3264.
 Web of Science® Times Cited: 28 

 

Lars Hultman, Javier Bareño, Axel Flink, Hans Söderberg, Karin Larsson, Vania Petrova, Magnus Odén, J. E. Greene and Ivan Petrov

Conference Articles

Ph.D. Theses

Licentiate Theses

*Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.
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