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Thin Film PhysicsIntroduction


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Fulltext Publication Portfolio


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898 publications from 2005 to 2016
Mentioned in social media 261 times*

Journal Articles

Per Eklund
Novel ceramic Ti-Si-C nanocomposite coatings for electrical contact applications
Surface Engineering, 2007, 23( 6), 406-411.
 Web of Science® Times Cited: 27 

 

Herbert Willmann, P.H Mayrhofer, Lars Hultman and C Mitterer
Thermal stability and age hardening of supersaturated AlCrN hard coatings
International Heat Treatment & Surface Engineering, 2007, 1( 2), 75-79.

 

Björn Alling, A. V. Ruban, A. Karimi, O. E. Peil, Sergey Simak, Lars Hultman and Igor Abrikosov
Mixing and decomposition thermodynamics of c-Ti1-xAlxN from first-principles calculations
 
Altmetric usage: 1

Physical Review B. Condensed Matter and Materials Physics, 2007, 75( 045123).
   Fulltext PDF 
 Web of Science® Times Cited: 108 

 

Dragan Adamovic, Valeriu Chirita, Peter Münger, Lars Hultman and J.E. Greene
Kinetic pathways leading to layer-by-layer growth from hyperthermal atoms: A Multibillion time step molecular dynamics study
Physical review. B, Condensed matter and materials physics, 2007, 76, 115418-115425.
 Web of Science® Times Cited: 14 

 

Hans Söderberg, Jens Birch, Lars Hultman and Magnus Odén
RHEED studies during growth of TiN/SiNx/TiN trilayers on MgO(001)
Surface Science, 2007, 601, 2352-2356.
 Web of Science® Times Cited: 5 

 

Per Eklund, Jens-Petter Palmquist, Jonas Höwing, David Trinh, Tamer El-Raghy, Hans Högberg and Lars Hultman
Ta4AlC3: Phase determination, polymorphism and deformation
Acta Materialia, 2007, 55( 14), 4723-4729.
 Web of Science® Times Cited: 48 

 

M. Beckers, N Schell, R. M. S. Martins, A Mucklich, W. Möller and Lars Hultman
Nucleation and growth of Ti2 AlN thin films deposited by reactive magnetron sputtering onto MgO(111)
Journal of Applied Physics, 2007, 102( 7).
 Web of Science® Times Cited: 21 

 

B. Howe, J. Bareño, M. Sardela, J.G. Wen, J.E. Greene, Lars Hultman, A.A. Voevodin and I. Petrov
Carina Höglund, Manfred Beckers, Norbert Schell, J.v. Borany, Jens Birch and Lars Hultman
Topotaxial growth of Ti2AlN by solid state reaction in AlN/Ti(0001) multilayer thin films
Applied Physics Letters, 2007, 90( 174106).
 Web of Science® Times Cited: 21 

 

Hans Söderberg, Axel Flink, Jens Birch, Per Persson, Manfred Beckers, Lars Hultman and Magnus Odén
Growth and characterization of TiN/SiN(001) superlattice films
Journal of Materials Research, 2007, 22( 11), 3255-3264.
 Web of Science® Times Cited: 29 

 

Lars Hultman, Javier Bareño, Axel Flink, Hans Söderberg, Karin Larsson, Vania Petrova, Magnus Odén, J. E. Greene and Ivan Petrov
Per Eklund, Anand Murugaiah, Jens Emmerlich, Zsolt Czigany, Jenny Frodelius, Michel W. Barsoum, Hans Högberg and Lars Hultman
Homoepitaxial growth of Ti-Si-C MAX-phase thin films on bulk Ti3SiC2 substrates
Journal of Crystal Growth, 2007, 304( 1), 264-269.
 Web of Science® Times Cited: 24 

 

Per Eklund, Manfred Beckers, Jenny Frodelius, Hans Högberg and Lars Hultman
Magnetron sputtering of Ti3SiC2 thin films from a Ti3SiC2 compound target
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25( 5), 1381-1388.
 Web of Science® Times Cited: 34 

 

Per Eklund, Torbjörn Joelsson, Henrik Ljungcrantz, Ola Wilhelmsson, Zsolt Czigany, Hans Högberg and Lars Hultman
Microstructure and electrical properties of Ti-Si-C-Ag nanocomposite thin films
Surface and Coatings Technology, 2007, 201( 14), 6465-6469.
 Web of Science® Times Cited: 15 

 

Jens Emmerlich, Denis Music, Per Eklund, Ola Wilhelmsson, Ulf Jansson, Jochen M. Schneider, Hans Högberg and Lars Hultman
Thermal stability of Ti3SiC2 thin films
Acta Materialia, 2007, 55( 4), 1479-1488.
 Web of Science® Times Cited: 99 

 

Ola Wilhelmsson, Per Eklund, Finn Giuliani, Hans Högberg, Lars Hultman and Ulf Jansson
Intrusion-type deformation in epitaxial Ti3SiC2/TiCx nanolaminates
Applied Physics Letters, 2007, 91( 12), 123124.
 Web of Science® Times Cited: 10 

 

Per Eklund, Hans Högberg and Lars Hultman
Epitaxial TiC/SiC multilayers
Physica status solidi (RRL): rapid research letters, 2007, 1( 3), 113-115.
 Web of Science® Times Cited: 12 

 

Martin Magnuson, M. Mattesini, S. Li, Carina Höglund, Lars Hultman and O. Eriksson
Bonding mechanism in the nitrides Ti2AlN and TiN: An experimental and theoretical investigation
Physical Review B. Condensed Matter and Materials Physics, 2007, 76( 195127).
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 Web of Science® Times Cited: 35 

 

Herbert Willmann, Manfred Beckers, Finn Giuliani, Jens Birch, P.H. Mayrhofer, C. Mitterer and Lars Hultman
Single-crystal growth of NaCl-structure Al-Cr-N thin films on MgO(0 0 1) by magnetron sputter epitaxy
Scripta Materialia, 2007, 57( 12), 1089-1092.
 Web of Science® Times Cited: 5 

 

E. Valcheva, S. Dimitrov, Bo Monemar, H. Haratizadeh, Per Persson, H. Amano and I. Akasaki
Influence of well-width fluctuations on the electronic structure of GaN/AlxGa1-xN multiquantum wells with graded interfaces
Acta Physica Polonica. A, 2007, 112( 2), 395-400.
 Web of Science® Times Cited: 2 

 

Per Persson, S. Kodambaka, I. Petrov and Lars Hultman
Epitaxial Ti2AlN(0 0 0 1) thin film deposition by dual-target reactive magnetron sputtering
Acta Materialia, 2007, 55( 13), 4401-4407.
 Web of Science® Times Cited: 36 

 

T. Seppanen, Lars Hultman, Jens Birch, M. Beckers and U. Kreissig
Deviations from Vegard's rule in Al1-xInxN (0001) alloy thin films grown by magnetron sputter epitaxy
Journal of Applied Physics, 2007, 101( 4).
 Web of Science® Times Cited: 18 

 

Jörg Neidhardt and Lars Hultman
Beyond ?- C3 N4 -Fullerene-like carbon nitride: A promising coating material
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25( 4), 633-644.
 Web of Science® Times Cited: 32 

 

D. Kurapov, J. Reiss, David Trinh, Lars Hultman and J.M. Schneider
Influence of the normalized ion flux on the constitution of alumina films deposited by plasma-assisted chemical vapor deposition
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25( 4), 831-836.
 Web of Science® Times Cited: 11 

 

P.H. Mayrhofer, Lars Hultman, J.M. Schneider, P. Staron and H. Clemens
Spinodal decomposition of cubic Ti1-xAlxN: Comparison between experiments and modeling
International Journal of Materials Research, 2007, 98( 11), 1054-1059.
 Web of Science® Times Cited: 17 

 

Jacob Sjölén, Lennart Karlsson, Slawomir Braun, Richard Murdey, Anders Hörling and Lars Hultman
Structure and mechanical properties of arc evaporated Ti–Al–O–N thin films
Surface & Coatings Technology, 2007, 201( 14), 6392-6403.
 Web of Science® Times Cited: 51 

 

Jens Emmerlich, Per Eklund, Dirk Rittrich, Hans Högberg and Lars Hultman
Electrical resistivity of Tin+1ACn (A = Si, Ge, Sn, n = 1–3) thin films
Journal of Materials Research, 2007, 22( 8), 2279-2287.
 Web of Science® Times Cited: 18 

 

Conference Articles

Ph.D. Theses

Licentiate Theses

*Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.
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