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Thin Film PhysicsIntroduction


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Fulltext Publication Portfolio


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856 publications from 2005 to 2016
Mentioned in social media 240 times*

Journal Articles

M. Beshkova, Z. Zakhariev, M. V. Abrashev, Jens Birch, A. Postovit and Rositsa Yakimova
Properties of AlN epitaxial layers on 6H-SiC substrate grown by sublimation in argon, nitrogen, and their mixtures
Materials Science & Engineering, 2006, 129( 1-3), 228-231.
 Web of Science® Times Cited: 2 

 

Per Persson, Lars Hultman, M.S. Janson and A. Hallen
Ostwald ripening of interstitial-type dislocation loops in 4H-silicon carbide
Journal of Applied Physics, 2006, 100( 5).
 Web of Science® Times Cited: 7 

 

O. Wilhelmsson, J.-P. Palmquist, E. Lewin, Jens Emmerlich, Per Eklund, Per Persson, Hans Högberg, S. Li, R. Ahuja, O. Eriksson, Lars Hultman and U. Jansson
Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering
Journal of Crystal Growth, 2006, 291( 1), 290-300.
 Web of Science® Times Cited: 103 

 

L.-L. Wang, S.V. Khare, Valeriu Chirita, D.D. Johnson, A.A. Rockett, A.I. Frenkel, N.H. Mack and R.G. Nuzzo
Origin of bulklike structure and bond length disorder of Pt37 and Pt6Ru31 clusters on carbon: Comparison of theory and experiment
Journal of the American Chemical Society, 2006, 128( 1), 131-142.
 Web of Science® Times Cited: 40 

 

Gueorgui Kostov Gueorguiev, J.M. Pacheco, Sven Stafström and Lars Hultman
Silicon-metal clusters: Nano-templates for cluster assembled materials
Thin Solid Films, 2006, 515( 3), 1192-1196.
 Web of Science® Times Cited: 19 

 

P.H. Mayrhofer, C. Mitterer, Lars Hultman and H. Clemens
Microstructural design of hard coatings
Progress in Materials Science, 2006, 51( 8), 1032-1114.
 Web of Science® Times Cited: 375 

 

H. Soderberg, M. Odan, T. Larsson, Lars Hultman and J.M. Molina-Aldareguia
Epitaxial stabilization of cubic- SiNx in TiN/SiNx multilayers
Applied Physics Letters, 2006, 88( 19).
 Web of Science® Times Cited: 43 

 

C. M. Fang, R. Ahuja, Olivia Eriksson, S. Li, U. Jansson, O. Wilhelmsson and Lars Hultman
General trend of the mechanical properties of the ternary carbides M3SiC2 (M=transition metal)
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 5).
 Web of Science® Times Cited: 27 

 

JF Palacio, SJ Bull, Jörg Neidhardt and Lars Hultman
Nanoindentation response of high perfonnance fullerene-like CNx
Thin Solid Films, 2006, 494( 01-Feb), 63-68.
 Web of Science® Times Cited: 14 

 

Irina A Buyanova, Morteza Izadifard, Timo Seppänen, Jens Birch, Weimin Chen, SJ Pearton, A Polimeni, M Capizzi, MS Brandt, C Bihler, YG Hong and CW Tu
Unusual effects of hydrogen on electronic and lattice properties of GaNP alloys
Physica. B, Condensed matter, 2006, 376, 568-570.
 Web of Science® Times Cited: 1 

 

E Valcheva, Jens Birch, Per Persson, S Tungasmita and Lars Hultman
Epitaxial growth and orientation of AlN thin films on Si(001) substrates deposited by reactive magnetron sputtering
Journal of Applied Physics, 2006, 100( 12).
 Web of Science® Times Cited: 9 

 

Anelia Kakanakova-Georgieva, Per Persson, A. Kasic, Lars Hultman and Erik Janzén
Superior material properties of AlN on vicinal 4H-SiC
Journal of Applied Physics, 2006, 100( 3).
 Web of Science® Times Cited: 2 

 

M. Rester, Jörg Neidhardt, Per Eklund, Jens Emmerlich, H. Ljungcrantz, Lars Hultman and C. Mitterer
Annealing studies of nanocomposite Ti-Si-C thin films with respect to phase stability and tribological performance
Materials Science & Engineering, 2006, 429( 1-2), 90-95.
 Web of Science® Times Cited: 30 

 

Beckers Manfred, N. Schell, R. M. S. Martins, A. Mücklich and W. Möller
Phase stability of epitaxially grown Ti2AlN thin films
Applied Physics Letters, 2006, 89( 7).
 Web of Science® Times Cited: 25 

 

Herbert Willmann, P. H. Mayrhofer, Per Persson, A. E. Reiter, Lars Hultman and C. Mitterer
Thermal stability of Al-Cr-N hard coatings
Scripta Materialia, 2006, 54( 11), 1847-1851.
 Web of Science® Times Cited: 114 

 

Fredrik Eriksson, Naureen Ghafoor, Franz Schäfers, Eric M. Gullikson and Jens Birch
Interface engineering of short-period Ni/V multilayer X-ray mirrors
Thin Solid Films, 2006, 500( 1-2), 84-95.
 Web of Science® Times Cited: 17 

 

Beckers Manfred, N. Schell, R.M.S. Martins, A. Mücklich, W. Möller and Lars Hultman
Microstructure and nonbasal-plane growth of epitaxial Ti2AlN thin films
Journal of Applied Physics, 2006, 99( 3).
 Web of Science® Times Cited: 27 

 

Henry Riascos, Jörg Neidhardt, G. Z. Radnoczi, Jens Emmerlich, G. Zambrano, Lars Hultman and P. Prieto
Structure and properties of pulsed-laser deposited carbon nitride thin films
Thin Solid Films, 2006, 497( 1-2), 1-6.
 Web of Science® Times Cited: 25 

 

Martina Lattemann, K. Sell, J. Ye, Per Persson and S. Ulrich
Stress reduction in nanocomposite coatings consisting of hexagonal and cubic boron nitride
Surface & Coatings Technology, 2006, 200( 22-23 SPEC. ISS.), 6459-6464.
 Web of Science® Times Cited: 16 

 

Martin Magnuson, M. Mattesini, Ola Wilhelmsson, Jens Emmerlich, Jens-Petter Palmquist, Sa Li, Rajeev Ahuja, Lars Hultman, Olle Eriksson and Ulf Jansson
Electronic structure and chemical bonding in Ti4SiC3 investigated by soft x-ray emission spectroscopy and first-principles theory
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 20).
   Fulltext PDF 
 Web of Science® Times Cited: 29 

 

Per Eklund, Chariya Virojanadara, Jens Emmerlich, Leif Johansson, Hans Högberg and Lars Hultman
Photoemission studies of Ti3SiC2 and nanocrystalline-TiC/amorphous-SiC nanocomposite thin films
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 4), 045417.
 Web of Science® Times Cited: 31 

 

E. Broitman, V. V. Pushkarev, A. J. Gellman, Jörg Neidhardt, Andrej Furlan and Lars Hultman
Water adsorption on lubricated fullerene-like CNx films
Thin Solid Films, 2006, 515( 3), 979-983.
 Web of Science® Times Cited: 9 

 

David Huy Trinh, Hans Högberg, Jon M. Andersson, M. Collin, I. Reineck, Ulf Helmersson and Lars Hultman
Radio frequency dual magnetron sputtering deposition and characterization of nanocomposite Al2O3-ZrO2 thin films
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2006, 24( 2), 309-316.
 Web of Science® Times Cited: 14 

 

Jones Alami, Per Eklund, Jens Emmerlich, O. Wilhelmsson, U. Jansson, Hans Högberg, Lars Hultman and Ulf Helmersson
High-power impulse magnetron sputtering of Ti-Si-C thin films from a Ti3SiC2 compound target
 
Altmetric usage: 1

Thin Solid Films, 2006, 515( 4), 1731-1736.
   Fulltext PDF 
 Web of Science® Times Cited: 58 

 

Erik Wallin, Jon Martin Andersson, E. Peter Münger, Valeriu Chirita and Ulf Helmersson
Ab initio studies of Al, O, and O2 adsorption on α-Al2O3 (0001) surfaces
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 12), 125409-1-125409-9.
   Fulltext PDF 
 Web of Science® Times Cited: 23 

 

Chapters in Books

Lars Hultman and Christian Mitterer
Thermal stability of advanced nano-structured wear-resistant coatings
Nanostructured Coatings, Springer, 2006, 464-502.

Jörg Neidhardt, Esteban Broitman and Lars Hultman
Fullerene-like carbon nitride - A new thin film material
Wide Band Gap Materials and New Developments 2006, Research Signpost, 2006, -208.

Lars Hultman and Christian Mitterer
Thermal Stability of Advanced Nano-structured Wear-Resistant Coatings
Nanostructured Coatings, Plenum Press, 2006, -648.

Conference Articles

Hans Högberg, Jens Emmerlich, Per Eklund, Ola Wilhelmsson, Jens-Petter Palmquist, Ulf Jansson and Lars Hultman

Paul H. Mayrhofer, Herbert Willmann and A. E. Reiter
Structure evolution of Cr-Al-N hard coatings
Society of Vacuum Coaters 49th Annual Technical Conference,2006, 2006.

Ph.D. Theses

Licentiate Theses

Reports

Martin Magnuson, Mats Fahlman, Roger Uhrberg, Leif Johansson and - Total of 100 authors in alphabetical orders

  Fulltext PDF

*Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.
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