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Thin Film PhysicsIntroduction


Fulltext Publication Portfolio


1228 publications from 2005 to 2018
Mentioned in social media 470 times*

Journal Articles

Erik Wallin, Jon Martin Andersson, E. Peter Münger, Valeriu Chirita and Ulf Helmersson
Ab initio studies of Al, O, and O2 adsorption on α-Al2O3 (0001) surfaces
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 12), 125409-1-125409-9.
 Web of Science® Times Cited: 31 


M. Rester, Jörg Neidhardt, Per Eklund, Jens Emmerlich, H. Ljungcrantz, Lars Hultman and C. Mitterer
Annealing studies of nanocomposite Ti-Si-C thin films with respect to phase stability and tribological performance
Materials Science & Engineering, 2006, 429( 1-2), 90-95.
 Web of Science® Times Cited: 35 


Vanya Darakchieva, Tanja Paskova, Plamen Paskov, Hans Arwin, M Schubert, Bo Monemar, S Figge, D Hommel, BA Haskell, PT Fini and S Nakamura
Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
Physica status solidi. B, Basic research, 2006, 243( 7), 1594-1598.
 Web of Science® Times Cited: 3 


Hans Arwin, A A Wronkowska, F Firszt, A Wronkowski, M Wakula, K Strzalkowski and W Paszkowicz
Characterisation of Cd1-x-yZnxBeySe crystals by spectroscopic ellipsometry and luminescence
Physica Status Solidi. C, Current topics in solid state physics, 2006, 1193-1196.
 Web of Science® Times Cited: 2 


Jimmy W.P. Bakker, Hans Arwin, Ingemar Lundström and Daniel Filippini
Computer screen photo-assisted off-null ellipsometry
Applied Optics, 2006, 45( 30), 7795-7799.
 Web of Science® Times Cited: 13 


O. Wilhelmsson, J.-P. Palmquist, E. Lewin, Jens Emmerlich, Per Eklund, Per Persson, Hans Högberg, S. Li, R. Ahuja, O. Eriksson, Lars Hultman and U. Jansson
Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering
Journal of Crystal Growth, 2006, 291( 1), 290-300.
 Web of Science® Times Cited: 127 


Martin Magnuson, M. Mattesini, Ola Wilhelmsson, Jens Emmerlich, Jens-Petter Palmquist, Sa Li, Rajeev Ahuja, Lars Hultman, Olle Eriksson and Ulf Jansson
Electronic structure and chemical bonding in Ti4SiC3 investigated by soft x-ray emission spectroscopy and first-principles theory
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 20).
 Web of Science® Times Cited: 34 


E Valcheva, Jens Birch, Per Persson, S Tungasmita and Lars Hultman
Epitaxial growth and orientation of AlN thin films on Si(001) substrates deposited by reactive magnetron sputtering
Journal of Applied Physics, 2006, 100( 12).
 Web of Science® Times Cited: 10 


H. Soderberg, M. Odan, T. Larsson, Lars Hultman and J.M. Molina-Aldareguia
Epitaxial stabilization of cubic- SiNx in TiN/SiNx multilayers
Applied Physics Letters, 2006, 88( 19).
 Web of Science® Times Cited: 51 


C. M. Fang, R. Ahuja, Olivia Eriksson, S. Li, U. Jansson, O. Wilhelmsson and Lars Hultman
General trend of the mechanical properties of the ternary carbides M3SiC2 (M=transition metal)
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 5).
 Web of Science® Times Cited: 32 


Jones Alami, Per Eklund, Jens Emmerlich, O. Wilhelmsson, U. Jansson, Hans Högberg, Lars Hultman and Ulf Helmersson
High-power impulse magnetron sputtering of Ti-Si-C thin films from a Ti3SiC2 compound target
Altmetric usage: 1

Thin Solid Films, 2006, 515( 4), 1731-1736.
 Web of Science® Times Cited: 68 


Martin Lundqvist, Patrik Nygren, Bengt-Harald Jonsson and Klas Broo
Induction of structure and function in a designed peptide upon adsorption on a silica nanoparticle
Angewandte Chemie International Edition, 2006, 45( 48), 8169-8173.
 Web of Science® Times Cited: 37 


Fredrik Eriksson, Naureen Ghafoor, Franz Schäfers, Eric M. Gullikson and Jens Birch
Interface engineering of short-period Ni/V multilayer X-ray mirrors
Thin Solid Films, 2006, 500( 1-2), 84-95.
 Web of Science® Times Cited: 18 


P.H. Mayrhofer, C. Mitterer, Lars Hultman and H. Clemens
Microstructural design of hard coatings
Altmetric usage: 1

Progress in Materials Science, 2006, 51( 8), 1032-1114.
 Web of Science® Times Cited: 481 


Beckers Manfred, N. Schell, R.M.S. Martins, A. Mücklich, W. Möller and Lars Hultman
Microstructure and nonbasal-plane growth of epitaxial Ti2AlN thin films
Journal of Applied Physics, 2006, 99( 3), 034902-1-034902-8.
 Web of Science® Times Cited: 30 


JF Palacio, SJ Bull, Jörg Neidhardt and Lars Hultman
Nanoindentation response of high perfonnance fullerene-like CNx
Thin Solid Films, 2006, 494( 01-Feb), 63-68.
 Web of Science® Times Cited: 15 


Hans Arwin, M P M A Baroni, M. Ventura Conceicao, R.R. Rosa, C. Persson, E.F. da Silva Jr, L.S. Roman, O. Nakamura, I. Pepe and A. Ferreira da Silva
Optical and morphological properties of porous diamond-like-carbon films deposited by magnetron sputtering
Journal of Non-Crystalline Solids, 2006, 352( 32-35), 3734-3738.
 Web of Science® Times Cited: 2 


Masato Tazawa, Hiroshi Kakiuchida, Gang Xu, Ping Jin and Hans Arwin
Optical constants of vacuum evaporated SiO film and an application
Journal of Electroceramics, 2006, 16( 4), 511-515.
 Web of Science® Times Cited: 13 


L.-L. Wang, S.V. Khare, Valeriu Chirita, D.D. Johnson, A.A. Rockett, A.I. Frenkel, N.H. Mack and R.G. Nuzzo
Origin of bulklike structure and bond length disorder of Pt37 and Pt6Ru31 clusters on carbon: Comparison of theory and experiment
Journal of the American Chemical Society, 2006, 128( 1), 131-142.
 Web of Science® Times Cited: 42 


Per Persson, Lars Hultman, M.S. Janson and A. Hallen
Ostwald ripening of interstitial-type dislocation loops in 4H-silicon carbide
Journal of Applied Physics, 2006, 100( 5).
 Web of Science® Times Cited: 9 


Beckers Manfred, N. Schell, R. M. S. Martins, A. Mücklich and W. Möller
Phase stability of epitaxially grown Ti2AlN thin films
Applied Physics Letters, 2006, 89( 7).
 Web of Science® Times Cited: 33 


Per Eklund, Chariya Virojanadara, Jens Emmerlich, Leif Johansson, Hans Högberg and Lars Hultman
Photoemission studies of Ti3SiC2 and nanocrystalline-TiC/amorphous-SiC nanocomposite thin films
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 4), 045417.
 Web of Science® Times Cited: 32 


M. Beshkova, Z. Zakhariev, M. V. Abrashev, Jens Birch, A. Postovit and Rositsa Yakimova
Properties of AlN epitaxial layers on 6H-SiC substrate grown by sublimation in argon, nitrogen, and their mixtures
Materials Science & Engineering, 2006, 129( 1-3), 228-231.
 Web of Science® Times Cited: 2 


David Huy Trinh, Hans Högberg, Jon M. Andersson, M. Collin, I. Reineck, Ulf Helmersson and Lars Hultman
Radio frequency dual magnetron sputtering deposition and characterization of nanocomposite Al2O3-ZrO2 thin films
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2006, 24( 2), 309-316.
 Web of Science® Times Cited: 17 


Gueorgui Kostov Gueorguiev, J.M. Pacheco, Sven Stafström and Lars Hultman
Silicon-metal clusters: Nano-templates for cluster assembled materials
Thin Solid Films, 2006, 515( 3), 1192-1196.
 Web of Science® Times Cited: 24 


Martina Lattemann, K. Sell, J. Ye, Per Persson and S. Ulrich
Stress reduction in nanocomposite coatings consisting of hexagonal and cubic boron nitride
Surface & Coatings Technology, 2006, 200( 22-23 SPEC. ISS.), 6459-6464.
 Web of Science® Times Cited: 16 


Henry Riascos, Jörg Neidhardt, G. Z. Radnoczi, Jens Emmerlich, G. Zambrano, Lars Hultman and P. Prieto
Structure and properties of pulsed-laser deposited carbon nitride thin films
Thin Solid Films, 2006, 497( 1-2), 1-6.
 Web of Science® Times Cited: 27 


Anelia Kakanakova-Georgieva, Per Persson, A. Kasic, Lars Hultman and Erik Janzén
Superior material properties of AlN on vicinal 4H-SiC
Journal of Applied Physics, 2006, 100( 3).
 Web of Science® Times Cited: 2 


Herbert Willmann, P. H. Mayrhofer, Per Persson, A. E. Reiter, Lars Hultman and C. Mitterer
Thermal stability of Al-Cr-N hard coatings
Scripta Materialia, 2006, 54( 11), 1847-1851.
 Web of Science® Times Cited: 140 


Irina A Buyanova, Morteza Izadifard, Timo Seppänen, Jens Birch, Weimin Chen, SJ Pearton, A Polimeni, M Capizzi, MS Brandt, C Bihler, YG Hong and CW Tu
Unusual effects of hydrogen on electronic and lattice properties of GaNP alloys
Physica. B, Condensed matter, 2006, 376, 568-570.
 Web of Science® Times Cited: 1 


E. Broitman, V. V. Pushkarev, A. J. Gellman, Jörg Neidhardt, Andrej Furlan and Lars Hultman
Water adsorption on lubricated fullerene-like CNx films
Thin Solid Films, 2006, 515( 3), 979-983.
 Web of Science® Times Cited: 10 


Chapters in Books

Hans Arwin
Ellipsometry-Based Sensor Systems
Encyclopedia of Sensors Vol. 3, American Scientific Publishers, 2006, 329-358.

Jörg Neidhardt, Esteban Broitman and Lars Hultman
Fullerene-like carbon nitride - A new thin film material
Wide Band Gap Materials and New Developments 2006, Research Signpost, 2006, -208.

Lars Hultman and Christian Mitterer
Thermal stability of advanced nano-structured wear-resistant coatings
Nanostructured Coatings, Springer, 2006, 464-502.

Lars Hultman and Christian Mitterer
Thermal Stability of Advanced Nano-structured Wear-Resistant Coatings
Nanostructured Coatings, Plenum Press, 2006, -648.

Conference Articles

Hans Arwin, Henrik Wiklund and Kenneth Järrendahl

Hans Arwin, Henrik Wiklund and Kenneth Järrendahl
Calculation of optical properties of complex surface structures using FEM
European Optical Society Annual Meeting,2006, 2006.

Hans Arwin and Kenneth Järrendahl

Hans Arwin and K. Järrendahl
Ellipsometric studies of the wings of the butterfly Morpho rhetenor
European Optical Society Annual Meeting,2006, 2006.

Hans Högberg, Jens Emmerlich, Per Eklund, Ola Wilhelmsson, Jens-Petter Palmquist, Ulf Jansson and Lars Hultman

Hans Arwin, Sabyasachi Sarkar and J. Woollam

Christina Åkerlind, E. H. Karlsson and H. Kariis
Polymer based devices with adaptable infrared reflection and transmission
"Organic optoelectronics and photonics II : 3-6 April, 2006, Strasbourg, France", 2006.

Paul H. Mayrhofer, Herbert Willmann and A. E. Reiter
Structure evolution of Cr-Al-N hard coatings
Society of Vacuum Coaters 49th Annual Technical Conference,2006, 2006.

Ph.D. Theses

Licentiate Theses


Martin Magnuson, Mats Fahlman, Roger Uhrberg, Leif Johansson and - Total of 100 authors in alphabetical orders

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