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Thin Film PhysicsIntroduction


Fulltext Publication Portfolio


995 publications from 2005 to 2017
Mentioned in social media 384 times*

Journal Articles

Beckers Manfred, N. Schell, R. M. S. Martins, A. Mücklich and W. Möller
Phase stability of epitaxially grown Ti2AlN thin films
Applied Physics Letters, 2006, 89( 7).
 Web of Science® Times Cited: 32 


Herbert Willmann, P. H. Mayrhofer, Per Persson, A. E. Reiter, Lars Hultman and C. Mitterer
Thermal stability of Al-Cr-N hard coatings
Scripta Materialia, 2006, 54( 11), 1847-1851.
 Web of Science® Times Cited: 131 


M. Rester, Jörg Neidhardt, Per Eklund, Jens Emmerlich, H. Ljungcrantz, Lars Hultman and C. Mitterer
Annealing studies of nanocomposite Ti-Si-C thin films with respect to phase stability and tribological performance
Materials Science & Engineering, 2006, 429( 1-2), 90-95.
 Web of Science® Times Cited: 32 


Anelia Kakanakova-Georgieva, Per Persson, A. Kasic, Lars Hultman and Erik Janzén
Superior material properties of AlN on vicinal 4H-SiC
Journal of Applied Physics, 2006, 100( 3).
 Web of Science® Times Cited: 2 


E. Broitman, V. V. Pushkarev, A. J. Gellman, Jörg Neidhardt, Andrej Furlan and Lars Hultman
Water adsorption on lubricated fullerene-like CNx films
Thin Solid Films, 2006, 515( 3), 979-983.
 Web of Science® Times Cited: 10 


David Huy Trinh, Hans Högberg, Jon M. Andersson, M. Collin, I. Reineck, Ulf Helmersson and Lars Hultman
Radio frequency dual magnetron sputtering deposition and characterization of nanocomposite Al2O3-ZrO2 thin films
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2006, 24( 2), 309-316.
 Web of Science® Times Cited: 17 


Per Eklund, Chariya Virojanadara, Jens Emmerlich, Leif Johansson, Hans Högberg and Lars Hultman
Photoemission studies of Ti3SiC2 and nanocrystalline-TiC/amorphous-SiC nanocomposite thin films
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 4), 045417.
 Web of Science® Times Cited: 32 


Martina Lattemann, K. Sell, J. Ye, Per Persson and S. Ulrich
Stress reduction in nanocomposite coatings consisting of hexagonal and cubic boron nitride
Surface & Coatings Technology, 2006, 200( 22-23 SPEC. ISS.), 6459-6464.
 Web of Science® Times Cited: 16 


Henry Riascos, Jörg Neidhardt, G. Z. Radnoczi, Jens Emmerlich, G. Zambrano, Lars Hultman and P. Prieto
Structure and properties of pulsed-laser deposited carbon nitride thin films
Thin Solid Films, 2006, 497( 1-2), 1-6.
 Web of Science® Times Cited: 27 


Fredrik Eriksson, Naureen Ghafoor, Franz Schäfers, Eric M. Gullikson and Jens Birch
Interface engineering of short-period Ni/V multilayer X-ray mirrors
Thin Solid Films, 2006, 500( 1-2), 84-95.
 Web of Science® Times Cited: 18 


Erik Wallin, Jon Martin Andersson, E. Peter Münger, Valeriu Chirita and Ulf Helmersson
Ab initio studies of Al, O, and O2 adsorption on α-Al2O3 (0001) surfaces
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 12), 125409-1-125409-9.
   Fulltext PDF 
 Web of Science® Times Cited: 29 


Jones Alami, Per Eklund, Jens Emmerlich, O. Wilhelmsson, U. Jansson, Hans Högberg, Lars Hultman and Ulf Helmersson
High-power impulse magnetron sputtering of Ti-Si-C thin films from a Ti3SiC2 compound target
Altmetric usage: 1

Thin Solid Films, 2006, 515( 4), 1731-1736.
   Fulltext PDF 
 Web of Science® Times Cited: 63 


Martin Magnuson, M. Mattesini, Ola Wilhelmsson, Jens Emmerlich, Jens-Petter Palmquist, Sa Li, Rajeev Ahuja, Lars Hultman, Olle Eriksson and Ulf Jansson
Electronic structure and chemical bonding in Ti4SiC3 investigated by soft x-ray emission spectroscopy and first-principles theory
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 20).
   Fulltext PDF 
 Web of Science® Times Cited: 33 


H. Soderberg, M. Odan, T. Larsson, Lars Hultman and J.M. Molina-Aldareguia
Epitaxial stabilization of cubic- SiNx in TiN/SiNx multilayers
Applied Physics Letters, 2006, 88( 19).
 Web of Science® Times Cited: 49 


O. Wilhelmsson, J.-P. Palmquist, E. Lewin, Jens Emmerlich, Per Eklund, Per Persson, Hans Högberg, S. Li, R. Ahuja, O. Eriksson, Lars Hultman and U. Jansson
Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering
Journal of Crystal Growth, 2006, 291( 1), 290-300.
 Web of Science® Times Cited: 121 


Per Persson, Lars Hultman, M.S. Janson and A. Hallen
Ostwald ripening of interstitial-type dislocation loops in 4H-silicon carbide
Journal of Applied Physics, 2006, 100( 5).
 Web of Science® Times Cited: 8 


M. Beshkova, Z. Zakhariev, M. V. Abrashev, Jens Birch, A. Postovit and Rositsa Yakimova
Properties of AlN epitaxial layers on 6H-SiC substrate grown by sublimation in argon, nitrogen, and their mixtures
Materials Science & Engineering, 2006, 129( 1-3), 228-231.
 Web of Science® Times Cited: 2 


Gueorgui Kostov Gueorguiev, J.M. Pacheco, Sven Stafström and Lars Hultman
Silicon-metal clusters: Nano-templates for cluster assembled materials
Thin Solid Films, 2006, 515( 3), 1192-1196.
 Web of Science® Times Cited: 22 


P.H. Mayrhofer, C. Mitterer, Lars Hultman and H. Clemens
Microstructural design of hard coatings
Progress in Materials Science, 2006, 51( 8), 1032-1114.
 Web of Science® Times Cited: 451 


L.-L. Wang, S.V. Khare, Valeriu Chirita, D.D. Johnson, A.A. Rockett, A.I. Frenkel, N.H. Mack and R.G. Nuzzo
Origin of bulklike structure and bond length disorder of Pt37 and Pt6Ru31 clusters on carbon: Comparison of theory and experiment
Journal of the American Chemical Society, 2006, 128( 1), 131-142.
 Web of Science® Times Cited: 42 


E Valcheva, Jens Birch, Per Persson, S Tungasmita and Lars Hultman
Epitaxial growth and orientation of AlN thin films on Si(001) substrates deposited by reactive magnetron sputtering
Journal of Applied Physics, 2006, 100( 12).
 Web of Science® Times Cited: 9 


JF Palacio, SJ Bull, Jörg Neidhardt and Lars Hultman
Nanoindentation response of high perfonnance fullerene-like CNx
Thin Solid Films, 2006, 494( 01-Feb), 63-68.
 Web of Science® Times Cited: 15 


C. M. Fang, R. Ahuja, Olivia Eriksson, S. Li, U. Jansson, O. Wilhelmsson and Lars Hultman
General trend of the mechanical properties of the ternary carbides M3SiC2 (M=transition metal)
Physical Review B. Condensed Matter and Materials Physics, 2006, 74( 5).
 Web of Science® Times Cited: 29 


Beckers Manfred, N. Schell, R.M.S. Martins, A. Mücklich, W. Möller and Lars Hultman
Microstructure and nonbasal-plane growth of epitaxial Ti2AlN thin films
Journal of Applied Physics, 2006, 99( 3), 034902-1-034902-8.
 Web of Science® Times Cited: 30 


Irina A Buyanova, Morteza Izadifard, Timo Seppänen, Jens Birch, Weimin Chen, SJ Pearton, A Polimeni, M Capizzi, MS Brandt, C Bihler, YG Hong and CW Tu
Unusual effects of hydrogen on electronic and lattice properties of GaNP alloys
Physica. B, Condensed matter, 2006, 376, 568-570.
 Web of Science® Times Cited: 1 


Chapters in Books

Jörg Neidhardt, Esteban Broitman and Lars Hultman
Fullerene-like carbon nitride - A new thin film material
Wide Band Gap Materials and New Developments 2006, Research Signpost, 2006, -208.

Lars Hultman and Christian Mitterer
Thermal stability of advanced nano-structured wear-resistant coatings
Nanostructured Coatings, Springer, 2006, 464-502.

Lars Hultman and Christian Mitterer
Thermal Stability of Advanced Nano-structured Wear-Resistant Coatings
Nanostructured Coatings, Plenum Press, 2006, -648.

Conference Articles

Hans Högberg, Jens Emmerlich, Per Eklund, Ola Wilhelmsson, Jens-Petter Palmquist, Ulf Jansson and Lars Hultman

Paul H. Mayrhofer, Herbert Willmann and A. E. Reiter
Structure evolution of Cr-Al-N hard coatings
Society of Vacuum Coaters 49th Annual Technical Conference,2006, 2006.

Ph.D. Theses

Licentiate Theses


Martin Magnuson, Mats Fahlman, Roger Uhrberg, Leif Johansson and - Total of 100 authors in alphabetical orders

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