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Thin Film PhysicsIntroduction


Fulltext Publication Portfolio


1229 publications from 2005 to 2018
Mentioned in social media 470 times*

Journal Articles

Jon M. Andersson, Erik Wallin, Valeriu Chirita, E. Peter Münger and Ulf Helmersson
Ab initio calculations on the effects of additives on alumina phase stability
Physical review. B, Condensed matter and materials physics, 2005, 71( 014101), 014101.
 Web of Science® Times Cited: 15 


Hans Arwin, Linda Karlsson, A. Kozarcanin, D.W. Thompson, T. Tiwald and J.A. Woollam
Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry
Physica Status Solidi (a) applications and materials science, 2005, 202, 1688-1692.
 Web of Science® Times Cited: 1 


R Gago, I Jimenez, Jörg Neidhardt, B Abendroth, I Caretti, Lars Hultman and W Möller
Correlation between bonding structure and microstructure in fullerenelike carbon nitride thin films
Physical Review B. Condensed Matter and Materials Physics, 2005, 71( 12), 125414.
 Web of Science® Times Cited: 31 


Martin Magnuson, Jens-Petter Palmquist, M. Mattesini, Sa Li, Rajeev Ahuja, Olle Eriksson, Jens Emmerlich, Ola Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and Ulf Jansson
Electronic structure investigation of Ti3AlC2 , Ti3SiC2 , and Ti3GeC2 by soft x-ray emission spectroscopy
Physical Review B. Condensed Matter and Materials Physics, 2005, 72( 24).
 Web of Science® Times Cited: 39 


Niklas Hellgren, Jinghua Guo, Yi Luo, C Sathe, A Aqui, S Kashtanov, J Nordgren, H Ågren and Jan-Eric Sundgren
Jimmy W. P. Bakker, Daniel Filippini and Ingemar Lundström
Enhancing classification capabilities of computer screen photo-assisted fluorescence fingerprinting
Sensors and Actuators B: Chemical, 2005, 110( 2), 190-194.
 Web of Science® Times Cited: 5 


Hans Högberg, Per Eklund, Jens Emmerlich, Jens Birch and Lars Hultman
Epitaxial Ti2GeC, Ti3GeC2, and Ti4GeC3 MAX-phase thin films grown by magnetron sputtering
Journal of Materials Research, 2005, 20( 4), 779-782.
 Web of Science® Times Cited: 94 


S. Prasalovich, V. Popok, Per Persson and E.E.B. Campbell
Experimental studies of complex crater formation under cluster implantation of solids
European Physical Journal D, 2005, 36( 1), 79-88.
 Web of Science® Times Cited: 12 


Daniel Filippini, Jimmy Bakker and Ingemar Lundström
Fingerprinting of fluorescent substances for diagnostic purposes using computer screen illumination
Sensors and actuators. B, Chemical, 2005, 106, 302-310.
 Web of Science® Times Cited: 21 


Hans Högberg, Lars Hultman, Jens Emmerlich, Torbjörn Joelsson, Per Eklund, Jon M. Molina-Aldareguia, Jens-Petter Palmquist, Ola Wilhelmsson and Ulf Jansson
Growth and characterization of MAX-phase thin films
Surface & Coatings Technology, 2005, 193( 1-3), 6-10.
 Web of Science® Times Cited: 113 


G. Z. Radnóczi, Timo Seppänen, B. Pécz, Lars Hultman and Jens Birch
Growth of highly curved Al1-xinxN nanocrystals
Physica Status Solidi (a) applications and materials science, 2005, 202( 7).
 Web of Science® Times Cited: 13 


A. Kasic, D. Gogova, Henrik Larsson, Ivan Gueorguiev Ivanov, Jens Birch, Bo Monemar, M. Fehrer and V. Härle
Highly homogeneous bulk-like 2'' GaN grown by HVPE on MOCVD-GaN template
Journal of Crystal Growth, 2005, 275, e387-e393.
 Web of Science® Times Cited: 5 


Axel Flink, T. Larsson, Jacob Sjölén, Lennart Karlsson and Lars Hultman
Influence of Si on the Microstructure of Arc Evaporated (Ti,Si)N Thin Films: Evidence for Cubic Solid Solutions and their Thermal Stability
Surface and Coatings Technology, 2005, 200( 5-6), 1535-1542.
 Web of Science® Times Cited: 97 


Jones Alami, Per O. Å. Persson, Denis Music, J. T. Gudmundsson, Johan Böhlmark and Ulf Helmersson
Ion-assisted Physical Vapor Deposition for enhanced film properties on non-flat surfaces
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2005, 23( 2), 278-280.
 Web of Science® Times Cited: 127 


Timo Seppänen, Per Persson, Lars Hultman, Jens Birch and G. Z. Radnoczi
Magnetron sputter epitaxy of wurtzite Al1-xInxN (0.1 x 0.9) by Dual Reactive DC Magnetron Sputter Deposition
Journal of Applied Physics, 2005, 97, 83503-1-83503-9.
 Web of Science® Times Cited: 34 


Anders Hörling, Lars Hultman, Magnus Odén, Jacob Sjölén and Lennart Karlsson
Mechanical properties and machining performance of Ti1−xAlxN-coated cutting tools
Surface & Coatings Technology, 2005, 191( 2-3), 384-392.
 Web of Science® Times Cited: 293 


Hans Arwin, Theeraphon Piacham, Åsa Josell, Virapong Prachayasittikul and Lei Ye
Molecularly imprinted polymer thin films on quartz crystal microbalance using a surface bound photo-radical initiator
Analytica Chimica Acta, 2005, 536, 191-196.
 Web of Science® Times Cited: 56 


Hans Söderberg, Magnus Odén, Jon M. Molina-Aldareguia and Lars Hultman
Nanostructure formation during deposition of TiN SiNx nanomultilayer films by reactive dual magnetron sputtering
Journal of Applied Physics, 2005, 97( 11), 114327.
 Web of Science® Times Cited: 107 


Tanja Paskova, Vanya Darakchieva, Plamen Paskov, Jens Birch, E. Valcheva, Per Persson, B. Arnaudov, S. Tungasmita and Bo Monemar
Nonpolar a-plane HVPE GaN: growth and in-plane anisotropic properties
Physica Status Solidi. C, Current topics in solid state physics, 2005, 2, 2027-2031.
 Web of Science® Times Cited: 4 


Nils-Krister Persson, Hans Arwin and Olle Inganäs
Optical optimization of polyfluorene-fullerene blend photodiodes
Altmetric usage: 1

Journal of Applied Physics, 2005, 97( 3), 034503-1-034503-8.
 Web of Science® Times Cited: 76 


Torbjörn Joelsson, Lars Hultman, Håkan Hugosson and Jon M. Molina-Aldareguia
Phase stability tuning in the NbxZr1−xN thin-film system for large stacking fault density and enhanced mechanical strength
Applied Physics Letters, 2005, 86( 13), 131922.
 Web of Science® Times Cited: 29 


Jones Alami, J. T. Gudmundsson, Johan Böhlmark, Jens Birch and Ulf Helmersson
Plasma dynamics in a highly ionized pulsed magnetron discharge
Plasma sources science & technology (Print), 2005, 14( 3), 525-531.
 Web of Science® Times Cited: 67 


Tanja Paskova, Vanya Darakchieva, Plamen Paskov, Jens Birch, E Valcheva, Per Persson, B Arnaudov, S Tungasmitta and Bo Monemar
Properties of nonpolar a-plane GaN films grown by HVPE with AlN buffers
Journal of Crystal Growth, 2005, 281( 1), 55-61.
 Web of Science® Times Cited: 56 


Torbjörn Joelsson, Anders Hörling, Jens Birch and Lars Hultman
Single-crystal Ti2AlN thin films
Applied Physics Letters, 2005, 86( 11), 111913.
 Web of Science® Times Cited: 51 


Per Eklund, Jens Emmerlich, Hans Högberg, Ola Wilhelmsson, Peter Isberg, Jens Birch, Per O. Å. Persson, Ulf Jansson and Lars Hultman
Structural, electrical, and mechanical properties of nc-TiC/a-SiC nanocomposite thin films
Journal of Vacuum Science & Technology B, 2005, 23( 6), 2486-2495.
 Web of Science® Times Cited: 55 


R. Gago, Jörg Neidhardt, M. Vinnichenko, U. Kreissig, Zsolt Czigany, A. Kolitsch, Lars Hultman and W. Möller

Chapters in Books

Hans Arwin
Ellipsometry in Life Science
Handbook of Ellipsometry, William Andrew Publishing/SpringerVerlag, 2005, 799-855.

Conference Articles

Hans Arwin, John A. Woollam and Dan W. Thompson
Model dielectric functions for adsorbed protein layers
American Vacumm Society 52 Int Symposium and Exhibition,2005, 2005.

Hans Arwin, M Tazawa, H Kakiuchida, G Xu and P Jin

Per Eklund, Jens Emmerlich, Hans Högberg, Lars Hultman, Ola Wilhelmsson, Ulf Jansson and Peter Isberg

 Web of Science® Times Cited: 6

Irina Buyanova, Morteza Izadifard, Ivan Gueorguiev Ivanov, Jens Birch, Wei Min Chen, M. Felici, A. Polimeni, M. Capizzi, Y.G. Hong, H.P. Xin and C.W. Tu

Ph.D. Theses

Licentiate Theses

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