Publications for Ying Zhang
Co-author map based on ISI articles 2007-

Journal Articles

Ying Zhang, Huawei Li and Xiaowei Li
  Automatic Test Program Generation Using Executing Trace Based Constraint Extraction for Embedded Processors
  IEEE Transactions on Very Large Scale Integration (vlsi) Systems, 2012, , .

Conference Articles

Ying Zhang, Ahmed Rezine, Petru Eles and Zebo Peng
  Automatic Test Program Generation for Out-of-Order Superscalar Processors
  <em>21st IEEE Asian Test Symposium (ATS12), Niigata, Japan, November 19-22, 2012.</em>, 2012.


   

Responsible for this page: Peter Berkesand    Last Updated: 2010-08-30

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