Publications for Torbjörn Joelsson
Co-author map based on ISI articles 2007-
Journal Articles
Torbjörn Joelsson, Axel Flink, Jens Birch and Lars Hultman
Deposition of single-crystal Ti2AlN thin films by reactive magnetron sputtering from a 2Ti:Al compound target
Journal of Applied Physics, 2007, 102(7), 074918.
Web of Science® Times Cited: 7 |
Per Eklund, Torbjörn Joelsson, Henrik Ljungcrantz, Ola Wilhelmsson, Zsolt Czigany, Hans Högberg and Lars Hultman
Microstructure and electrical properties of Ti-Si-C-Ag nanocomposite thin films
Surface and Coatings Technology, 2007, 201(14), 6465-6469.
Web of Science® Times Cited: 12 |
Jens Birch, Torbjörn Joelsson, Fredrik Eriksson, Naureen Ghafoor and Lars Hultman
Single crystal CrN/ScN superlattice soft X-ray mirrors: epitaxial growth, structure, and properties
Thin Solid Films, 2006, 514(1-2), 10-19.
Web of Science® Times Cited: 10 |
Torbjörn Joelsson, Anders Hörling, Jens Birch and Lars Hultman
Single-crystal Ti2AlN thin films
Applied Physics Letters, 2005, 86(11), 111913.
Web of Science® Times Cited: 43 |
Torbjörn Joelsson, Lars Hultman, Håkan Hugosson and Jon M. Molina-Aldareguia
Phase stability tuning in the NbxZr1−xN thin-film system for large stacking fault density and enhanced mechanical strength
Applied Physics Letters, 2005, 86(13), 131922.
Web of Science® Times Cited: 18 |
Hans Högberg, Lars Hultman, Jens Emmerlich, Torbjörn Joelsson, Per Eklund, Jon M. Molina-Aldareguia, Jens-Petter Palmquist, Ola Wilhelmsson and Ulf Jansson
Growth and characterization of MAX-phase thin films
Surface & Coatings Technology, 2005, 193(1-3), 6-10.
Web of Science® Times Cited: 79 |
J.M. Molina-Aldareguia, S.J. Lloyd, Magnus Odén, Torbjörn Joelsson, Lars Hultman and W.J. Clegg
Deformation structures under indentations in TiN/NbN single-crystal multilayers deposited by magnetron sputtering at different bombarding ion energies
Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 2002, 82(10 SPEC.), 1983-1992.
Web of Science® Times Cited: 36 |
M. Nordin, M. Larsson, Torbjörn Joelsson, Jens Birch and Lars Hultman
Residual stress formation in multilayered TiN/TaNx coatings during reactive magnetron sputter deposition
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2000, 18(6), 2884-2889.
Web of Science® Times Cited: 1 |
Conference Articles
Ph.D. Theses
Ph.D., Lic. Theses
