Publications for Stina Edbom
Co-author map based on ISI articles 2007-

Journal Articles

Erik Larsson and Stina Edbom
  Test Data Truncation for Test Quality Maximization under ATE Memory Depth Constraint
  IET Computers and digital techniques, 2007, 1(1), 27-37.

Chapters in Books

Erik Larsson and Stina Edbom
  Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
  Vlsi-Soc: From Systems To Silicon, Springer, 2007, 221-244.


   

Responsible for this page: Peter Berkesand    Last Updated: 2010-08-30

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