Publications for Shakeel Ahmad
Co-author map based on ISI articles 2007-

Keywords

two-tone stimulus stimuli spectral sd rf receiver pwm pll one-bit on-chip modulation ip3 intermodulation generator frequencies distortion circuit buffer adc

Journal Articles

Shakeel Ahmad and Jerzy Dabrowski
  One-bit ΣΔ Encoded StimulusGeneration for on-Chip ADC Test
  Journal of electronic testing, 2010, , .

Conference Articles

Shakeel Ahmad and Jerzy Dabrowski
  On-Chip Spectral Test for High-Speed ADCs by ΣΔ Technique
  European Conference on Circuit Theory and Design (ECCTD), 2011.


Fahad Qazi, Timmy Sundström, Shakeel Ahmad, Jacob Wikner, Christer Svensson and Jerzy Dabrowski
  A/D Conversion for Software Defined Radio
  Proceedings of the GigaHerz Symposium 2010, 2010.


Shakeel Ahmad, Kaveh Azizi, Iman Esmaeil Zadeh and Jerzy Dabrowski
  Two-Tone PLL for on-Chip IP3 Test
  Swedish System-on-Chip Conference, 2010.


Shakeel Ahmad, Kaveh Azizi, Iman Esmaeil Zadeh and Jerzy Dabrowski
  Two-tone PLL for on-chip IP3 test
  Proceedings of IEEEInternational Symposium on Circuits and Systems, (ISCAS 10), 2010.


Fahad Qazi, Timmy Sundström, Jacob Wikner, Shakeel Ahmad, Christer Svensson and Jerzy Dabrowski
  A/D Conversion for Software Defined Radio: Proceedings of GigaHerz Symposium 2010, Lund University, 9-10 March
  Proceedings of GigaHerz Symposium 2010, Lund University, 9-10 March, 2010.


Shakeel Ahmad and Jerzy Dabrowski
  Cancellation of Spurious Spectral Components in One-Bit Stimuli Generator
  Proceedings of IEEEInternational Conference on Signals and Electronic Systems, (ICSES 10), 2010.


Shakeel Ahmad and Jerzy Dabrowski
  On-chip Stimuli Generation for ADC Dynamic Test by ΣΔ Technique
  Proceedings in European Conference on Circuit Theory and Design 2009 (ECCTD´09), Antalya, Turkey, 2009.


  Fulltext PDF

Shakeel Ahmad and Jerzy Dabrowski
  ADC on-Chip Dynamic Test by PWM Technique
  International Conference on Signals and Electronic Systems, 2008.


Ph.D. Theses

Shakeel Ahmad
  Stimuli Generation Techniques for On-Chip Mixed-Signal Test
  2010.


  Fulltext PDF