Publications for Per Eklund
Co-author map based on ISI articles 2007-

Publications mentioned in social media 6 times*

Keywords

x-ray temperature sputtering spectroscopy solid si resistance nanocomposite microscopy magnetron energy electrical diffraction deposited degrees cubic contact coatings amorphous ag

Journal Articles

N. Nedfors, Olof Tengstrand, Axel Flink, A. M. Andersson, Per Eklund, Lars Hultman and U. Jansson
  Reactive sputtering of NbCx-based nanocomposite coatings: An up-scaling study
  Surface & Coatings Technology, 2014, 253, 100-108.
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Nils Nedfors, Olof Tengstrand, Per Eklund, Lars Hultman and Ulf Jansson
  Nb-B-C thin films for electrical contact applications deposited by magnetron sputtering
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2014, 32(4), 041503.
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Olof Tengstrand, Nils Nedfors, Lars Fast, Axel Flink, Ulf Jansson, Per Eklund and Lars Hultman
  Structure and electrical properties of Nb-Ge-C nanocomposite coatings
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2014, 32(4), 041509.

Per Eklund, Jenny Frodelius, Lars Hultman, Jun Lu and Daniel Magnfält
  Epitaxial growth of gamma-Al2O3 on Ti2AlC(0001) by reactive high-power impulse magnetron sputtering
  AIP Advances, 2014, 4(1), 017138.
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Steffen Sønderby, Trine Klemensø, Bjarke H. Christensen, Klaus P. Almtoft, Jun Lu, Lars P. Nielsen and Per Eklund
  Magnetron sputtered Gadolina-doped Ceria Diffusion Barriers for Metal-supported Solid Oxide Fuel Cells
  Journal of Power Sources, 2014, 267, 452-458.
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Steffen Sønderby, Asim Aijaz, Ulf Helmersson, Kostas Sarakinos and Per Eklund
  Deposition of yttria-stabilized zirconia thin films by high power impulse magnetron sputtering and pulsed magnetron sputtering
  Surface & Coatings Technology, 2014, 240, 1-6.
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Joseph Halim, Maria R. Lukatskaya, Kevin M. Cook, Jun Lu, Cole R. Smith, Lars-Åke Näslund, Steven J. May, Lars Hultman, Yury Gogotsi, Per Eklund and Michel Barsoum
  Transparent Conductive Two-Dimensional Titanium Carbide Epitaxial Thin Films
 
Altmetric usage: 4

  Chemistry of Materials, 2014, 26(7), 2374-2381.
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 Web of Science® Times Cited: 4

M Bugnet, V Mauchamp, Per Eklund, M Jaouen and T Cabioch
  Contribution of core-loss fine structures to the characterization of ion irradiation damages in the nanolaminated ceramic Ti3AlC2
  Acta Materialia, 2013, 61(19), 7348-7363.
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 Web of Science® Times Cited: 2

Nils Nedfors, Olof Tengstrand, Axel Flink, Per Eklund, Lars Hultman and Ulf Jansson
  Characterization of amorphous and nanocomposite Nb–Si–C thin films deposited by DC magnetron sputtering
  Thin Solid Films, 2013, 545, 272-278.
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 Web of Science® Times Cited: 2

Sit Kerdsongpanya, Björn Alling and Per Eklund
  Phase stability of ScN-based solid solutions for thermoelectric applications from first-principles calculations
  Journal of Applied Physics, 2013, 114(7), .
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 Web of Science® Times Cited: 1

Vincent Mauchamp, Wenbo Yu, Loik Gence, Luc Piraux, Thierry Cabioch, Veronique Gauthier, Per Eklund and Sylvain Dubois
  Anisotropy of the resistivity and charge-carrier sign in nanolaminated Ti2AlC: Experiment and ab initio calculations
  Physical Review B. Condensed Matter and Materials Physics, 2013, 87(23), .
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 Web of Science® Times Cited: 2

Petru Lunca Popa, Steffen Sønderby, S. Kerdsongpanya, Jun Lu, N. Bonanos and Per Eklund
  Highly oriented δ-Bi2O3 thin films stable at room temperature synthesized by reactive magnetron sputtering
  Journal of Applied Physics, 2013, 113(4), .
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 Web of Science® Times Cited: 1

Björn Alling, Ali Khatibi, Sergey Simak, Per Eklund and Lars Hultman
  Theoretical investigation of cubic B1-like and corundum (Cr1−xAlx)2O3 solid solutions
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2013, 31(3), .
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 Web of Science® Times Cited: 1

S Rech, A Surpi, S Vezzu, A Patelli, A Trentin, J Glor, Jenny Frodelius, Lars Hultman and Per Eklund
  Cold-spray deposition of Ti2AlC coatings
  Vacuum, 2013, 94, 69-73.
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 Web of Science® Times Cited: 3

V Vishnyakov, Jun Lu, Per Eklund, Lars Hultman and J Colligon
  Ti3SiC2-formation during Ti–C–Si multilayer deposition by magnetron sputtering at 650 °C
  Vacuum, 2013, 93, 56-59.
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 Web of Science® Times Cited: 4

Thierry Cabioch, Per Eklund, Vincent Mauchamp, Michel Jaouen and Michel W. Barsoum
  Tailoring of the thermal expansion of Cr2(Alx,Ge1−x)C phases
  Journal of the European Ceramic Society, 2013, 33(4), 897-904.
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 Web of Science® Times Cited: 11

Jenny Frodelius, Jun Lu, Jens Jensen, Dennis Paul, Lars Hultman and Per Eklund
  Phase stability and initial low-temperature oxidation mechanism of Ti2AlC thin films
  Journal of the European Ceramic Society, 2013, 33(2), 375-382.
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 Web of Science® Times Cited: 6

Ali Khatibi, Axel Genvad, Emmanuelle Göthelid, Jens Jensen, Per Eklund and Lars Hultman
  Structural and Mechanical Properties of (AlxCr1-x)2+yO3-y Coatings Grown by Reactive Cathodic Arc Evaporation in As-deposited and Annealed States
  Acta Materialia, 2013, 61(13), 4811-4822.
 Web of Science® Times Cited: 1

Steffen Sønderby, Petru Lunca Popa, Jun Lu, Bjarke Holl Christensen, Klaus Pagh Almtoft, Lars Pleth Nielsen and Per Eklund
  Strontium diffusion in magnetron sputtered gadolinia-doped ceria thin film barrier coatings for solid oxide fuel cells
  Advanced Energy Materials, 2013, 3(7), 923-929.
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 Web of Science® Times Cited: 2

Olof Tengstrand, Nils Nedfors, M. Andersson, Jun Lu, Ulf Jansson, Axel Flink, Per Eklund and Lars Hultman
  Beam-induced crystallization of amorphous Me-Si-C (Me = Nb or Zr) thin films during transmission electron microscopy
  MRS COMMUNICATIONS, 2013, 3(3), 151-155.
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 Web of Science® Times Cited: 1

Jonas Lauridsen, Per Eklund, Jens Jensen, A. Furlan, A. Flink, A. M. Andersson, U. Jansson and Lars Hultman
  Effects of A-elements (A = Si, Ge or Sn) on the structure and electrical contact properties of Ti-A-C-Ag nanocomposites
  Thin Solid Films, 2012, 520(16), 5128-5136.
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 Web of Science® Times Cited: 5

Niklas Gunnarsson Sarius, Jonas Lauridsen, E. Lewin, U. Jansson, Hans Högberg, Å. Öberg, P. Leisner, Per Eklund and Lars Hultman
  Contact resistance of Ti-Si-C-Ag and Ti-Si-C-Ag-Pd nanocomposite coatings
  Journal of Electronic Materials, 2012, 41(3), 560-567.
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Niklas Gunnarsson Sarius, Jonas Lauridsen, E. Lewin, Jun Lu, Hans Högberg, Å. Öberg, H. Ljungcrantz, P. Leisner, Per Eklund and Lars Hultman
  Ni and Ti diffusion barrier layers between Ti-Si-C-Ag nanocomposite coatings and Cu-based substrates
  Surface & Coatings Technology, 2012, 206(8-9), 2558-2565.
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Sit Kerdsongpanya, Björn Alling and Per Eklund
  Effect of point defects on the electronic density of states of ScN studied by first-principles calculations and implications for thermoelectric properties
  Physical Review B. Condensed Matter and Materials Physics, 2012, 86(19), .
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 Web of Science® Times Cited: 8

Ali Khatibi, J. Sjolen, Grzegorz Greczynski, Jens Jensen, Per Eklund and Lars Hultman
  Structural and mechanical properties of Cr-Al-O-N thin films grown by cathodic arc deposition
  Acta Materialia, 2012, 60(19), 6494-6507.
 Web of Science® Times Cited: 9

Nina J Lane, Michael Naguib, Jun Lu, Per Eklund, Lars Hultman and Michel W Barsoum
  Comment on "Ti5Al2C3: A New Ternary Carbide Belonging to MAX Phases in the Ti-Al-C System"
  Journal of The American Ceramic Society, 2012, 95(10), 3352-3354.
 Web of Science® Times Cited: 2

Jonas Lauridsen, N Nedfors, U Jansson, Jens Jensen, Per Eklund and Lars Hultman
  Ti-B-C nanocomposite coatings deposited by magnetron sputtering
  Applied Surface Science, 2012, 258(24), 9907-9912.
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 Web of Science® Times Cited: 3

Per Eklund, Martin Dahlqvist, Olof Tengstrand, Lars Hultman, Jun Lu, Nils Nedfors, Ulf Jansson and Johanna Rosén
  Discovery of the Ternary Nanolaminated Compound Nb2GeC by a Systematic Theoretical-Experimental Approach
  Physical Review Letters, 2012, 109(3), 035502.
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 Web of Science® Times Cited: 12

Steffen Sønderby, A. J. Nielsen, B. H. Christensen, K. P. Almtoft, Jun Lu, Jens Jensen, L. P. Nielsen and Per Eklund
  Reactive magnetron sputtering of uniform yttria-stabilized zirconia coatings in an industrial setup
  Surface & Coatings Technology, 2012, 206(19-20), 4126-4131.
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 Web of Science® Times Cited: 2

Thierry Cabioch, Per Eklund, Vincent Mauchamp and Michel Jaouen
  Structural investigation of substoichiometry and solid solution effects in Ti2Al(C-x,N1-x)(y) compounds
  Journal of the European Ceramic Society, 2012, 32(8), 1803-1811.
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 Web of Science® Times Cited: 10

Martin Magnuson, Maurizio Mattesini, Ngo Van Nong, Per Eklund and Lars Hultman
  Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2 determinedby polarized x-ray spectroscopy and Seebeck measurements
 
Altmetric usage: 2

  Physical Review B Condensed Matter, 2012, 85, 195134.
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 Web of Science® Times Cited: 9

Kristina Buchholt, Per Eklund, Jens Jensen, Jun Lu, R Ghandi, M Domeij, C M Zetterling, G Behan, H Zhang, Anita Lloyd Spetz and Lars Hultman
  Growth and characterization of epitaxial Ti3GeC2 thin films on 4H-SiC(0001)
  Journal of Crystal Growth, 2012, 343(1), 133-137.
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 Web of Science® Times Cited: 4

Jonas Lauridsen, Per Eklund, Jun Lu, A Knutsson, Magnus Odén, R Mannerbro, A M Andersson and Lars Hultman
  Microstructural and Chemical Analysis of AgI Coatings Used as a Solid Lubricant in Electrical Sliding Contacts
  Tribology letters, 2012, 46(2), 187-193.
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 Web of Science® Times Cited: 2

Ali Khatibi, Jun Lu, Jens Jensen, Per Eklund and Lars Hultman
  Phase transformations in face centered cubic (Al0.32Cr0.68)(2)O-3 thin films
  Surface & Coatings Technology, 2012, 206(14), 3216-3222.
 Web of Science® Times Cited: 11

T H Scabarozi, J D Hettinger, S E Lofland, Jun Lu, Lars Hultman, Jens Jensen and Per Eklund
  Epitaxial growth and electrical-transport properties of Ti(7)Si(2)C(5) thin films synthesized by reactive sputter-deposition
  Scripta Materialia, 2011, 65(9), 811-814.
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 Web of Science® Times Cited: 7

Nils Nedfors, Olof Tengstrand, Erik Lewin, Andrej Furlan, Per Eklund, Lars Hultman and Ulf Jansson
  Structural, mechanical and electrical-contact properties of nanocrystalline-NbC/amorphous-C coatings deposited by magnetron sputtering
  Surface & Coatings Technology, 2011, 206(2-3), 354-359.
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 Web of Science® Times Cited: 19

Sit Kerdsongpanya, Kristina Buchholt, Olof Tengstrand, Jun Lu, Jens Jensen, Lars Hultman and Per Eklund
  Phase-stabilization and substrate effects on nucleation and growth of (Ti,V)(n+1)GeC(n) thin films
  Journal of Applied Physics, 2011, 110(5), 053516.
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 Web of Science® Times Cited: 3

Per Eklund, Matthieu Bugnet, Vincent Mauchamp, Sylvain Dubois, Christophe Tromas, Jens Jensen, Luc Piraux, Loiek Gence, Michel Jaouen and Thierry Cabioch
  Epitaxial growth and electrical transport properties of Cr(2)GeC thin films
  Physical Review B. Condensed Matter and Materials Physics, 2011, 84(7), 075424.
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 Web of Science® Times Cited: 19

Nina J. Lane, Per Eklund, Jun Lu, Charles B. Spencer, Lars Hultman and Michel W. Barsoum
  High-temperature stability of alpha-Ta(4)AlC(3)
  Materials research bulletin, 2011, 46(7), 1088-1091.
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 Web of Science® Times Cited: 5

Kristina Buchholt, Per Eklund, Jens Jensen, Jun Lu, Anita Lloyd Spetz and Lars Hultman
  Step-flow growth of nanolaminate Ti3SiC2 epitaxial layers on 4H-SiC(0 0 0 1)
  SCRIPTA MATERIALIA, 2011, 64(12), 1141-1144.
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 Web of Science® Times Cited: 6

Kristina Buchholt, R Ghandi, M Domeij, C-M Zetterling, Jun Lu, Per Eklund, Lars Hultman and Anita Lloyd Spetz
  Ohmic contact properties of magnetron sputtered Ti3SiC2 on n- and p-type 4H-silicon carbide
  Applied Physics Letters, 2011, 98(4), 042108.
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 Web of Science® Times Cited: 17

Ali Khatibi, Justinas Palisaitis, Carina Höglund, Anders Eriksson, Per O. Å. Persson, Jens Jensen, Jens Birch, Per Eklund and Lars Hultman
  Face-Centered Cubic (Al1-xCrx)2O3
  Thin Solid Films, 2011, 519(8), 2426-2429.
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 Web of Science® Times Cited: 15

Jenny Frodelius, Emma M. Johansson, José M. Córdoba, Magnus Odén, Per Eklund and Lars Hultman
  Annealing of thermally sprayed Ti2AlC coatings
  INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY, 2011, 8(1), 74-84.
 Web of Science® Times Cited: 6

Sit Kerdsongpanya, Ngo Van Nong, Nini Pryds, Agne Zukauskaite, Jens Jensen, Jens Birch, Jun Lu, Lars Hultman, Gunilla Wingqvist and Per Eklund
  Anomalously high thermoelectric power factor in epitaxial ScN thin films
  Applied Physics Letters, 2011, 99(23), 232113.
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 Web of Science® Times Cited: 8

Jonas Lauridsen, Per Eklund, Jens Jensen, H Ljungcrantz, A Oberg, E Lewin, U Jansson, A Flink, H Hogberg and Lars Hultman
  Microstructure evolution of Ti-Si-C-Ag nanocomposite coatings deposited by DC magnetron sputtering
  Acta Materialia, 2010, 58(20), 6592-6599.
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 Web of Science® Times Cited: 9

M Sillassen, Per Eklund, N Pryds, N Bonanos and J Bottiger
  Concentration-dependent ionic conductivity and thermal stability of magnetron-sputtered nanocrystalline scandia-stabilized zirconia
  SOLID STATE IONICS, 2010, 181(23-24), 1140-1145.
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 Web of Science® Times Cited: 3

G Hug, Per Eklund and A Orchowski
  Orientation dependence of electron energy loss spectra and dielectric functions of Ti3SiC2 and Ti3AlC2
  ULTRAMICROSCOPY, 2010, 110(8), 1054-1058.
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 Web of Science® Times Cited: 6

Jonas Lauridsen, Per Eklund, T. Joelsson, H. Ljungcrantz, Å. Öberg, E. Lewin, U. Jansson, Manfred Beckers, Hans Högberg and Lars Hultman
  High-rate deposition of amorphous and nanocomposite Ti-Si-C multifunctional coatings
  Surface & Coatings Technology, 2010, 205(2), 299-305.
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 Web of Science® Times Cited: 17

M Sillassen, Per Eklund, N Pryds and J Bottiger
  Effects of dopant concentration and impurities on the conductivity of magnetron-sputtered nanocrystalline yttria-stabilized zirconia
  SOLID STATE IONICS, 2010, 181(19-20), 864-867.
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 Web of Science® Times Cited: 4

Michael Sillassen, Per Eklund, Nini Pryds, Erik Johnson, Ulf Helmersson and Jorgen Bottiger
  Low-Temperature Superionic Conductivity in Strained Yttria-Stabilized Zirconia
  ADVANCED FUNCTIONAL MATERIALS, 2010, 20(13), 2071-2076.
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 Web of Science® Times Cited: 38

K Pedersen, J Bottiger, M Sridharan, M Sillassen and Per Eklund
  Texture and microstructure of Cr2O3 and (Cr,Al)2O3 thin films deposited by reactive inductively coupled plasma magnetron sputtering
  THIN SOLID FILMS, 2010, 518(15), 4294-4298.
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 Web of Science® Times Cited: 20

Jenny Frodelius, Per Eklund, Manfred Beckers, Per Persson, Hans Högberg and Lars Hultman
  Sputter deposition from a Ti2AlC target: Process characterization and conditions for growth of Ti2AlC
  Thin Solid Films, 2010, 518(6), 1621-1626.
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 Web of Science® Times Cited: 24

Per Eklund, Manfred Beckers, Ulf Jansson, Hans Högberg and Lars Hultman
  The M(n+1)AX(n) phases: Materials science and thin-film processing
  Thin Solid Films, 2010, 518(8), 1851-1878.
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 Web of Science® Times Cited: 199

Per Eklund, M. Sridharan, G. Singh and Jorgen Bottiger
  Thermal Stability and Phase Transformations of γ-/Amorphous-Al2O3 Thin Films
  Plasma processes and polymers, 2009, 6(1), 907-911.
 Web of Science® Times Cited: 19

Y Sun, S Johnsen, Per Eklund, M Sillassen, J Bottiger, N Oeschler, P Sun, F Steglich and B B Iversen
  Thermoelectric transport properties of highly oriented FeSb2 thin films
  JOURNAL OF APPLIED PHYSICS, 2009, 106(3), .
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 Web of Science® Times Cited: 18

M. Sillassen, Per Eklund, M. Sridharan, N. Pryds, N. Bonanos and J. Bottiger
  Ionic conductivity and thermal stability of magnetron-sputtered nanocrystalline yttria-stabilized zirconia
  Journal of Applied Physics, 2009, 105(10), 104907.
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 Web of Science® Times Cited: 15

T.H. Scabarozi, Per Eklund, Jens Emmerlich, Hans Högberg, T. Meehan, P. Finkel, M.W. Barsoum, J.D. Hettinger, Lars Hultman and S.E. Lofland
  Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC
  Solid State Communications, 2008, 146(11-12), 498-501.
 Web of Science® Times Cited: 18

O. Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and U. Jansson
  Structural, electrical and mechanical characterization of magnetron-sputtered V-Ge-C thin films
  Acta Materialia, 2008, 56(11), 2563-2569.
 Web of Science® Times Cited: 30

Jens Emmerlich, Gert Gassner, Per Eklund, Hans Högberg and Lars Hultman
  Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films
  Wear, 2008, 264(11-12), 914-919.
 Web of Science® Times Cited: 17

Per Eklund, Niels-Jörgen Mikkelsen, Mikael Sillassen, Ewa Bienk and Jörgen Böttiger
  Chromium oxide-based multilayer coatings deposited by reactive magnetron sputtering in an industrial setup
  Surface & Coatings Technology, 2008, 203(1), 156-159.

Per Eklund, Madanagurusamy Sridharan, Michael Sillassen and Jörgen Böttiger
  α-Cr2O3 template-texture effect on α-Al2O3 thin-film growth
  Thin Solid Films, 2008, 516(21), 7447-7450.
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Per Eklund, Jens-Petter Palmquist, Jonas Höwing, David Trinh, Tamer El-Raghy, Hans Högberg and Lars Hultman
  Ta4AlC3: Phase determination, polymorphism and deformation
  Acta Materialia, 2007, 55(14), 4723-4729.
 Web of Science® Times Cited: 46

Per Eklund
  Novel ceramic Ti-Si-C nanocomposite coatings for electrical contact applications
  Surface Engineering, 2007, 23(6), 406-411.
 Web of Science® Times Cited: 20

Jones Alami, Per Eklund, Jon M. Andersson, Martina Lattemann, Erik Wallin, Johan Böhlmark, Per Persson and Ulf Helmersson
  Phase tailoring of Ta thin films by highly ionized pulsed magnetron sputtering
  Thin Solid Films, 2007, 515(7-8), 3434-3438.
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 Web of Science® Times Cited: 42

Per Eklund, Anand Murugaiah, Jens Emmerlich, Zsolt Czigany, Jenny Frodelius, Michel W. Barsoum, Hans Högberg and Lars Hultman
  Homoepitaxial growth of Ti-Si-C MAX-phase thin films on bulk Ti3SiC2 substrates
  Journal of Crystal Growth, 2007, 304(1), 264-269.
 Web of Science® Times Cited: 22

Per Eklund, Manfred Beckers, Jenny Frodelius, Hans Högberg and Lars Hultman
  Magnetron sputtering of Ti3SiC2 thin films from a Ti3SiC2 compound target
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25(5), 1381-1388.
 Web of Science® Times Cited: 27

Per Eklund, Torbjörn Joelsson, Henrik Ljungcrantz, Ola Wilhelmsson, Zsolt Czigany, Hans Högberg and Lars Hultman
  Microstructure and electrical properties of Ti-Si-C-Ag nanocomposite thin films
  Surface and Coatings Technology, 2007, 201(14), 6465-6469.
 Web of Science® Times Cited: 13

Jens Emmerlich, Per Eklund, Dirk Rittrich, Hans Högberg and Lars Hultman
  Electrical resistivity of Tin+1ACn (A = Si, Ge, Sn, n = 1–3) thin films
  Journal of Materials Research, 2007, 22(8), 2279-2287.
 Web of Science® Times Cited: 16

Jens Emmerlich, Denis Music, Per Eklund, Ola Wilhelmsson, Ulf Jansson, Jochen M. Schneider, Hans Högberg and Lars Hultman
  Thermal stability of Ti3SiC2 thin films
  Acta Materialia, 2007, 55(4), 1479-1488.
 Web of Science® Times Cited: 81

Per Eklund, Hans Högberg and Lars Hultman
  Epitaxial TiC/SiC multilayers
  Physica status solidi (RRL): rapid research letters, 2007, 1(3), 113-115.
 Web of Science® Times Cited: 9

Ola Wilhelmsson, Per Eklund, Finn Giuliani, Hans Högberg, Lars Hultman and Ulf Jansson
  Intrusion-type deformation in epitaxial Ti3SiC2/TiCx nanolaminates
  Applied Physics Letters, 2007, 91(12), 123124.
 Web of Science® Times Cited: 8

O. Wilhelmsson, J.-P. Palmquist, E. Lewin, Jens Emmerlich, Per Eklund, Per Persson, Hans Högberg, S. Li, R. Ahuja, O. Eriksson, Lars Hultman and U. Jansson
  Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering
  Journal of Crystal Growth, 2006, 291(1), 290-300.
 Web of Science® Times Cited: 87

M. Rester, Jörg Neidhardt, Per Eklund, Jens Emmerlich, H. Ljungcrantz, Lars Hultman and C. Mitterer
  Annealing studies of nanocomposite Ti-Si-C thin films with respect to phase stability and tribological performance
  Materials Science & Engineering: A, 2006, 429( 1-2), 90-95.
 Web of Science® Times Cited: 22

Jones Alami, Per Eklund, Jens Emmerlich, O. Wilhelmsson, U. Jansson, Hans Högberg, Lars Hultman and Ulf Helmersson
  High-power impulse magnetron sputtering of Ti-Si-C thin films from a Ti3SiC2 compound target
  Thin Solid Films, 2006, 515(4), 1731-1736.
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 Web of Science® Times Cited: 51

Per Eklund, Chariya Virojanadara, Jens Emmerlich, Leif Johansson, Hans Högberg and Lars Hultman
  Photoemission studies of Ti3SiC2 and nanocrystalline-TiC/amorphous-SiC nanocomposite thin films
  Physical Review B. Condensed Matter and Materials Physics, 2006, 74(4), 045417.
 Web of Science® Times Cited: 30

Hans Högberg, Per Eklund, Jens Emmerlich, Jens Birch and Lars Hultman
  Epitaxial Ti2GeC, Ti3GeC2, and Ti4GeC3 MAX-phase thin films grown by magnetron sputtering
  Journal of Materials Research, 2005, 20(4), 779-782.
 Web of Science® Times Cited: 76

Hans Högberg, Lars Hultman, Jens Emmerlich, Torbjörn Joelsson, Per Eklund, Jon M. Molina-Aldareguia, Jens-Petter Palmquist, Ola Wilhelmsson and Ulf Jansson
  Growth and characterization of MAX-phase thin films
  Surface & Coatings Technology, 2005, 193(1-3), 6-10.
 Web of Science® Times Cited: 87

Martin Magnuson, Jens-Petter Palmquist, M. Mattesini, Sa Li, Rajeev Ahuja, Olle Eriksson, Jens Emmerlich, Ola Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and Ulf Jansson
  Electronic structure investigation of Ti3AlC2 , Ti3SiC2 , and Ti3GeC2 by soft x-ray emission spectroscopy
  Physical Review B. Condensed Matter and Materials Physics, 2005, 72(24), .
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 Web of Science® Times Cited: 28

Per Eklund, Jens Emmerlich, Hans Högberg, Ola Wilhelmsson, Peter Isberg, Jens Birch, Per O. Å. Persson, Ulf Jansson and Lars Hultman
  Structural, electrical, and mechanical properties of nc-TiC/a-SiC nanocomposite thin films
  Journal of Vacuum Science & Technology B, 2005, 23(6), 2486-2495.
 Web of Science® Times Cited: 44

Per Eklund, JP Palmquist, O Wilhelmsson, U Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
  Comment on "Pulsed laser deposition and properties of M(n+1)AX(x) phase formulated Ti3SiC2 thin films''
  Tribology letters, 2004, 17(4), 977-978.
 Web of Science® Times Cited: 6

Per Eklund, Jens-Petter Palmquist, Ola Wilhelmsson, Ulf Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
  Comment on "Pulsed laser deposition and properties of Mn+1AXx phase formulated Ti3SiC2 thin films"
  Tribology letters, 2004, 17(4), 977-978.
 Web of Science® Times Cited: 6

Conference Articles

Jonas Lauridsen, Jun Lu, Per Eklund, Lars Hultman, Åke Öberg, Mats Lindgren, Lars Fast, Erik Lewin and Ulf Jansson
  Deposition of Ti-Si-C-Ag nanocomposite coatings as electrical contact material
  Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (HOLM), 2010.


Hans Högberg, Jens Emmerlich, Per Eklund, Ola Wilhelmsson, Jens-Petter Palmquist, Ulf Jansson and Lars Hultman
  Growth and characterization of epitaxial MAX-phase thin films from the Tin+1(Si,Ge,Sn)Cn systems
  11th International Ceramics Congress, CIMTEC,2006, 2006.


Per Eklund, Jens Emmerlich, Hans Högberg, Lars Hultman, Ola Wilhelmsson, Ulf Jansson and Peter Isberg
  Synthesis and characterization of Ti-Si-C compounds for electrical contact applications
  IEEE Holm Conference on Electrical Contacts,2005, 2005.


 Web of Science® Times Cited: 6

Ph.D. Theses

Olof Tengstrand
  Transition metal carbide nanocomposite and amorphous thin films
  2014.


  Fulltext PDF

Steffen Sønderby
  Yttria-Stabilized Zirconia and Gadolinia-Doped Ceria Thin Films for Fuel Cell Applications
  2014.


  Fulltext PDF

Jonas Lauridsen
  TiC-based nanocomposite coatings as electrical contacts
  2011.


  Fulltext PDF

Kristina Buchholt
  Nanostructured materials for gas sensing applications
  2011.


  Fulltext PDF

Jenny Frodelius
  Thick and Thin Ti2AlC Coatings
  2010.


  Fulltext PDF

Per Eklund
  Multifunctional nanostructured Ti-Si-C thin films
  2007.


  Fulltext PDF

Licentiate Theses

Joseph Halim
  Synthesis and Characterization of 2D Nanocrystals and Thin Films of Transition Metal Carbides (MXenes)
  2014.


  Fulltext PDF

Sit Kerdsongpanya
  Scandium Nitride Thin Films for Thermoelectrics
  2012.


  Fulltext PDF

Olof Tengstrand
  Me-Si-C (Me= Nb, Ti or Zr): Nanocomposite and Amorphous Thin Films
  2012.


  Fulltext PDF

Steffen Sønderby
  Physical Vapor Deposition of Yttria-Stabilized Zirconia and Gadolinia-Doped Ceria Thin Films for Fuel Cell Applications
  2012.


  Fulltext PDF

Ali Khatibi
  Deposition and Phase Transformations of Ternary Al-Cr-O Thin Films
  2011.


  Fulltext PDF

Per Eklund
  Thin film growth and characterization of Ti-(Si,Ge)-C compounds
  2005.


* Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.