Publications for Per Eklund
Co-author map based on ISI articles 2007-
Publications mentioned in social media 2 times*
Journal Articles
Thierry Cabioch, Per Eklund, Vincent Mauchamp, Michel Jaouen and Michel W. Barsoum
Tailoring of the thermal expansion of Cr-2(Al-x,Ge1-x)C phases
Journal of the European Ceramic Society, 2013, 33(4), 897-904.
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Thierry Cabioch, Per Eklund, Vincent Mauchamp, Michel Jaouen and Michel W. Barsoum
Tailoring of the thermal expansion of Cr2(Alx,Ge1−x)C phases
Journal of the European Ceramic Society, 2013, 33(4), 897-904.
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Jenny Frodelius, Jun Lu, Jens Jensen, Dennis Paul, Lars Hultman and Per Eklund
Phase stability and initial low-temperature oxidation mechanism of Ti2AlC thin films
Journal of the European Ceramic Society, 2013, 33(2), 375-382.
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V Vishnyakov, Jun Lu, Per Eklund, Lars Hultman and J Colligon
Ti3SiC2-formation during Ti–C–Si multilayer deposition by magnetron sputtering at 650 °C
Vacuum, 2013, 93, 56-59.
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S Rech, A Surpi, S Vezzu, A Patelli, A Trentin, J Glor, Jenny Frodelius, Lars Hultman and Per Eklund
Cold-spray deposition of Ti2AlC coatings
Vacuum, 2013, 94, 69-73.
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Sit Kerdsongpanya, Björn Alling and Per Eklund
Effect of point defects on the electronic density of states of ScN studied by first-principles calculations and implications for thermoelectric properties
Physical Review B. Condensed Matter and Materials Physics, 2012, 86(19), .
Web of Science® Times Cited: 1 |
Ali Khatibi, J. Sjolen, Grzegorz Greczynski, Jens Jensen, Per Eklund and Lars Hultman
Structural and mechanical properties of Cr-Al-O-N thin films grown by cathodic arc deposition
Acta Materialia, 2012, 60(19), 6494-6507.
Web of Science® Times Cited: 1 |
Nina J Lane, Michael Naguib, Jun Lu, Per Eklund, Lars Hultman and Michel W Barsoum
Comment on "Ti5Al2C3: A New Ternary Carbide Belonging to MAX Phases in the Ti-Al-C System"
Journal of The American Ceramic Society, 2012, 95(10), 3352-3354.
Web of Science® Times Cited: 1 |
Jonas Lauridsen, N Nedfors, U Jansson, Jens Jensen, Per Eklund and Lars Hultman
Ti-B-C nanocomposite coatings deposited by magnetron sputtering
Applied Surface Science, 2012, 258(24), 9907-9912.
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Per Eklund, Martin Dahlqvist, Olof Tengstrand, Lars Hultman, Jun Lu, Nils Nedfors, Ulf Jansson and Johanna Rosén
Discovery of the Ternary Nanolaminated Compound Nb2GeC by a Systematic Theoretical-Experimental Approach
Physical Review Letters, 2012, 109(3), 035502.
Fulltext Web of Science® Times Cited: 3 |
Steffen Sønderby, A. J. Nielsen, B. H. Christensen, K. P. Almtoft, Jun Lu, Jens Jensen, L. P. Nielsen and Per Eklund
Reactive magnetron sputtering of uniform yttria-stabilized zirconia coatings in an industrial setup
Surface & Coatings Technology, 2012, 206(19-20), 4126-4131.
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Thierry Cabioch, Per Eklund, Vincent Mauchamp and Michel Jaouen
Structural investigation of substoichiometry and solid solution effects in Ti2Al(C-x,N1-x)(y) compounds
Journal of the European Ceramic Society, 2012, 32(8), 1803-1811.
Fulltext Web of Science® Times Cited: 4 |
Martin Magnuson, Maurizio Mattesini, Ngo Van Nong, Per Eklund and Lars Hultman
Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2 determinedby polarized x-ray spectroscopy and Seebeck measurements
Physical Review B Condensed Matter, 2012, 85, 195134.
Fulltext Web of Science® Times Cited: 4 |
Kristina Buchholt, Per Eklund, Jens Jensen, Jun Lu, R Ghandi, M Domeij, C M Zetterling, G Behan, H Zhang, Anita Lloyd Spetz and Lars Hultman
Growth and characterization of epitaxial Ti3GeC2 thin films on 4H-SiC(0001)
Journal of Crystal Growth, 2012, 343(1), 133-137.
Fulltext Web of Science® Times Cited: 2 |
Jonas Lauridsen, Per Eklund, Jun Lu, A Knutsson, Magnus Odén, R Mannerbro, A M Andersson and Lars Hultman
Microstructural and Chemical Analysis of AgI Coatings Used as a Solid Lubricant in Electrical Sliding Contacts
Tribology letters, 2012, 46(2), 187-193.
Fulltext Web of Science® Times Cited: 1 |
Ali Khatibi, Jun Lu, Jens Jensen, Per Eklund and Lars Hultman
Phase transformations in face centered cubic (Al0.32Cr0.68)(2)O-3 thin films
Surface & Coatings Technology, 2012, 206(14), 3216-3222.
Web of Science® Times Cited: 5 |
Jonas Lauridsen, Per Eklund, Jens Jensen, A. Furlan, A. Flink, A. M. Andersson, U. Jansson and Lars Hultman
Effects of A-elements (A = Si, Ge or Sn) on the structure and electrical contact properties of Ti-A-C-Ag nanocomposites
Thin Solid Films, 2012, 520(16), 5128-5136.
Fulltext Web of Science® Times Cited: 3 |
Niklas Gunnarsson Sarius, Jonas Lauridsen, E. Lewin, U. Jansson, Hans Högberg, Å. Öberg, P. Leisner, Per Eklund and Lars Hultman
Contact resistance of Ti-Si-C-Ag and Ti-Si-C-Ag-Pd nanocomposite coatings
Journal of Electronic Materials, 2012, 41(3), 560-567.
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Niklas Gunnarsson Sarius, Jonas Lauridsen, E. Lewin, Jun Lu, Hans Högberg, Å. Öberg, H. Ljungcrantz, P. Leisner, Per Eklund and Lars Hultman
Ni and Ti diffusion barrier layers between Ti-Si-C-Ag nanocomposite coatings and Cu-based substrates
Surface & Coatings Technology, 2012, 206(8-9), 2558-2565.
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Sit Kerdsongpanya, Ngo Van Nong, Nini Pryds, Agne Zukauskaite, Jens Jensen, Jens Birch, Jun Lu, Lars Hultman, Gunilla Wingqvist and Per Eklund
Anomalously high thermoelectric power factor in epitaxial ScN thin films
Applied Physics Letters, 2011, 99(23), 232113.
Fulltext Web of Science® Times Cited: 3 |
T H Scabarozi, J D Hettinger, S E Lofland, Jun Lu, Lars Hultman, Jens Jensen and Per Eklund
Epitaxial growth and electrical-transport properties of Ti(7)Si(2)C(5) thin films synthesized by reactive sputter-deposition
Scripta Materialia, 2011, 65(9), 811-814.
Fulltext Web of Science® Times Cited: 5 |
Nils Nedfors, Olof Tengstrand, Erik Lewin, Andrej Furlan, Per Eklund, Lars Hultman and Ulf Jansson
Structural, mechanical and electrical-contact properties of nanocrystalline-NbC/amorphous-C coatings deposited by magnetron sputtering
Surface & Coatings Technology, 2011, 206(2-3), 354-359.
Fulltext Web of Science® Times Cited: 7 |
Sit Kerdsongpanya, Kristina Buchholt, Olof Tengstrand, Jun Lu, Jens Jensen, Lars Hultman and Per Eklund
Phase-stabilization and substrate effects on nucleation and growth of (Ti,V)(n+1)GeC(n) thin films
Journal of Applied Physics, 2011, 110(5), 053516.
Fulltext Web of Science® Times Cited: 2 |
Per Eklund, Matthieu Bugnet, Vincent Mauchamp, Sylvain Dubois, Christophe Tromas, Jens Jensen, Luc Piraux, Loiek Gence, Michel Jaouen and Thierry Cabioch
Epitaxial growth and electrical transport properties of Cr(2)GeC thin films
Physical Review B. Condensed Matter and Materials Physics, 2011, 84(7), 075424.
Fulltext Web of Science® Times Cited: 10 |
Nina J. Lane, Per Eklund, Jun Lu, Charles B. Spencer, Lars Hultman and Michel W. Barsoum
High-temperature stability of alpha-Ta(4)AlC(3)
Materials research bulletin, 2011, 46(7), 1088-1091.
Fulltext Web of Science® Times Cited: 3 |
Kristina Buchholt, Per Eklund, Jens Jensen, Jun Lu, Anita Lloyd Spetz and Lars Hultman
Step-flow growth of nanolaminate Ti3SiC2 epitaxial layers on 4H-SiC(0 0 0 1)
SCRIPTA MATERIALIA, 2011, 64(12), 1141-1144.
Fulltext Web of Science® Times Cited: 5 |
Kristina Buchholt, R Ghandi, M Domeij, C-M Zetterling, Jun Lu, Per Eklund, Lars Hultman and Anita Lloyd Spetz
Ohmic contact properties of magnetron sputtered Ti3SiC2 on n- and p-type 4H-silicon carbide
Applied Physics Letters, 2011, 98(4), 042108.
Fulltext Web of Science® Times Cited: 11 |
Ali Khatibi, Justinas Palisaitis, Carina Höglund, Anders Eriksson, Per O. Å. Persson, Jens Jensen, Jens Birch, Per Eklund and Lars Hultman
Face-Centered Cubic (Al1-xCrx)2O3
Thin Solid Films, 2011, 519(8), 2426-2429.
Fulltext Web of Science® Times Cited: 8 |
Jenny Frodelius, Emma M. Johansson, José M. Córdoba, Magnus Odén, Per Eklund and Lars Hultman
Annealing of thermally sprayed Ti2AlC coatings
INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY, 2011, 8(1), 74-84.
Web of Science® Times Cited: 3 |
Jonas Lauridsen, Per Eklund, Jens Jensen, H Ljungcrantz, A Oberg, E Lewin, U Jansson, A Flink, H Hogberg and Lars Hultman
Microstructure evolution of Ti-Si-C-Ag nanocomposite coatings deposited by DC magnetron sputtering
Acta Materialia, 2010, 58(20), 6592-6599.
Fulltext Web of Science® Times Cited: 6 |
M Sillassen, Per Eklund, N Pryds, N Bonanos and J Bottiger
Concentration-dependent ionic conductivity and thermal stability of magnetron-sputtered nanocrystalline scandia-stabilized zirconia
SOLID STATE IONICS, 2010, 181(23-24), 1140-1145.
Fulltext Web of Science® Times Cited: 1 |
G Hug, Per Eklund and A Orchowski
Orientation dependence of electron energy loss spectra and dielectric functions of Ti3SiC2 and Ti3AlC2
ULTRAMICROSCOPY, 2010, 110(8), 1054-1058.
Fulltext Web of Science® Times Cited: 4 |
Jonas Lauridsen, Per Eklund, T. Joelsson, H. Ljungcrantz, Å. Öberg, E. Lewin, U. Jansson, Manfred Beckers, Hans Högberg and Lars Hultman
High-rate deposition of amorphous and nanocomposite Ti-Si-C multifunctional coatings
Surface & Coatings Technology, 2010, 205(2), 299-305.
Fulltext Web of Science® Times Cited: 9 |
M Sillassen, Per Eklund, N Pryds and J Bottiger
Effects of dopant concentration and impurities on the conductivity of magnetron-sputtered nanocrystalline yttria-stabilized zirconia
SOLID STATE IONICS, 2010, 181(19-20), 864-867.
Fulltext Web of Science® Times Cited: 2 |
Michael Sillassen, Per Eklund, Nini Pryds, Erik Johnson, Ulf Helmersson and Jorgen Bottiger
Low-Temperature Superionic Conductivity in Strained Yttria-Stabilized Zirconia
ADVANCED FUNCTIONAL MATERIALS, 2010, 20(13), 2071-2076.
Fulltext Web of Science® Times Cited: 17 |
K Pedersen, J Bottiger, M Sridharan, M Sillassen and Per Eklund
Texture and microstructure of Cr2O3 and (Cr,Al)2O3 thin films deposited by reactive inductively coupled plasma magnetron sputtering
THIN SOLID FILMS, 2010, 518(15), 4294-4298.
Fulltext Web of Science® Times Cited: 13 |
Per Eklund, Manfred Beckers, Ulf Jansson, Hans Högberg and Lars Hultman
The M(n+1)AX(n) phases: Materials science and thin-film processing
Thin Solid Films, 2010, 518(8), 1851-1878.
Fulltext Web of Science® Times Cited: 128 |
Jenny Frodelius, Per Eklund, Manfred Beckers, Per Persson, Hans Högberg and Lars Hultman
Sputter deposition from a Ti2AlC target: Process characterization and conditions for growth of Ti2AlC
Thin Solid Films, 2010, 518(6), 1621-1626.
Fulltext Web of Science® Times Cited: 15 |
Per Eklund, M. Sridharan, G. Singh and Jorgen Bottiger
Thermal Stability and Phase Transformations of γ-/Amorphous-Al2O3 Thin Films
Plasma processes and polymers, 2009, 6(1), 907-911.
Web of Science® Times Cited: 12 |
Y Sun, S Johnsen, Per Eklund, M Sillassen, J Bottiger, N Oeschler, P Sun, F Steglich and B B Iversen
Thermoelectric transport properties of highly oriented FeSb2 thin films
JOURNAL OF APPLIED PHYSICS, 2009, 106(3), .
Fulltext Web of Science® Times Cited: 15 |
M. Sillassen, Per Eklund, M. Sridharan, N. Pryds, N. Bonanos and J. Bottiger
Ionic conductivity and thermal stability of magnetron-sputtered nanocrystalline yttria-stabilized zirconia
Journal of Applied Physics, 2009, 105(10), 104907.
Fulltext Web of Science® Times Cited: 11 |
T.H. Scabarozi, Per Eklund, Jens Emmerlich, Hans Högberg, T. Meehan, P. Finkel, M.W. Barsoum, J.D. Hettinger, Lars Hultman and S.E. Lofland
Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC
Solid State Communications, 2008, 146(11-12), 498-501.
Web of Science® Times Cited: 15 |
O. Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and U. Jansson
Structural, electrical and mechanical characterization of magnetron-sputtered V-Ge-C thin films
Acta Materialia, 2008, 56(11), 2563-2569.
Web of Science® Times Cited: 27 |
Jens Emmerlich, Gert Gassner, Per Eklund, Hans Högberg and Lars Hultman
Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films
Wear, 2007, 264(11-12), 914-919.
Web of Science® Times Cited: 13 |
Per Eklund, Jens-Petter Palmquist, Jonas Höwing, David Trinh, Tamer El-Raghy, Hans Högberg and Lars Hultman
Ta4AlC3: Phase determination, polymorphism and deformation
Acta Materialia, 2007, 55(14), 4723-4729.
Web of Science® Times Cited: 40 |
Per Eklund
Novel ceramic Ti-Si-C nanocomposite coatings for electrical contact applications
Surface Engineering, 2007, 23(6), 406-411.
Web of Science® Times Cited: 17 |
Ola Wilhelmsson, Per Eklund, Finn Giuliani, Hans Högberg, Lars Hultman and Ulf Jansson
Intrusion-type deformation in epitaxial Ti3SiC2/TiCx nanolaminates
Applied Physics Letters, 2007, 91(12), 123124.
Web of Science® Times Cited: 7 |
Per Eklund, Hans Högberg and Lars Hultman
Epitaxial TiC/SiC multilayers
Physica status solidi (RRL): rapid research letters, 2007, 1(3), 113-115.
Web of Science® Times Cited: 7 |
Jens Emmerlich, Denis Music, Per Eklund, Ola Wilhelmsson, Ulf Jansson, Jochen M. Schneider, Hans Högberg and Lars Hultman
Thermal stability of Ti3SiC2 thin films
Acta Materialia, 2007, 55(4), 1479-1488.
Web of Science® Times Cited: 62 |
Jens Emmerlich, Per Eklund, Dirk Rittrich, Hans Högberg and Lars Hultman
Electrical resistivity of Tin+1ACn (A = Si, Ge, Sn, n = 1–3) thin films
Journal of Materials Research, 2007, 22(8), 2279-2287.
Web of Science® Times Cited: 14 |
Per Eklund, Torbjörn Joelsson, Henrik Ljungcrantz, Ola Wilhelmsson, Zsolt Czigany, Hans Högberg and Lars Hultman
Microstructure and electrical properties of Ti-Si-C-Ag nanocomposite thin films
Surface and Coatings Technology, 2007, 201(14), 6465-6469.
Web of Science® Times Cited: 12 |
Per Eklund, Manfred Beckers, Jenny Frodelius, Hans Högberg and Lars Hultman
Magnetron sputtering of Ti3SiC2 thin films from a Ti3SiC2 compound target
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25(5), 1381-1388.
Web of Science® Times Cited: 22 |
Per Eklund, Anand Murugaiah, Jens Emmerlich, Zsolt Czigany, Jenny Frodelius, Michel W. Barsoum, Hans Högberg and Lars Hultman
Homoepitaxial growth of Ti-Si-C MAX-phase thin films on bulk Ti3SiC2 substrates
Journal of Crystal Growth, 2007, 304(1), 264-269.
Web of Science® Times Cited: 20 |
Jones Alami, Per Eklund, Jon M. Andersson, Martina Lattemann, Erik Wallin, Johan Böhlmark, Per Persson and Ulf Helmersson
Phase tailoring of Ta thin films by highly ionized pulsed magnetron sputtering
Thin Solid Films, 2007, 515(7-8), 3434-3438.
Fulltext Web of Science® Times Cited: 35 |
Jones Alami, Per Eklund, Jens Emmerlich, O. Wilhelmsson, U. Jansson, Hans Högberg, Lars Hultman and Ulf Helmersson
High-power impulse magnetron sputtering of Ti-Si-C thin films from a Ti3SiC2 compound target
Thin Solid Films, 2007, 515(4), 1731-1736.
Fulltext Web of Science® Times Cited: 40 |
O. Wilhelmsson, J.-P. Palmquist, E. Lewin, Jens Emmerlich, Per Eklund, Per Persson, Hans Högberg, S. Li, R. Ahuja, O. Eriksson, Lars Hultman and U. Jansson
Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering
Journal of Crystal Growth, 2006, 291(1), 290-300.
Web of Science® Times Cited: 69 |
M. Rester, Jörg Neidhardt, Per Eklund, Jens Emmerlich, H. Ljungcrantz, Lars Hultman and C. Mitterer
Annealing studies of nanocomposite Ti-Si-C thin films with respect to phase stability and tribological performance
Materials Science & Engineering, 2006, 429( 1-2), 90-95.
Web of Science® Times Cited: 19 |
Per Eklund, Chariya Virojanadara, Jens Emmerlich, Leif Johansson, Hans Högberg and Lars Hultman
Photoemission studies of Ti3SiC2 and nanocrystalline-TiC/amorphous-SiC nanocomposite thin films
Physical Review B. Condensed Matter and Materials Physics, 2006, 74(4), 045417.
Web of Science® Times Cited: 27 |
Hans Högberg, Per Eklund, Jens Emmerlich, Jens Birch and Lars Hultman
Epitaxial Ti2GeC, Ti3GeC2, and Ti4GeC3 MAX-phase thin films grown by magnetron sputtering
Journal of Materials Research, 2005, 20(4), 779-782.
Web of Science® Times Cited: 67 |
Hans Högberg, Lars Hultman, Jens Emmerlich, Torbjörn Joelsson, Per Eklund, Jon M. Molina-Aldareguia, Jens-Petter Palmquist, Ola Wilhelmsson and Ulf Jansson
Growth and characterization of MAX-phase thin films
Surface & Coatings Technology, 2005, 193(1-3), 6-10.
Web of Science® Times Cited: 79 |
Per Eklund, Jens Emmerlich, Hans Högberg, Ola Wilhelmsson, Peter Isberg, Jens Birch, Per O. Å. Persson, Ulf Jansson and Lars Hultman
Structural, electrical, and mechanical properties of nc-TiC/a-SiC nanocomposite thin films
Journal of Vacuum Science & Technology B, 2005, 23(6), 2486-2495.
Web of Science® Times Cited: 37 |
Martin Magnuson, Jens-Petter Palmquist, M. Mattesini, Sa Li, Rajeev Ahuja, Olle Eriksson, Jens Emmerlich, Ola Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and Ulf Jansson
Electronic structure investigation of Ti3AlC2 , Ti3SiC2 , and Ti3GeC2 by soft x-ray emission spectroscopy
Physical Review B. Condensed Matter and Materials Physics, 2005, 72(24), .
Fulltext Web of Science® Times Cited: 24 |
Per Eklund, Jens-Petter Palmquist, Ola Wilhelmsson, Ulf Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
Comment on "Pulsed laser deposition and properties of Mn+1AXx phase formulated Ti3SiC2 thin films"
Tribology letters, 2004, 17(4), 977-978.
Web of Science® Times Cited: 6 |
Conference Articles
Jonas Lauridsen, Jun Lu, Per Eklund, Lars Hultman, Åke Öberg, Mats Lindgren, Lars Fast, Erik Lewin and Ulf Jansson
Deposition of Ti-Si-C-Ag nanocomposite coatings as electrical contact material
Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (HOLM), 2010.
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Hans Högberg, Jens Emmerlich, Per Eklund, Ola Wilhelmsson, Jens-Petter Palmquist, Ulf Jansson and Lars Hultman
Growth and characterization of epitaxial MAX-phase thin films from the Tin+1(Si,Ge,Sn)Cn systems
11th International Ceramics Congress, CIMTEC,2006, 2006.
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Per Eklund, Jens Emmerlich, Hans Högberg, Lars Hultman, Ola Wilhelmsson, Ulf Jansson and Peter Isberg
Synthesis and characterization of Ti-Si-C compounds for electrical contact applications
IEEE Holm Conference on Electrical Contacts,2005, 2005.
Web of Science® Times Cited: 5
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Ph.D. Theses
Licentiate Theses
* Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.
Ph.D., Lic. Theses
