Publications for Michal PoksinskiCo-author map based on ISI articles 2007-
Keywordstire thin technique surfaces sensitivity resonance reflection protein plasmons monitoring metal measurement layers internal gold films ellipsometry applications adsorption adsorbed Journal ArticlesHans Arwin, Michal Poksinski and Knut Johansen Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions Physica Status Solidi (a) applications and materials science, 2008, 205(4), 817-820. Web of Science® Times Cited: 16Michal Poksinski and Hans Arwin Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces Optics Letters, 2007, 32(10), 1308-1310. Web of Science® Times Cited: 20Hans Arwin, Michal Poksinski and Knut Johansen Total internal reflection ellipsometry: principles and applications Applied Optics, 2004, 43(15), 3028-3036. Web of Science® Times Cited: 96Michal Poksinski and Hans Arwin Protein monolayers monitored by internal reflection ellipsometry Thin Solid Films, 2004, 455-456, 716-721. Web of Science® Times Cited: 74Michal Poksinski, Hasan Dzuho and Hans Arwin Copper corrosion monitoring with total internal reflection ellipsometry Journal of the Electrochemical Society, 2003, 150(11), B536-B539. Web of Science® Times Cited: 8Michal Poksinski and Hans Arwin In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry Sensors and actuators. B, Chemical, 2003, 94(3), 247-252. Web of Science® Times Cited: 20Chapters in BooksHans Arwin and Michal Poksinski Total Internal Reflection Ellipsometry: monitoring of proteins on thin metal films Proteins on surfaces, Springer Verlag, 2006, 105-118. Conference ArticlesTorun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin Protein Adsorption on Carbon Nitride Films Studied with in situ Ellipsometry 4th International Conference on Spectroscopic Ellipsometry,2007, 2007. Hans Arwin and Michal Poksinski Total Internal Reflection Ellipsometry: a tool for analysis of ultrathin films on metal surfaces 4th Workshop Ellipsometry,2006, 2006. Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin Bioadsorption studies on carbon nitride films using in-situ ellipsometry E-MRS spring meeting,2005, 2005. Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin Adsorption of human serum albumin on carbon nitride films studied with in-situ ellipsometry American Vacuum Society 52 Int Symposium and Exhibition,2005, 2005. Hans Arwin and Michal Poksinski Protein-Surface Interactions Studied with Internal Reflection Ellipsometry AVS 51st International Symposium Exhibition,2004, 2004. Michal Poksinski, Hasan Dzuho, Jan-Ove Järrhed and Hans Arwin Total internal reflection ellipsometry Eurosensors XIV: The 14th European Conference on Solid-State Transducers : Book of Abstracts, 2000. Ph.D. ThesesMichal Poksinski Total internal reflection ellipsometry 2005.
Chapters in Books