Publications for Michal Poksinski
Co-author map based on ISI articles 2007-
Journal Articles
Hans Arwin, Michal Poksinski and Knut Johansen
Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions
Physica Status Solidi (a) applications and materials science, 2008, 205(4), 817-820.
Web of Science® Times Cited: 9 |
Michal Poksinski and Hans Arwin
Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces
Optics Letters, 2007, 32(10), 1308-1310.
Web of Science® Times Cited: 15 |
Michal Poksinski and Hans Arwin
Protein monolayers monitored by internal reflection ellipsometry
Thin Solid Films, 2004, 455-456, 716-721.
Web of Science® Times Cited: 51 |
Hans Arwin, Michal Poksinski and Knut Johansen
Total internal reflection ellipsometry: principles and applications
Applied Optics, 2004, 43(15), 3028-3036.
Web of Science® Times Cited: 64 |
Michal Poksinski and Hans Arwin
In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry
Sensors and actuators. B, Chemical, 2003, 94(3), 247-252.
Web of Science® Times Cited: 16 |
Michal Poksinski, Hasan Dzuho and Hans Arwin
Copper corrosion monitoring with total internal reflection ellipsometry
Journal of the Electrochemical Society, 2003, 150(11), B536-B539.
Web of Science® Times Cited: 4 |
Chapters in Books
Conference Articles
Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
Protein Adsorption on Carbon Nitride Films Studied with in situ Ellipsometry
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Hans Arwin, Michal Poksinski and Knut Johansen
Enhancement in ellipsometric thin film sensivity near surface plasmon resonance conditions
4th Internations Conference on Spectroscopic Ellipsometry,2007, 2007.
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Hans Arwin and Michal Poksinski
Total Internal Reflection Ellipsometry: a tool for analysis of ultrathin films on metal surfaces
4th Workshop Ellipsometry,2006, 2006.
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Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
Adsorption of human serum albumin on carbon nitride films studied with in-situ ellipsometry
American Vacuum Society 52 Int Symposium and Exhibition,2005, 2005.
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Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
Bioadsorption studies on carbon nitride films using in-situ ellipsometry
E-MRS spring meeting,2005, 2005.
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Hans Arwin and Michal Poksinski
Protein-Surface Interactions Studied with Internal Reflection Ellipsometry
AVS 51st International Symposium Exhibition,2004, 2004.
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Michal Poksinski, Hasan Dzuho, Jan-Ove Järrhed and Hans Arwin
Total internal reflection ellipsometry
Eurosensors XIV: The 14th European Conference on Solid-State Transducers : Book of Abstracts, 2000.
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Ph.D. Theses
Ph.D., Lic. Theses
