Publications for Michal Poksinski
Co-author map based on ISI articles 2007-

Keywords

tire situ sensitivity semitransparent resonance reflection protein plasmon p>a opens monitoring metal gold film ellipsometry ellipsometric corrosion adsorption adsorbed (tire)

Journal Articles

Hans Arwin, Michal Poksinski and Knut Johansen
  Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions
  Physica Status Solidi (a) applications and materials science, 2008, 205(4), 817-820.
 Web of Science® Times Cited: 12

Michal Poksinski and Hans Arwin
  Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces
  Optics Letters, 2007, 32(10), 1308-1310.
 Web of Science® Times Cited: 16

Michal Poksinski and Hans Arwin
  Protein monolayers monitored by internal reflection ellipsometry
  Thin Solid Films, 2004, 455-456, 716-721.
 Web of Science® Times Cited: 62

Hans Arwin, Michal Poksinski and Knut Johansen
  Total internal reflection ellipsometry: principles and applications
  Applied Optics, 2004, 43(15), 3028-3036.
 Web of Science® Times Cited: 75

Michal Poksinski and Hans Arwin
  In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry
  Sensors and actuators. B, Chemical, 2003, 94(3), 247-252.
 Web of Science® Times Cited: 17

Michal Poksinski, Hasan Dzuho and Hans Arwin
  Copper corrosion monitoring with total internal reflection ellipsometry
  Journal of the Electrochemical Society, 2003, 150(11), B536-B539.
 Web of Science® Times Cited: 6

Chapters in Books

Hans Arwin and Michal Poksinski
  Total Internal Reflection Ellipsometry: monitoring of proteins on thin metal films
  Proteins on surfaces, Springer Verlag, 2006, 105-118.


Conference Articles

Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
  Protein Adsorption on Carbon Nitride Films Studied with in situ Ellipsometry
  4th International Conference on Spectroscopic Ellipsometry,2007, 2007.


Hans Arwin and Michal Poksinski
  Total Internal Reflection Ellipsometry: a tool for analysis of ultrathin films on metal surfaces
  4th Workshop Ellipsometry,2006, 2006.


Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
  Adsorption of human serum albumin on carbon nitride films studied with in-situ ellipsometry
  American Vacuum Society 52 Int Symposium and Exhibition,2005, 2005.


Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
  Bioadsorption studies on carbon nitride films using in-situ ellipsometry
  E-MRS spring meeting,2005, 2005.


Hans Arwin and Michal Poksinski
  Protein-Surface Interactions Studied with Internal Reflection Ellipsometry
  AVS 51st International Symposium Exhibition,2004, 2004.


Michal Poksinski, Hasan Dzuho, Jan-Ove Järrhed and Hans Arwin
  Total internal reflection ellipsometry
  Eurosensors XIV: The 14th European Conference on Solid-State Transducers : Book of Abstracts, 2000.


Ph.D. Theses

Michal Poksinski
  Total internal reflection ellipsometry
  2005.