Publications for Manfred Beckers

Publications for Manfred BeckersCo-author map based on ISI articles 2007-

Keywords

x-ray x-ray ti substrates strain sputtering spectroscopy si plane phases n multilayers microscopy max magnetron diffraction deposited degrees basal al

Journal Articles

Manfred Beckers, Fredrik Eriksson, Jonas Lauridsen, C. Baehtz, Jens Jensen and Lars Hultman
  Formation of basal plane fiber-textured Ti2AlN films on amorphous substrates
  PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2010, 4(05-Jun), 121-123.
 Web of Science® Times Cited: 2

Per Eklund, Manfred Beckers, Ulf Jansson, Hans Högberg and Lars Hultman
  The M(n+1)AX(n) phases: Materials science and thin-film processing
  Thin Solid Films, 2010, 518(8), 1851-1878.
   Fulltext  PDF  
 Web of Science® Times Cited: 196

Jenny Frodelius, Per Eklund, Manfred Beckers, Per Persson, Hans Högberg and Lars Hultman
  Sputter deposition from a Ti2AlC target: Process characterization and conditions for growth of Ti2AlC
  Thin Solid Films, 2010, 518(6), 1621-1626.
   Fulltext  PDF  
 Web of Science® Times Cited: 24

Manfred Beckers, Carina Höglund, Carsten Baehtz, R.M.S. Martins, Per O. Å. Persson, Lars Hultman and W. Möller
  The influence of substrate temperature and Al mobility on the microstructural evolution of magnetron sputtered ternary Ti-Al-N thin films
  Journal of Applied Physics, 2009, 106(6), 064915.
 Web of Science® Times Cited: 5

Axel Flink, Manfred Beckers, Jacob Sjolen, Tommy Larsson, Slawomir Braun, Lennart Karlsson and Lars Hultman
  The location and effects of Si in (Ti1-xSix)N-y thin films
  JOURNAL OF MATERIALS RESEARCH, 2009, 24(8), 2483-2498.
 Web of Science® Times Cited: 20

Naureen Ghafoor, Fredrik Eriksson, Arkady Mikhaylushkin, Igor Abrikosov, Eric M. Gullikson, Manfred Beckers, U. Kressing, Lars Hultman and Jens Birch
  Effects of O and N impurities on the nanostructural evolution during growth of Cr/Sc multilayers
  Journal of Materials Research, 2009, 24(1), 79-95.
 Web of Science® Times Cited: 2

Vanya Darakchieva, Manfred Beckers, Mengyao Xie, Lars Hultman, Bo Monemar, J-. F. Carlin, E. Feltin, M. Gonschorek and N. Grandjean
  Effects of strain and composition on the lattice parameters and applicability of Vegard's rule in Al-rich Al1-x Inx N films grown on sapphire
  Journal of Applied Physics, 2008, 103(10), 103513.
 Web of Science® Times Cited: 28

Herbert Willmann, Manfred Beckers, Jens Birch, P.H. Mayrhofer, C. Mitterer and Lars Hultman
  Epitaxial growth of Al-Cr-N thin films on MgO(111)
  Thin Solid Films, 2008, 517(2), 598-602.
   Fulltext  PDF  
 Web of Science® Times Cited: 8

Carina Höglund, Jens Birch, Manfred Beckers, Björn Alling, Zsolt Czigany, Arndt Mücklich and Lars Hultman
  Sc3AlN: A New Perovskite
  European Journal of Inorganic Chemistry, 2008, 2008(8), 1193-1195.
 Web of Science® Times Cited: 14

Hans Söderberg, Axel Flink, Jens Birch, Per Persson, Manfred Beckers, Lars Hultman and Magnus Odén
  Growth and characterization of TiN/SiN(001) superlattice films
  Journal of Materials Research, 2007, 22(11), 3255-3264.
 Web of Science® Times Cited: 23

Per Eklund, Manfred Beckers, Jenny Frodelius, Hans Högberg and Lars Hultman
  Magnetron sputtering of Ti3SiC2 thin films from a Ti3SiC2 compound target
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25(5), 1381-1388.
 Web of Science® Times Cited: 27

Conference Articles

Vanya Darakchieva, Manfred Beckers, Lars Hultman, Mengyao Xie, Bo Monemar, J.-F Carlin and N. Grandjean
  Strain and compositional analyzes of Al-rich Al1-xInxN alloys grown by MOVPE: impact on the applicability of Vegard's rule
  Physica Status Solidi (C) Current Topics in Solid State Physics, 2008.


 Web of Science® Times Cited: 1