Publications for Kenneth Järrendahl
Co-author map based on ISI articles 2007-
Journal Articles
Arturo Mendoza-Galván, Kenneth Järrendahl, Alexander Dmitriev, T. Pakizeh, Mikael Käll and Hans Arwin
Fano interference in supported gold nanosandwiches with weakly coupled nanodisks
Optics Express, 2012, 20(28), 29646-29658.
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Hans Arwin, Roger Magnusson, Jan Landin and Kenneth Järrendahl
Chirality-induced polarization effects in the cuticle of scarab beetles: 100 years after Michelson
Philosophical Magazine, 2012, 92(12), 1583-1599.
Fulltext Web of Science® Times Cited: 3 |
A. Mendoza-Galvan, Kenneth Järrendahl, A. Dmitriev, T. Pakizeh, M. Käll and Hans Arwin
Optical response of supported gold nanodisks
Optics Express, 2011, 19(13), 12093-12107.
Web of Science® Times Cited: 5 |
C Akerlind, Hans Arwin, Fredrik Jakobsson, H Kariis and Kenneth Järrendahl
Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study
THIN SOLID FILMS, 2011, 519(11), 3582-3586.
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Arturo Mendoza-Galvan, M Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
Spectroscopic ellipsometry study on the dielectric function of bulk Ti2AlN,Ti2AlC, Nb2AlC, (Ti0.5,Nb0.5)2AlC, and Ti3GeC2 MAX-phases
Journal of Applied Physics, 2011, 109, 013530.
Fulltext Web of Science® Times Cited: 2 |
Arturo Mendoza-Galvan, Kenneth Järrendahl, Hans Arwin, Yi-Fan Huang, Li-Chyong Chen and Kuei-Hsien Chen
Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching
APPLIED OPTICS, 2009, 48(26), 4996-5004.
Web of Science® Times Cited: 2 |
Christina Åkerlind, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions
Physica status solidi, 2008, 5, 1089-1092.
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Henrik Wiklund, Hans Arwin and Kenneth Järrendahl
A FEM-based application for numerical calculations of ellipsometric data
Physica status solidi, 2008, 4, 945-948.
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O.P.A. Lindquist, Mattias Schubert, Hans Arwin and Kenneth Järrendahl
Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
Elsevier Science, 2004, 455-456, 235-238.
Web of Science® Times Cited: 1 |
ZJ Horvath, Kenneth Järrendahl, M Adam, I Szabo, V Van Tuyen and Z Czigany
Electrical peculiarities in Al/Si/Ge/... /Ge/Si and Al/SiGe/Si structures
Applied Surface Science, 2002, 190(1-4), 403-407.
Web of Science® Times Cited: 10 |
R. Ahuja, Da Silva A. Ferreira, C. Persson, J.M. Osorio-Guillen, I. Pepe, Kenneth Järrendahl, O.P.A. Lindquist, N.V. Edwards, Qamar Ul Wahab and B. Johansson
Optical properties of 4H-SiC
Journal of Applied Physics, 2002, 91(3), 2099-2103.
Web of Science® Times Cited: 15 |
D Gall, M Stadele, Kenneth Järrendahl, I Petrov, P Desjardins, RT Haasch, TY Lee and JE Greene
Electronic structure of ScN determined using optical spectroscopy, photoemission, and ab initio calculations
Physical Review B. Condensed Matter and Materials Physics, 2001, 63(12), .
Web of Science® Times Cited: 64 |
E. Broitman, N. Hellgren, Kenneth Järrendahl, M.P. Johansson, S. Olafsson, G. Radnoczi, J.-E. Sundgren and Lars Hultman
Electrical and optical properties of CNx(0=x=0.25) films deposited by reactive magnetron sputtering
Journal of Applied Physics, 2001, 89(2), 1184-1190.
Web of Science® Times Cited: 39 |
O.P.A. Lindquist, Kenneth Järrendahl, S. Peters, J.T. Zettler, C. Cobet, N. Esser, D.E. Aspnes, Anne Henry and N.V. Edwards
Ordinary and extraordinary dielectric functions of 4H- and 6H-SiC from 3.5 to 9.0 eV
Applied Physics Letters, 2001, 78(18), 2715-2717.
Web of Science® Times Cited: 14 |
Annika Rantzer, Hans Arwin, Jens Birch, B. Hjörvarsson, J.W.P. Bakker and Kenneth Järrendahl
Optical properties of intrinsic and doped a-Si:H films grown by d.c. magnetron sputter deposition
Thin Solid Films, 2001, 394(1-2), 255-262.
Web of Science® Times Cited: 4 |
Sukkaneste Tungasmita, Jens Birch, Per Persson, Kenneth Järrendahl and Lars Hultman
Enhanced quality of epitaxial AlN thin films on 6H-SiC by ultra-high-vacuum ion-assisted reactive dc magnetron sputter deposition
Applied Physics Letters, 2000, 76(2), 170-172.
Web of Science® Times Cited: 24 |
Roger Jansson, S Zangooie, Hans Arwin and Kenneth Järrendahl
Characterization of 3C-SiC by spectroscopic ellipsometry
Physica status solidi. B, Basic research, 2000, 218(1), R1-R2.
Web of Science® Times Cited: 6 |
M Adsten, R Joerger, Kenneth Järrendahl and E Wackelgard
Optical characterization of industrially sputtered nickel-nickel oxide solar selective surface
Solar Energy, 2000, 68(4), 325-328.
Web of Science® Times Cited: 21 |
NV Edwards, Kenneth Järrendahl, DE Aspnes, K Robbie, GD Powell, C Cobet, N Esser, W Richter and LD Madsen
Real-time assessment of selected surface preparation regimens for 4H-SiC surfaces using spectroscopic ellipsometry
Surface Science, 2000, 464(1), L703-L707.
Web of Science® Times Cited: 8 |
Sukkaneste Tungasmita, Per Persson, Kenneth Järrendahl, Lars Hultman and Jens Birch
Low-energy-ion-assisted reactive sputter deposition of epitaxial AlN thin films on 6H-SiC
Materials Science Forum, 2000, 338-3, 1519-1522.
Web of Science® Times Cited: 3 |
NV Edwards, LD Madsen, K Robbie, GD Powell, Kenneth Järrendahl, C Cobet, N Esser, W Richter and DE Aspnes
Real-time assessment of overlayer removal on 4H-SiC surfaces: Techniques and relevance to contact formation
Materials Science Forum, 2000, 338-3, 1033-1036.
Web of Science® Times Cited: 3 |
OPA Lindquist, Hans Arwin, Urban Forsberg, JP Bergman and Kenneth Järrendahl
Optical characterization of 4H-SiC by variable angle of incidence spectroscopic ellipsometry
Materials Science Forum, 2000, 338-3, 575-578.
Web of Science® Times Cited: 2 |
Å. A. Johansson, Kenneth Järrendahl, Jens Birch, B. Hjörvarsson and Hans Arwin
Intrinsic, n- and p-doped a-Si:H thin films grown by DC magnetron sputtering with doped targets
Materials Research Society Symposium Proceedings, 1999, 557, 31-36.
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Kenneth Järrendahl, Mihnea Dulea, Jens Birch and Jan- Erik Sundgren
X-ray diffraction from amorphous Ge/Si Cantor superlattices
Physical Review B Condensed Matter, 1995, 51(12), 7621-7631.
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Conference Articles
Sergiy Valyukh, Hans Arwin, Christina Åkerlind and Kenneth Järrendahl
Simulation of light scattering from biological helicoidal structures
7th Workshop Ellipsometry, 2012.
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Sergiy Valyukh, Hans Arwin and Kenneth Järrendahl
Light Scattering and Colour Generation in exoskeletons of Jewelled Beetle
Photonics Global Conference, 2012.
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Lia Fernández del Río, Hans Arwin, Jan Landin, Roger Magnusson and Kenneth Järrendahl
A Mueller Matrix Spectroscopic Ellipsometry Study of Scarab Beetles of the Chrysina Genus
7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.
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Eloy Guadalupe Muñoz-Pineda, Arturo Mendoza-Galván, Reina Araceli Mauricio-Sánchez, Jan Landin, Kenneth Järrendahl and Hans Arwin
Polarization properties and structural color of the scarab beetle Cotinis mutabilis (Mayatl)
XXI International Materials Research Congress (IMRC 2012), August 12 - 17, 2012, Cancun, Mexico, 2012.
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Hans Arwin, Blaine Johs and Kenneth Järrendahl
Analysis of Mueller-matrix data from chiral structures in exoskeletons of scarab beetles
E-MRS 2012 Spring meeting, May 14-18, 2012, Strasbourg, France, 2012.
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Hans Arwin, Torun Berlind, Jens Birch, Lia Fernández del Río, Johan Gustafson, Jan Landin, Roger Magnusson, Christina Åkerlind and Kenneth Järrendahl
Polarization effects in reflection from the cuticle of scarab beetles studied by spectroscopic Mueller-matrix ellipsometry
AES 2012, Advanced Electromagnetics Symposium, 2012.
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Kenneth Järrendahl, Jens Birch, Roger Magnusson, Ching-Lien Hsiao, Per Sandström, Torun Berlind, Johan L.I. Gustafson, Lia Fernández del Río, Jan Landin and Hans Arwin
Polarization of Light Reflected from Chiral Structures - Calculations Compared with Mueller Matrix Ellipsometry Measurements on Natural and Synthetic Samples
7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.
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Kenneth Järrendahl, Jan Landin and Hans Arwin
Mueler-Matrix Ellipsometry Studies of Optically Active Structures in Scarab Beerles (conf. France)
First NanoCharm Workshop on Advanced Polarimetric Instrumentation, Palaiseay, France, 7-9, Dec. 2009, 2009.
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Kenneth Järrendahl, Jan Landin and Hans Arwin
Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab Beetles
AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13, 2009, 2009.
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Arturo Mendoza-Galvan, Marcin Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
Spectroscopic Ellipsometry of Bulk MAS-phases
AVS 56th Int. Symp. & Exhibition, San Jose, CA ,USA, November 8-13, 2009, 2009.
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Kenneth Järrendahl, Jan Landin and Hans Arwin
Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab
AVS 56th Int. Symp. & Exhibition, San José, CA USA, November 8-13 2009, 2009.
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Hans Arwin, A. Mendoza-Galván, Kenneth Järrendahl, A. Dmitriev, T. Pakizeh and M. Käll
Artificial Magnetism in Gold-Silica-Gold Metamaterials - an ellipsometric Study
5th Workshop Ellipsometry, Zweibrücken, Germany March 2-4, 2009, 2009.
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Christina Åkerlind, Hans Arwin, Fredrik L.E. Jakobsson, Hans Kariis and Kenneth Järrendahl
Optical Properties and Switching of a Rose Bengal Derivativ
5th Workshop ellipsometry, Zweibrücken, Germany, March 2-4 2009, 2009.
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Hans Arwin, Jan Landin, Kenneth Järrendahl, J Boulenguez and S. Berthier
Optical Activity in the Cuticle of the Beetle Cetonia Aurata
5th Workshop Ellipsometry, Zweibrücken, Germany, March 2-4 2009, 2009.
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Arturo Mendoza-Galván, Kenneth Järrendahl, Hans Arwin, I.F. Huang and K.H Chen
Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching
5th Workshop Ellipsometry, Zweibrücken, Germany, 2009.
Web of Science® Times Cited: 2
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Hans Arwin, Jan Landin and Kenneth Järrendahl
Optical activity in the cuticle of the beetle Cetonia aurata
Optikdagen 2008,2008, 2008.
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Hans Arwin, Jan Landin and Kenneth Järrendahl
Optical active cuticle structures in the beetle Cetonia aurata
European Optical Society Meeting 2008,2008, 2008.
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Christina Åkerlind, Hans Arwin, Fredrik Jakobsson, Hans Kariis and Kenneth Järrendahl
Optical properties and switching of a rose bengal derivative studied by spectroscopic ellipsometry
European Optical Society Meeting 2008,2008, 2008.
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Hans Arwin, Jan Landin and Kenneth Järrendahl
Spectral confinement of circularly polarized reflection from the cuticle of Cetonia aurata measured by spectroscopic Mueller-matrix ellipsometry
E-MRS,2008, 2008.
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Christina Nilsson, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
Combining Spectroscopic Ellipsometry and Vector Network Analysis to obtain Electromagnetic Response in a Wide Wavelength Region
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Julie Boulenguez, Hans Arwin, Kenneth Järrendahl and Serge Berthier
Ellipsometric study of photonic structures in wing scales of butterflies
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Henrik Wiklund, Hans Arwin and Kenneth Järrendahl
A FEM-based application for numerical calculations of ellipsometric data: A tool for analysis of advanced optical structures
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Hans Arwin, Julie Boulenguez, Kenneth Järrendahl and Serge Bertier
Ellipsometric study of photonic structures in wing scales of butterflies
Optik i Sverige,2007, 2007.
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Pentti Tengvall, Alf Kindgren, Kenneth Järrendahl and Kajsa Uvdal
CDIO-based courses in engineering biology at LiTH
CDIO International Conference and Collaborators meeting,2005, 2005.
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OPA Lindquist, Hans Arwin, Anne Henry and Kenneth Järrendahl
Infrared optical properties of 3C, 4H and 6H silicon carbide
Materials Science Forum, Vols. 433-436, 2003.
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Ph.D., Lic. Theses
