Publications for Kenneth Järrendahl
Co-author map based on ISI articles 2007-

Publications mentioned in social media 4 times*

Keywords

spectroscopic spectral scarab reflection reflected polarization optical mueller-matrix model magnetron incidence ev ellipsometry dielectric cuticle chrysina chiral beetles beetle angle

Journal Articles

Eloy Muñoz-Pineda, Kenneth Järrendahl, Hans Arwin and Arturo Mendoza-Galván
  Symmetries and relationships between elements of the Mueller matrix spectra of the cuticle of the beetle Cotinis mutabilis
  Thin Solid Films, 2013, , .

Lia Fernández del Río, Hans Arwin and Kenneth Järrendahl
  Polarizing properties and structural characteristics of the cuticle of the scarab Beetle Chrysina gloriosa
  Thin Solid Films, 2013, , .

Hans Arwin, Torun Berlind, Blaine Johs and Kenneth Järrendahl
  Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data
 
Altmetric usage: 4

  Optics Express, 2013, 21(19), 22645-22656.
   Fulltext  PDF  

Arturo Mendoza-Galván, Kenneth Järrendahl, Alexander Dmitriev, T. Pakizeh, Mikael Käll and Hans Arwin
  Fano interference in supported gold nanosandwiches with weakly coupled nanodisks
  Optics Express, 2012, 20(28), 29646-29658.
   Fulltext  PDF  

Hans Arwin, Roger Magnusson, Jan Landin and Kenneth Järrendahl
  Chirality-induced polarization effects in the cuticle of scarab beetles: 100 years after Michelson
  Philosophical Magazine, 2012, 92(12), 1583-1599.
   Fulltext  PDF  
 Web of Science® Times Cited: 7

A. Mendoza-Galvan, Kenneth Järrendahl, A. Dmitriev, T. Pakizeh, M. Käll and Hans Arwin
  Optical response of supported gold nanodisks
  Optics Express, 2011, 19(13), 12093-12107.
 Web of Science® Times Cited: 7

C Akerlind, Hans Arwin, Fredrik Jakobsson, H Kariis and Kenneth Järrendahl
  Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study
  THIN SOLID FILMS, 2011, 519(11), 3582-3586.
   Fulltext  PDF  

Arturo Mendoza-Galvan, M Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
  Spectroscopic ellipsometry study on the dielectric function of bulk Ti2AlN,Ti2AlC, Nb2AlC, (Ti0.5,Nb0.5)2AlC, and Ti3GeC2 MAX-phases
  Journal of Applied Physics, 2011, 109, 013530.
   Fulltext  PDF  
 Web of Science® Times Cited: 5

Arturo Mendoza-Galvan, Kenneth Järrendahl, Hans Arwin, Yi-Fan Huang, Li-Chyong Chen and Kuei-Hsien Chen
  Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching
  APPLIED OPTICS, 2009, 48(26), 4996-5004.
 Web of Science® Times Cited: 3

Christina Åkerlind, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
  Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions
  Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5(5), 1089-1092.

Henrik Wiklund, Hans Arwin and Kenneth Järrendahl
  A FEM-based application for numerical calculations of ellipsometric data
  Physica Status Solidi (a) applications and materials science, 2008, 205(4), 945-948.

O.P.A. Lindquist, Mattias Schubert, Hans Arwin and Kenneth Järrendahl
  Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
  Elsevier Science, 2004, 455-456, 235-238.
 Web of Science® Times Cited: 1

ZJ Horvath, Kenneth Järrendahl, M Adam, I Szabo, V Van Tuyen and Z Czigany
  Electrical peculiarities in Al/Si/Ge/... /Ge/Si and Al/SiGe/Si structures
  Applied Surface Science, 2002, 190(1-4), 403-407.
 Web of Science® Times Cited: 10

R. Ahuja, Da Silva A. Ferreira, C. Persson, J.M. Osorio-Guillen, I. Pepe, Kenneth Järrendahl, O.P.A. Lindquist, N.V. Edwards, Qamar Ul Wahab and B. Johansson
  Optical properties of 4H-SiC
  Journal of Applied Physics, 2002, 91(3), 2099-2103.
 Web of Science® Times Cited: 16

D Gall, M Stadele, Kenneth Järrendahl, I Petrov, P Desjardins, RT Haasch, TY Lee and JE Greene
  Electronic structure of ScN determined using optical spectroscopy, photoemission, and ab initio calculations
  Physical Review B. Condensed Matter and Materials Physics, 2001, 63(12), .
 Web of Science® Times Cited: 73

E. Broitman, N. Hellgren, Kenneth Järrendahl, M.P. Johansson, S. Olafsson, G. Radnoczi, J.-E. Sundgren and Lars Hultman
  Electrical and optical properties of CNx(0=x=0.25) films deposited by reactive magnetron sputtering
  Journal of Applied Physics, 2001, 89(2), 1184-1190.
 Web of Science® Times Cited: 40

O.P.A. Lindquist, Kenneth Järrendahl, S. Peters, J.T. Zettler, C. Cobet, N. Esser, D.E. Aspnes, Anne Henry and N.V. Edwards
  Ordinary and extraordinary dielectric functions of 4H- and 6H-SiC from 3.5 to 9.0 eV
  Applied Physics Letters, 2001, 78(18), 2715-2717.
 Web of Science® Times Cited: 15

Annika Rantzer, Hans Arwin, Jens Birch, B. Hjörvarsson, J.W.P. Bakker and Kenneth Järrendahl
  Optical properties of intrinsic and doped a-Si:H films grown by d.c. magnetron sputter deposition
  Thin Solid Films, 2001, 394(1-2), 255-262.
 Web of Science® Times Cited: 4

Sukkaneste Tungasmita, Jens Birch, Per Persson, Kenneth Järrendahl and Lars Hultman
  Enhanced quality of epitaxial AlN thin films on 6H-SiC by ultra-high-vacuum ion-assisted reactive dc magnetron sputter deposition
  Applied Physics Letters, 2000, 76(2), 170-172.
 Web of Science® Times Cited: 24

Roger Jansson, S Zangooie, Hans Arwin and Kenneth Järrendahl
  Characterization of 3C-SiC by spectroscopic ellipsometry
  Physica status solidi. B, Basic research, 2000, 218(1), R1-R2.
 Web of Science® Times Cited: 6

M Adsten, R Joerger, Kenneth Järrendahl and E Wackelgard
  Optical characterization of industrially sputtered nickel-nickel oxide solar selective surface
  Solar Energy, 2000, 68(4), 325-328.
 Web of Science® Times Cited: 23

NV Edwards, Kenneth Järrendahl, DE Aspnes, K Robbie, GD Powell, C Cobet, N Esser, W Richter and LD Madsen
  Real-time assessment of selected surface preparation regimens for 4H-SiC surfaces using spectroscopic ellipsometry
  Surface Science, 2000, 464(1), L703-L707.
 Web of Science® Times Cited: 8

Sukkaneste Tungasmita, Per Persson, Kenneth Järrendahl, Lars Hultman and Jens Birch
  Low-energy-ion-assisted reactive sputter deposition of epitaxial AlN thin films on 6H-SiC
  Materials Science Forum, 2000, 338-3, 1519-1522.
 Web of Science® Times Cited: 3

NV Edwards, LD Madsen, K Robbie, GD Powell, Kenneth Järrendahl, C Cobet, N Esser, W Richter and DE Aspnes
  Real-time assessment of overlayer removal on 4H-SiC surfaces: Techniques and relevance to contact formation
  Materials Science Forum, 2000, 338-3, 1033-1036.
 Web of Science® Times Cited: 3

OPA Lindquist, Hans Arwin, Urban Forsberg, JP Bergman and Kenneth Järrendahl
  Optical characterization of 4H-SiC by variable angle of incidence spectroscopic ellipsometry
  Materials Science Forum, 2000, 338-3, 575-578.
 Web of Science® Times Cited: 2

Å. A. Johansson, Kenneth Järrendahl, Jens Birch, B. Hjörvarsson and Hans Arwin
  Intrinsic, n- and p-doped a-Si:H thin films grown by DC magnetron sputtering with doped targets
  Materials Research Society Symposium Proceedings, 1999, 557, 31-36.

Kenneth Järrendahl, Mihnea Dulea, Jens Birch and Jan- Erik Sundgren
  X-ray diffraction from amorphous Ge/Si Cantor superlattices
  Physical Review B Condensed Matter, 1995, 51(12), 7621-7631.

Conference Articles

Sergiy Valyukh, Hans Arwin, Christina Åkerlind and Kenneth Järrendahl
  Simulation of light scattering from biological helicoidal structures
  7th Workshop Ellipsometry, 2012.


Sergiy Valyukh, Hans Arwin and Kenneth Järrendahl
  Light Scattering and Colour Generation in exoskeletons of Jewelled Beetle
  Photonics Global Conference, 2012.


Lia Fernández del Río, Hans Arwin, Jan Landin, Roger Magnusson and Kenneth Järrendahl
  A Mueller Matrix Spectroscopic Ellipsometry Study of Scarab Beetles of the Chrysina Genus
  7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.


Eloy Guadalupe Muñoz-Pineda, Arturo Mendoza-Galván, Reina Araceli Mauricio-Sánchez, Jan Landin, Kenneth Järrendahl and Hans Arwin
  Polarization properties and structural color of the scarab beetle Cotinis mutabilis (Mayatl)
  XXI International Materials Research Congress (IMRC 2012), August 12 - 17, 2012, Cancun, Mexico, 2012.


Hans Arwin, Blaine Johs and Kenneth Järrendahl
  Analysis of Mueller-matrix data from chiral structures in exoskeletons of scarab beetles
  E-MRS 2012 Spring meeting, May 14-18, 2012, Strasbourg, France, 2012.


Hans Arwin, Torun Berlind, Jens Birch, Lia Fernández del Río, Johan Gustafson, Jan Landin, Roger Magnusson, Christina Åkerlind and Kenneth Järrendahl
  Polarization effects in reflection from the cuticle of scarab beetles studied by spectroscopic Mueller-matrix ellipsometry
  AES 2012, Advanced Electromagnetics Symposium, 2012.


Kenneth Järrendahl, Jens Birch, Roger Magnusson, Ching-Lien Hsiao, Per Sandström, Torun Berlind, Johan L.I. Gustafson, Lia Fernández del Río, Jan Landin and Hans Arwin
  Polarization of Light Reflected from Chiral Structures - Calculations Compared with Mueller Matrix Ellipsometry Measurements on Natural and Synthetic Samples
  7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.


Kenneth Järrendahl, Jan Landin and Hans Arwin
  Mueler-Matrix Ellipsometry Studies of Optically Active Structures in Scarab Beerles (conf. France)
  First NanoCharm Workshop on Advanced Polarimetric Instrumentation, Palaiseay, France, 7-9, Dec. 2009, 2009.


Kenneth Järrendahl, Jan Landin and Hans Arwin
  Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab Beetles
  AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13, 2009, 2009.


Arturo Mendoza-Galvan, Marcin Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
  Spectroscopic Ellipsometry of Bulk MAS-phases
  AVS 56th Int. Symp. & Exhibition, San Jose, CA ,USA, November 8-13, 2009, 2009.


Kenneth Järrendahl, Jan Landin and Hans Arwin
  Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab
  AVS 56th Int. Symp. & Exhibition, San José, CA USA, November 8-13 2009, 2009.


Hans Arwin, A. Mendoza-Galván, Kenneth Järrendahl, A. Dmitriev, T. Pakizeh and M. Käll
  Artificial Magnetism in Gold-Silica-Gold Metamaterials - an ellipsometric Study
  5th Workshop Ellipsometry, Zweibrücken, Germany March 2-4, 2009, 2009.


Christina Åkerlind, Hans Arwin, Fredrik L.E. Jakobsson, Hans Kariis and Kenneth Järrendahl
  Optical Properties and Switching of a Rose Bengal Derivativ
  5th Workshop ellipsometry, Zweibrücken, Germany, March 2-4 2009, 2009.


Hans Arwin, Jan Landin, Kenneth Järrendahl, J Boulenguez and S. Berthier
  Optical Activity in the Cuticle of the Beetle Cetonia Aurata
  5th Workshop Ellipsometry, Zweibrücken, Germany, March 2-4 2009, 2009.


Arturo Mendoza-Galván, Kenneth Järrendahl, Hans Arwin, I.F. Huang and K.H Chen
  Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching
  5th Workshop Ellipsometry, Zweibrücken, Germany, 2009.


Hans Arwin, Jan Landin and Kenneth Järrendahl
  Optical activity in the cuticle of the beetle Cetonia aurata
  Optikdagen 2008,2008, 2008.


Hans Arwin, Jan Landin and Kenneth Järrendahl
  Spectral confinement of circularly polarized reflection from the cuticle of Cetonia aurata measured by spectroscopic Mueller-matrix ellipsometry
  E-MRS,2008, 2008.


Christina Åkerlind, Hans Arwin, Fredrik Jakobsson, Hans Kariis and Kenneth Järrendahl
  Optical properties and switching of a rose bengal derivative studied by spectroscopic ellipsometry
  European Optical Society Meeting 2008, 2008.


Hans Arwin, Jan Landin and Kenneth Järrendahl
  Optical active cuticle structures in the beetle Cetonia aurata
  European Optical Society Meeting 2008, 2008.


Christina Nilsson, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
  Combining Spectroscopic Ellipsometry and Vector Network Analysis to obtain Electromagnetic Response in a Wide Wavelength Region
  4th International Conference on Spectroscopic Ellipsometry,2007, 2007.


Hans Arwin, Julie Boulenguez, Kenneth Järrendahl and Serge Bertier
  Ellipsometric study of photonic structures in wing scales of butterflies
  Optik i Sverige,2007, 2007.


Julie Boulenguez, Hans Arwin, Kenneth Järrendahl and Serge Berthier
  Ellipsometric study of photonic structures in wing scales of butterflies
  4th International Conference on Spectroscopic Ellipsometry, 2007, 2007.


Pentti Tengvall, Alf Kindgren, Kenneth Järrendahl and Kajsa Uvdal
  CDIO-based courses in engineering biology at LiTH
  CDIO International Conference and Collaborators meeting,2005, 2005.


OPA Lindquist, Hans Arwin, Anne Henry and Kenneth Järrendahl
  Infrared optical properties of 3C, 4H and 6H silicon carbide
  Materials Science Forum, Vols. 433-436, 2003.


* Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.