Publications for Jens Emmerlich


Co-author map based on Web of Sciences articles 2007-

Publications mentioned in social media 1 times*

Journal Articles

Jens Emmerlich, Gert Gassner, Per Eklund, Hans Högberg and Lars Hultman
  Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films
  Wear, 2008, 264(11-12), 914-919.
 Web of Science® Times Cited: 22

T.H. Scabarozi, Per Eklund, Jens Emmerlich, Hans Högberg, T. Meehan, P. Finkel, M.W. Barsoum, J.D. Hettinger, Lars Hultman and S.E. Lofland
  Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC
  Solid State Communications, 2008, 146(11-12), 498-501.
 Web of Science® Times Cited: 19

Per Eklund, Anand Murugaiah, Jens Emmerlich, Zsolt Czigany, Jenny Frodelius, Michel W. Barsoum, Hans Högberg and Lars Hultman
  Homoepitaxial growth of Ti-Si-C MAX-phase thin films on bulk Ti3SiC2 substrates
  Journal of Crystal Growth, 2007, 304(1), 264-269.
 Web of Science® Times Cited: 24

Jens Emmerlich, Denis Music, Per Eklund, Ola Wilhelmsson, Ulf Jansson, Jochen M. Schneider, Hans Högberg and Lars Hultman
  Thermal stability of Ti3SiC2 thin films
  Acta Materialia, 2007, 55(4), 1479-1488.
 Web of Science® Times Cited: 100

Jens Emmerlich, Per Eklund, Dirk Rittrich, Hans Högberg and Lars Hultman
  Electrical resistivity of Tin+1ACn (A = Si, Ge, Sn, n = 1–3) thin films
  Journal of Materials Research, 2007, 22(8), 2279-2287.
 Web of Science® Times Cited: 18

M. Rester, Jörg Neidhardt, Per Eklund, Jens Emmerlich, H. Ljungcrantz, Lars Hultman and C. Mitterer
  Annealing studies of nanocomposite Ti-Si-C thin films with respect to phase stability and tribological performance
  Materials Science & Engineering: A, 2006, 429( 1-2), 90-95.
 Web of Science® Times Cited: 30

Per Eklund, Chariya Virojanadara, Jens Emmerlich, Leif Johansson, Hans Högberg and Lars Hultman
  Photoemission studies of Ti3SiC2 and nanocrystalline-TiC/amorphous-SiC nanocomposite thin films
  Physical Review B. Condensed Matter and Materials Physics, 2006, 74(4), 045417.
 Web of Science® Times Cited: 31

Henry Riascos, Jörg Neidhardt, G. Z. Radnoczi, Jens Emmerlich, G. Zambrano, Lars Hultman and P. Prieto
  Structure and properties of pulsed-laser deposited carbon nitride thin films
  Thin Solid Films, 2006, 497(1-2), 1-6.
 Web of Science® Times Cited: 25

Jones Alami, Per Eklund, Jens Emmerlich, O. Wilhelmsson, U. Jansson, Hans Högberg, Lars Hultman and Ulf Helmersson
  High-power impulse magnetron sputtering of Ti-Si-C thin films from a Ti3SiC2 compound target
  Thin Solid Films, 2006, 515(4), 1731-1736.
   Fulltext  PDF  
 Web of Science® Times Cited: 60

Martin Magnuson, M. Mattesini, Ola Wilhelmsson, Jens Emmerlich, Jens-Petter Palmquist, Sa Li, Rajeev Ahuja, Lars Hultman, Olle Eriksson and Ulf Jansson
  Electronic structure and chemical bonding in Ti4SiC3 investigated by soft x-ray emission spectroscopy and first-principles theory
  Physical Review B. Condensed Matter and Materials Physics, 2006, 74(20), .
   Fulltext  PDF  
 Web of Science® Times Cited: 29

O. Wilhelmsson, J.-P. Palmquist, E. Lewin, Jens Emmerlich, Per Eklund, Per Persson, Hans Högberg, S. Li, R. Ahuja, O. Eriksson, Lars Hultman and U. Jansson
  Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering
  Journal of Crystal Growth, 2006, 291(1), 290-300.
 Web of Science® Times Cited: 112

Hans Högberg, Lars Hultman, Jens Emmerlich, Torbjörn Joelsson, Per Eklund, Jon M. Molina-Aldareguia, Jens-Petter Palmquist, Ola Wilhelmsson and Ulf Jansson
  Growth and characterization of MAX-phase thin films
  Surface & Coatings Technology, 2005, 193(1-3), 6-10.
 Web of Science® Times Cited: 103

Per Eklund, Jens Emmerlich, Hans Högberg, Ola Wilhelmsson, Peter Isberg, Jens Birch, Per O. Å. Persson, Ulf Jansson and Lars Hultman
  Structural, electrical, and mechanical properties of nc-TiC/a-SiC nanocomposite thin films
  Journal of Vacuum Science & Technology B, 2005, 23(6), 2486-2495.
 Web of Science® Times Cited: 52

Martin Magnuson, Jens-Petter Palmquist, M. Mattesini, Sa Li, Rajeev Ahuja, Olle Eriksson, Jens Emmerlich, Ola Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and Ulf Jansson
  Electronic structure investigation of Ti3AlC2 , Ti3SiC2 , and Ti3GeC2 by soft x-ray emission spectroscopy
  Physical Review B. Condensed Matter and Materials Physics, 2005, 72(24), .
   Fulltext  PDF  
 Web of Science® Times Cited: 36

Hans Högberg, Per Eklund, Jens Emmerlich, Jens Birch and Lars Hultman
  Epitaxial Ti2GeC, Ti3GeC2, and Ti4GeC3 MAX-phase thin films grown by magnetron sputtering
  Journal of Materials Research, 2005, 20(4), 779-782.
 Web of Science® Times Cited: 88

Per Eklund, Jens-Petter Palmquist, Ola Wilhelmsson, Ulf Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
  Comment on "Pulsed laser deposition and properties of Mn+1AXx phase formulated Ti3SiC2 thin films"
  Tribology letters, 2004, 17(4), 977-978.
 Web of Science® Times Cited: 7

Jens-Petter Palmquist, Sa Li, Per Persson, Jens Emmerlich, Ola Wilhelmsson, Hans Högberg, M. I. Katsnelson, Börje Johansson, Rajeev Ahuja, Olle Eriksson, Lars Hultman and Ulf Jansson
  Mn+1AXn phases in the Ti-Si-C system studied by thin-film synthesis and ab initio calculations
  Physical Review B. Condensed Matter and Materials Physics, 2004, 70(16), 165401.
 Web of Science® Times Cited: 146

Jens Emmerlich, Hans Högberg, Szilvia Sasvári, Per Persson, Lars Hultman, Jens-Petter Palmquist, Ulf Jansson, Jon M. Molina-Aldareguia and Zsolt Czigány
  Growth of Ti3SiC2 thin films by elemental target magnetron sputtering
  Journal of Applied Physics, 2004, 96(9), 4817-4826.
 Web of Science® Times Cited: 122

Per Eklund, JP Palmquist, O Wilhelmsson, U Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
  Comment on "Pulsed laser deposition and properties of M(n+1)AX(x) phase formulated Ti3SiC2 thin films''
  Tribology letters, 2004, 17(4), 977-978.
 Web of Science® Times Cited: 7

J.M. Molina-Aldareguia, Jens Emmerlich, J.-P. Palmquist, U. Jansson and Lars Hultman
  Kink formation around indents in laminated Ti3SiC2 thin films studied in the nanoscale
  Scripta Materialia, 2003, 49(2), 155-160.
 Web of Science® Times Cited: 64

Conference Articles

Hans Högberg, Jens Emmerlich, Per Eklund, Ola Wilhelmsson, Jens-Petter Palmquist, Ulf Jansson and Lars Hultman
  Growth and characterization of epitaxial MAX-phase thin films from the Tin+1(Si,Ge,Sn)Cn systems
  11th International Ceramics Congress, CIMTEC,2006, 2006.


Per Eklund, Jens Emmerlich, Hans Högberg, Lars Hultman, Ola Wilhelmsson, Ulf Jansson and Peter Isberg
  Synthesis and characterization of Ti-Si-C compounds for electrical contact applications
  IEEE Holm Conference on Electrical Contacts,2005, 2005.


 Web of Science® Times Cited: 6

Ph.D. Theses

Jens Emmerlich
  MAX phase thin films: unique multifunctional ceramics with the elements Ti, Si, Ge, Sn, and C
  2006.


* Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.