Publications for Jens Emmerlich
Co-author map based on ISI articles 2007-

Keywords

°c x-ray tisub> ti temperatures substrates sputtering spectroscopy si resistivity phases microscopy max-phase max magnetron film epitaxial electrical diffraction deposited

Journal Articles

T.H. Scabarozi, Per Eklund, Jens Emmerlich, Hans Högberg, T. Meehan, P. Finkel, M.W. Barsoum, J.D. Hettinger, Lars Hultman and S.E. Lofland
  Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC
  Solid State Communications, 2008, 146(11-12), 498-501.
 Web of Science® Times Cited: 19

Jens Emmerlich, Gert Gassner, Per Eklund, Hans Högberg and Lars Hultman
  Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films
  Wear, 2008, 264(11-12), 914-919.
 Web of Science® Times Cited: 17

Per Eklund, Anand Murugaiah, Jens Emmerlich, Zsolt Czigany, Jenny Frodelius, Michel W. Barsoum, Hans Högberg and Lars Hultman
  Homoepitaxial growth of Ti-Si-C MAX-phase thin films on bulk Ti3SiC2 substrates
  Journal of Crystal Growth, 2007, 304(1), 264-269.
 Web of Science® Times Cited: 22

Jens Emmerlich, Per Eklund, Dirk Rittrich, Hans Högberg and Lars Hultman
  Electrical resistivity of Tin+1ACn (A = Si, Ge, Sn, n = 1–3) thin films
  Journal of Materials Research, 2007, 22(8), 2279-2287.
 Web of Science® Times Cited: 16

Jens Emmerlich, Denis Music, Per Eklund, Ola Wilhelmsson, Ulf Jansson, Jochen M. Schneider, Hans Högberg and Lars Hultman
  Thermal stability of Ti3SiC2 thin films
  Acta Materialia, 2007, 55(4), 1479-1488.
 Web of Science® Times Cited: 81

O. Wilhelmsson, J.-P. Palmquist, E. Lewin, Jens Emmerlich, Per Eklund, Per Persson, Hans Högberg, S. Li, R. Ahuja, O. Eriksson, Lars Hultman and U. Jansson
  Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering
  Journal of Crystal Growth, 2006, 291(1), 290-300.
 Web of Science® Times Cited: 87

M. Rester, Jörg Neidhardt, Per Eklund, Jens Emmerlich, H. Ljungcrantz, Lars Hultman and C. Mitterer
  Annealing studies of nanocomposite Ti-Si-C thin films with respect to phase stability and tribological performance
  Materials Science & Engineering: A, 2006, 429( 1-2), 90-95.
 Web of Science® Times Cited: 22

Henry Riascos, Jörg Neidhardt, G. Z. Radnoczi, Jens Emmerlich, G. Zambrano, Lars Hultman and P. Prieto
  Structure and properties of pulsed-laser deposited carbon nitride thin films
  Thin Solid Films, 2006, 497(1-2), 1-6.
 Web of Science® Times Cited: 21

Martin Magnuson, M. Mattesini, Ola Wilhelmsson, Jens Emmerlich, Jens-Petter Palmquist, Sa Li, Rajeev Ahuja, Lars Hultman, Olle Eriksson and Ulf Jansson
  Electronic structure and chemical bonding in Ti4SiC3 investigated by soft x-ray emission spectroscopy and first-principles theory
  Physical Review B. Condensed Matter and Materials Physics, 2006, 74(20), .
   Fulltext  PDF  
 Web of Science® Times Cited: 21

Jones Alami, Per Eklund, Jens Emmerlich, O. Wilhelmsson, U. Jansson, Hans Högberg, Lars Hultman and Ulf Helmersson
  High-power impulse magnetron sputtering of Ti-Si-C thin films from a Ti3SiC2 compound target
  Thin Solid Films, 2006, 515(4), 1731-1736.
   Fulltext  PDF  
 Web of Science® Times Cited: 51

Per Eklund, Chariya Virojanadara, Jens Emmerlich, Leif Johansson, Hans Högberg and Lars Hultman
  Photoemission studies of Ti3SiC2 and nanocrystalline-TiC/amorphous-SiC nanocomposite thin films
  Physical Review B. Condensed Matter and Materials Physics, 2006, 74(4), 045417.
 Web of Science® Times Cited: 30

Hans Högberg, Per Eklund, Jens Emmerlich, Jens Birch and Lars Hultman
  Epitaxial Ti2GeC, Ti3GeC2, and Ti4GeC3 MAX-phase thin films grown by magnetron sputtering
  Journal of Materials Research, 2005, 20(4), 779-782.
 Web of Science® Times Cited: 76

Hans Högberg, Lars Hultman, Jens Emmerlich, Torbjörn Joelsson, Per Eklund, Jon M. Molina-Aldareguia, Jens-Petter Palmquist, Ola Wilhelmsson and Ulf Jansson
  Growth and characterization of MAX-phase thin films
  Surface & Coatings Technology, 2005, 193(1-3), 6-10.
 Web of Science® Times Cited: 87

Martin Magnuson, Jens-Petter Palmquist, M. Mattesini, Sa Li, Rajeev Ahuja, Olle Eriksson, Jens Emmerlich, Ola Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and Ulf Jansson
  Electronic structure investigation of Ti3AlC2 , Ti3SiC2 , and Ti3GeC2 by soft x-ray emission spectroscopy
  Physical Review B. Condensed Matter and Materials Physics, 2005, 72(24), .
   Fulltext  PDF  
 Web of Science® Times Cited: 28

Per Eklund, Jens Emmerlich, Hans Högberg, Ola Wilhelmsson, Peter Isberg, Jens Birch, Per O. Å. Persson, Ulf Jansson and Lars Hultman
  Structural, electrical, and mechanical properties of nc-TiC/a-SiC nanocomposite thin films
  Journal of Vacuum Science & Technology B, 2005, 23(6), 2486-2495.
 Web of Science® Times Cited: 44

Per Eklund, JP Palmquist, O Wilhelmsson, U Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
  Comment on "Pulsed laser deposition and properties of M(n+1)AX(x) phase formulated Ti3SiC2 thin films''
  Tribology letters, 2004, 17(4), 977-978.
 Web of Science® Times Cited: 6

Jens Emmerlich, Hans Högberg, Szilvia Sasvári, Per Persson, Lars Hultman, Jens-Petter Palmquist, Ulf Jansson, Jon M. Molina-Aldareguia and Zsolt Czigány
  Growth of Ti3SiC2 thin films by elemental target magnetron sputtering
  Journal of Applied Physics, 2004, 96(9), 4817-4826.
 Web of Science® Times Cited: 103

Jens-Petter Palmquist, Sa Li, Per Persson, Jens Emmerlich, Ola Wilhelmsson, Hans Högberg, M. I. Katsnelson, Börje Johansson, Rajeev Ahuja, Olle Eriksson, Lars Hultman and Ulf Jansson
  Mn+1AXn phases in the Ti-Si-C system studied by thin-film synthesis and ab initio calculations
  Physical Review B. Condensed Matter and Materials Physics, 2004, 70(16), 165401.
 Web of Science® Times Cited: 122

Per Eklund, Jens-Petter Palmquist, Ola Wilhelmsson, Ulf Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
  Comment on "Pulsed laser deposition and properties of Mn+1AXx phase formulated Ti3SiC2 thin films"
  Tribology letters, 2004, 17(4), 977-978.
 Web of Science® Times Cited: 6

J.M. Molina-Aldareguia, Jens Emmerlich, J.-P. Palmquist, U. Jansson and Lars Hultman
  Kink formation around indents in laminated Ti3SiC2 thin films studied in the nanoscale
  Scripta Materialia, 2003, 49(2), 155-160.
 Web of Science® Times Cited: 61

Conference Articles

Hans Högberg, Jens Emmerlich, Per Eklund, Ola Wilhelmsson, Jens-Petter Palmquist, Ulf Jansson and Lars Hultman
  Growth and characterization of epitaxial MAX-phase thin films from the Tin+1(Si,Ge,Sn)Cn systems
  11th International Ceramics Congress, CIMTEC,2006, 2006.


Per Eklund, Jens Emmerlich, Hans Högberg, Lars Hultman, Ola Wilhelmsson, Ulf Jansson and Peter Isberg
  Synthesis and characterization of Ti-Si-C compounds for electrical contact applications
  IEEE Holm Conference on Electrical Contacts,2005, 2005.


 Web of Science® Times Cited: 6

Ph.D. Theses

Jens Emmerlich
  MAX phase thin films: unique multifunctional ceramics with the elements Ti, Si, Ge, Sn, and C
  2006.