Publications for Ian Don Booker
Co-author map based on ISI articles 2007-

Publications mentioned in social media 1 times*

Keywords

z(1/2) thick temperature substrates roughness reactor n-type morphology lifetimes lifetime homoepitaxial excellent epitaxial epilayers defect cvd carrier c/si 4h-sic 100

Journal Articles

Ian Don Booker, Jawad Ul Hassan, Louise Lilja, Franziska Beyer, Robin Karhu, J. Peder Bergman, Örjan Danielsson, Olof Kordina, Einar Sveinbjörnsson and Erik Janzén
  Carrier Lifetime Controlling Defects Z(1/2) and RB1 in Standard and Chlorinated Chemistry Grown 4H-SiC
 
Altmetric usage: 1

  Crystal Growth & Design, 2014, 14(8), 4104-4110.
   Fulltext  PDF  

Louise Lilja, Ian Don Booker, Jawad ul-Hassan, Erik Janzén and Peder Bergman
  The influence of growth conditions on carrier lifetime in 4H-SiC epilayers
  Journal of Crystal Growth, 2013, 381, 43-50.

Milan Yazdanfar, Pontus Stenberg, Ian Don Booker, Ivan Gueorguiev Ivanov, Olle Kordina, Henrik Pedersen and Erik Janzén
  Process stability and morphology optimization of very thick 4H-SiC epitaxial layers grown by chloride-based CVD
  Journal of Crystal Growth, 2013, 380, 55-60.
 Web of Science® Times Cited: 2

Martin Fagerlind, Ian Don Booker, Peder Bergman, Erik Janzén, Herbert Zirath and Niklas Rorsman
  Influence of Large-Aspect-Ratio Surface Roughness on Electrical Characteristics of AlGaN/AlN/GaN HFETs
  IEEE transactions on device and materials reliability, 2012, 12(3), 538-546.
 Web of Science® Times Cited: 1

Conference Articles

B. Kallinger, M. Rommel, Louise Lilja, Jawad ul-Hassan, Ian Don Booker, Erik Janzén and Peder Bergman
  Comparison of carrier lifetime measurements and mapping in 4H SIC using time resolved photoluminescence and μ-PCD
  SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014.


Ian Don Booker, Hana Abdalla, L. Lilja, Jawad ul-Hassan, Peder Bergman, Einar Sveinbjörnsson and Erik Janzén
  Oxidation induced ON1, ON2a/b defects in 4H-SiC characterized by DLTS
  SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014.


Milan Yazdanfar, Pontus Stenberg, Ian Don Booker, Ivan Gueorguiev Ivanov, Henrik Pedersen, Olle Kordina and Erik Janzén
  Morphology optimization of very thick 4H-SiC epitaxial layers
  SILICON CARBIDE AND RELATED MATERIALS 2012, 2013.


Jawad ul Hassan, Ian Booker, Louise Lilja, Anders Hallén, Martin Fagerlind, Peder Bergman and Erik Janzén
  On-axis homoepitaxial growth of 4H-SiC PiN structure for high power applications
  Materials Science Forum (Volumes 740 - 742), 2013.


Louise Lilja, Jawad ul-Hassan, Ian Booker, Peder Bergman and Erik Janzén
  Influence of Growth Temperature on Carrier Lifetime in 4H-SiC Epilayers
  9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), 2-6 September 2012, St Petersburg, Russia, 2013.


 Web of Science® Times Cited: 1  Fulltext PDF

Louise Lilja, Jawad ul-Hassan, Ian D. Booker, Peder Bergman and Erik Janzén
  The Effect of Growth Conditions on Carrier Lifetime in n-type 4H-SiC Epitaxial Layers
  Materials Science Forum Vol 717 - 720, 2012.


 Web of Science® Times Cited: 3

Jawad Hassan, Louise Lilja, Ian Don Booker, Peder Bergman and Erik Janzén
  Influence of Growth Mechanism on Carrier Lifetime in on-axis Homoepitaxial Layers of 4H-SiC
  Materials Science Forum Vols 717 - 720, 2012.


 Web of Science® Times Cited: 1

Ian Don Booker, Jawad Hassan, Anders Hallén,, Einar Ö. Sveinbjörnsson, Olle Kordina and Peder Bergman
  Comparison of Post-Growth Carrier Lifetime Improvement Methods for 4H-SiC Epilayers
  Materials Science Forum Vols 717 - 720, 2012.


 Web of Science® Times Cited: 1

Peder Bergman, Ian Don Booker, Louise Lilja, Jawad Hassan and Erik Janzén
  Radial Variation of Measured Carrier Lifetimes in Epitaxial Layers Grown with Wafer Rotation
  Materials Science Forum Vols 717 - 720, 2012.


Ian Don Booker, Jawad Hassan, Erik Janzén and Peder Bergman
  High-Resolution Time-Resolved Carrier Lifetime and Photoluminescence Mapping of 4H-SiC Epilayers
  Materials Science Forum Vols 717 - 720, 2012.


* Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.