Publications for Hans Högberg
Co-author map based on ISI articles 2007-

Publications mentioned in social media 10 times*

Keywords

°c x-ray tisub> ti temperatures temperature substrates sputtering phases oxygen oxide nitride max magnetron film epitaxial electrical diffraction deposited coatings

Journal Articles

Hans Högberg, Lina Tengdelius, Mattias Samuelsson, Jens Jensen and Lars Hultman
  beta-Ta and alpha-Cr thin films deposited by high power impulse magnetron sputtering and direct current magnetron sputtering in hydrogen containing plasmas
  Physica. B, Condensed matter, 2014, 439, 3-8.
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 Web of Science® Times Cited: 1

M. Chubarov, Henrik Pedersen, Hans Högberg, Stanislav Filippov, J.A. A. Engelbrecht, J. O'Connel and Anne Henry
  Boron nitride: A new photonic material
  Physica. B, Condensed matter, 2014, 439, 29-34.
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Lina Tengdelius, Jens Birch, Jun Lu, Lars Hultman, Urban Forsberg, Erik Janzén and Hans Högberg
  Magnetron sputtering of epitaxial ZrB2 thin films on 4H-SiC(0001) and Si(111)
  Physica Status Solidi (a), 2014, 211(3), 636-640.

Lina Tengdelius, Mattias Samuelsson, Jens Jensen, Jun Lu, Lars Hultman, Urban Forsberg, Erik Janzén and Hans Högberg
  Direct current magnetron sputtered ZrB2 thin films on 4H-SiC(0001) and Si(100)
  Thin Solid Films, 2014, 550, 285-290.

Hans Högberg, Lina Tengdelius, Mattias Samuelsson, Fredrik Eriksson, Esteban Broitman, Jun Lu, Jens Jensen and Lars Hultman
  Reactive sputtering of delta-ZrH2 thin films by high power impulse magnetron sputtering and direct current magnetron sputtering
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2014, 32(4), 041510.

M. Chubarov, Henrik Pedersen, Hans Högberg, Zs. Czigany and Anne Henry
  Chemical vapour deposition of epitaxial rhombohedral BN thin films on SiC substrates
 
Altmetric usage: 6

  CrysteEngComm, 2014, 16(24), 5430-5436.
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Mikhail Chubarov, Henrik Pedersen, Hans Högberg and Anne Henry
  On the effect of silicon in CVD of sp2 hybridized boron nitride thin films
 
Altmetric usage: 4

  CrysteEngComm, 2013, 15(3), 455-458.
 Web of Science® Times Cited: 5

Andrej Furlan, Gueorgui Kostov Gueorguiev, Zsolt Czigány, Vanya Darakchieva, Slawomir Braun, Rosario Correia, Hans Högberg and Lars Hultman
  Structure and properties of phosphorus-carbide thin solid films
  Thin Solid Films, 2013, 548(2), 247-254.

Esteban Broitman, Andrej Furlan, G. K. Geuorguiev, Zsolt Czigany, Hans Högberg and Lars Hultman
  Structural and Mechanical Properties of CNx and CPx Thin Solid Films
  Key Engineering Materials, 2012, 488-489, 581-584.
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 Web of Science® Times Cited: 1

Henrik Pedersen, Mikhail Chubarov, Hans Högberg, Jens Jensen and Anne Henry
  On the effect of water and oxygen in chemical vapor deposition of boron nitride
  Thin Solid Films, 2012, 520(18), 5889-5893.
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 Web of Science® Times Cited: 2

Mattias Samuelsson, Jens Jensen, Ulf Helmersson, Lars Hultman and Hans Högberg
  ZrB2 thin films grown by high power impulse magnetron sputtering (HiPIMS) from a compound target
  Thin Solid Films, 2012, 526, 163-167.
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 Web of Science® Times Cited: 4

Mikhail Chubarov, Henrik Pedersen, Hans Högberg, Jens Jensen and Anne Henry
  Growth of High Quality Epitaxial Rhombohedral Boron Nitride
  Crystal Growth & Design, 2012, 12(6), 3215-3220.
 Web of Science® Times Cited: 5

Mattias Samuelsson, Kostas Sarakinos, Hans Högberg, Erik Lewin, Ulf Jansson, Bengt Wälivaara, Henrik Ljungcrantz and Ulf Helmersson
  Growth of TiC/a-C:H nanocomposite films by reactive high power impulse magnetron sputtering under industrial conditions
  Surface & Coatings Technology, 2012, 206(8-9), 2396-2402.
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 Web of Science® Times Cited: 7

Niklas Gunnarsson Sarius, Jonas Lauridsen, E. Lewin, U. Jansson, Hans Högberg, Å. Öberg, P. Leisner, Per Eklund and Lars Hultman
  Contact resistance of Ti-Si-C-Ag and Ti-Si-C-Ag-Pd nanocomposite coatings
  Journal of Electronic Materials, 2012, 41(3), 560-567.
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Niklas Gunnarsson Sarius, Jonas Lauridsen, E. Lewin, Jun Lu, Hans Högberg, Å. Öberg, H. Ljungcrantz, P. Leisner, Per Eklund and Lars Hultman
  Ni and Ti diffusion barrier layers between Ti-Si-C-Ag nanocomposite coatings and Cu-based substrates
  Surface & Coatings Technology, 2012, 206(8-9), 2558-2565.
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Mihails Cubarovs, Henrik Pedersen, Hans Högberg, Vanya Darakchieva, Jensen Jens, Per Persson and Anne Henry
  CVD growth of sp2-hybridized boron nitride using aluminum nitride as buffer layer
  Physica Status Solidi. Rapid Research Letters, 2011, 5(10-11), 397-399.
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 Web of Science® Times Cited: 7

Jonas Lauridsen, Per Eklund, T. Joelsson, H. Ljungcrantz, Å. Öberg, E. Lewin, U. Jansson, Manfred Beckers, Hans Högberg and Lars Hultman
  High-rate deposition of amorphous and nanocomposite Ti-Si-C multifunctional coatings
  Surface & Coatings Technology, 2010, 205(2), 299-305.
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 Web of Science® Times Cited: 16

A. Oberg, A. Kassman, B. Andre, U. Wiklund, M. Lindquist, E. Lewin, U. Jansson, Hans Högberg, T. Joelsson and H. Ljungcrantz
  Conductive nanocomposite ceramics as tribological and electrical contact materials
  European Physical Journal: Applied physics, 2010, 49(2), .
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 Web of Science® Times Cited: 7

Marie Sonestedt, Jenny Frodelius, Jens-Petter Palmquist, Hans Högberg, Lars Hultman and Krystyna Stiller
  Microstructure of high velocity oxy-fuel sprayed Ti2AlC coatings
  Journal of Materials Science, 2010, 45(10), 2760-2769.
 Web of Science® Times Cited: 8

Per Eklund, Manfred Beckers, Ulf Jansson, Hans Högberg and Lars Hultman
  The M(n+1)AX(n) phases: Materials science and thin-film processing
  Thin Solid Films, 2010, 518(8), 1851-1878.
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 Web of Science® Times Cited: 194

Jenny Frodelius, Per Eklund, Manfred Beckers, Per Persson, Hans Högberg and Lars Hultman
  Sputter deposition from a Ti2AlC target: Process characterization and conditions for growth of Ti2AlC
  Thin Solid Films, 2010, 518(6), 1621-1626.
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 Web of Science® Times Cited: 24

Isabel Van De Keere, Sofia Svedhem, Hans Högberg, Jean Vereecken, Bengt Kasemo and Annick Hubin
  In Situ Control of the Oxide Layer on Thermally Evaporated Titanium and Lysozyme Adsorption by Means of Electrochemical Quartz with Dissipation
  ACS APPLIED MATERIALS and INTERFACES, 2009, 1(2), 301-310.
 Web of Science® Times Cited: 4

Galia Pozina, David H. Trinh, Hans Högberg, M. Collin, I. Reineck and Lars Hultman
  Phase identification in γ- and κ-alumina coatings by cathodoluminescence
  Scripta Materialia, 2009, 61(4), 379-382.
 Web of Science® Times Cited: 2

David Trinh, K Back, Galia Pozina, H Blomqvist, T Selinder, M Collin, I Reineck, Lars Hultman and Hans Högberg
  Phase transformation in kappa- and gamma-Al2O3 coatings on cutting tool inserts
  Surface & Coatings Technology, 2009, 203(12), 1682-1688.
 Web of Science® Times Cited: 18

T.H. Scabarozi, Per Eklund, Jens Emmerlich, Hans Högberg, T. Meehan, P. Finkel, M.W. Barsoum, J.D. Hettinger, Lars Hultman and S.E. Lofland
  Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC
  Solid State Communications, 2008, 146(11-12), 498-501.
 Web of Science® Times Cited: 18

O. Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and U. Jansson
  Structural, electrical and mechanical characterization of magnetron-sputtered V-Ge-C thin films
  Acta Materialia, 2008, 56(11), 2563-2569.
 Web of Science® Times Cited: 30

Jens Emmerlich, Gert Gassner, Per Eklund, Hans Högberg and Lars Hultman
  Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films
  Wear, 2008, 264(11-12), 914-919.
 Web of Science® Times Cited: 17

T. Kubart, David Huy Trinh, L. Liljeholm, Lars Hultman, Hans Högberg, T. Nyberg and S. Berg
  Experiments and Modelling of Dual Reactive Magnetron Sputtering Using Two Reactive Gases
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2008, 26(4), 565-570.
 Web of Science® Times Cited: 5

David Huy Trinh, T. Kubart, T. Nyberg, M. Ottosson, Lars Hultman and Hans Högberg
  DC Magnetron Sputtering Deposition of Nanocomposite Alumina - Zirconia Thin Films
  Thin Solid Films, 2008, 516(23), 8352-8358.
 Web of Science® Times Cited: 8

David Huy Trinh, M. Ottosson, M. Collin, I. Reineck, Lars Hultman and Hans Högberg
  Nanocomposite Al2O3-ZrO2 thin films grown by reactive dual radio-frequency magnetron sputtering
  Thin Solid Films, 2008, 516(15), 4977-4982.
 Web of Science® Times Cited: 11

Martin Magnuson, Ola Wilhelmsson, Maurizio Mattesini, Sa Li, Rajeev Ahuja, Olle Eriksson, Hans Högberg, Lars Hultman and Ulf Jansson
  Anisotropy in the electronic structure of V2GeC investigated by soft x-ray emission spectroscopy and first-principles theory
  Physical Review B. Condensed Matter and Materials Physics, 2008, 78(035117), .
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 Web of Science® Times Cited: 10

Andrej Furlan, Gueorgui Kostov Gueorguiev, Zsolt Czigány, Hans Högberg, Slawomir Braun, Sven Stafström and Lars Hultman
  Synthesis of phosphorus-carbide thin films by magnetron sputtering
  physica status solidi (RRL) - Rapid Research Letters, 2008, 2(4), 191-193.
 Web of Science® Times Cited: 19

Jenny Frodelius, Marie Sonestedt, Stefan Björklund, Jens-Petter Palmquist, Krystyna Stiller, Hans Högberg and Lars Hultman
  Ti2AlC coatings deposited by High Velocity Oxy-Fuel spraying
  Surface and Coatings Technology, 2008, 202(24), 5976-5981.
 Web of Science® Times Cited: 25

Per Eklund, Jens-Petter Palmquist, Jonas Höwing, David Trinh, Tamer El-Raghy, Hans Högberg and Lars Hultman
  Ta4AlC3: Phase determination, polymorphism and deformation
  Acta Materialia, 2007, 55(14), 4723-4729.
 Web of Science® Times Cited: 46

Per Eklund, Anand Murugaiah, Jens Emmerlich, Zsolt Czigany, Jenny Frodelius, Michel W. Barsoum, Hans Högberg and Lars Hultman
  Homoepitaxial growth of Ti-Si-C MAX-phase thin films on bulk Ti3SiC2 substrates
  Journal of Crystal Growth, 2007, 304(1), 264-269.
 Web of Science® Times Cited: 22

Per Eklund, Manfred Beckers, Jenny Frodelius, Hans Högberg and Lars Hultman
  Magnetron sputtering of Ti3SiC2 thin films from a Ti3SiC2 compound target
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2007, 25(5), 1381-1388.
 Web of Science® Times Cited: 27

Per Eklund, Torbjörn Joelsson, Henrik Ljungcrantz, Ola Wilhelmsson, Zsolt Czigany, Hans Högberg and Lars Hultman
  Microstructure and electrical properties of Ti-Si-C-Ag nanocomposite thin films
  Surface and Coatings Technology, 2007, 201(14), 6465-6469.
 Web of Science® Times Cited: 13

Jens Emmerlich, Per Eklund, Dirk Rittrich, Hans Högberg and Lars Hultman
  Electrical resistivity of Tin+1ACn (A = Si, Ge, Sn, n = 1–3) thin films
  Journal of Materials Research, 2007, 22(8), 2279-2287.
 Web of Science® Times Cited: 16

Jens Emmerlich, Denis Music, Per Eklund, Ola Wilhelmsson, Ulf Jansson, Jochen M. Schneider, Hans Högberg and Lars Hultman
  Thermal stability of Ti3SiC2 thin films
  Acta Materialia, 2007, 55(4), 1479-1488.
 Web of Science® Times Cited: 77

Per Eklund, Hans Högberg and Lars Hultman
  Epitaxial TiC/SiC multilayers
  Physica status solidi (RRL): rapid research letters, 2007, 1(3), 113-115.
 Web of Science® Times Cited: 9

Ola Wilhelmsson, Per Eklund, Finn Giuliani, Hans Högberg, Lars Hultman and Ulf Jansson
  Intrusion-type deformation in epitaxial Ti3SiC2/TiCx nanolaminates
  Applied Physics Letters, 2007, 91(12), 123124.
 Web of Science® Times Cited: 8

O. Wilhelmsson, J.-P. Palmquist, E. Lewin, Jens Emmerlich, Per Eklund, Per Persson, Hans Högberg, S. Li, R. Ahuja, O. Eriksson, Lars Hultman and U. Jansson
  Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering
  Journal of Crystal Growth, 2006, 291(1), 290-300.
 Web of Science® Times Cited: 84

Jones Alami, Per Eklund, Jens Emmerlich, O. Wilhelmsson, U. Jansson, Hans Högberg, Lars Hultman and Ulf Helmersson
  High-power impulse magnetron sputtering of Ti-Si-C thin films from a Ti3SiC2 compound target
  Thin Solid Films, 2006, 515(4), 1731-1736.
   Fulltext  PDF  
 Web of Science® Times Cited: 51

David Huy Trinh, Hans Högberg, Jon M. Andersson, M. Collin, I. Reineck, Ulf Helmersson and Lars Hultman
  Radio frequency dual magnetron sputtering deposition and characterization of nanocomposite Al2O3-ZrO2 thin films
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2006, 24(2), 309-316.
 Web of Science® Times Cited: 14

Andrej Furlan, Gueorgui Kostov Gueorguiev, Hans Högberg, Sven Stafström and Lars Hultman
  Fullerene–like CPx: A first–principles study of the relative stability of precursors and defect energetics during synthetic growth
  Thin Solid Films, 2006, 515(3), 1028-1032.
 Web of Science® Times Cited: 13

Gueorgui Kostov Gueorguiev, Andrej Furlan, Hans Högberg, Sven Stafström and Lars Hultman
  First–principles calculations on the structural evolution of solid fullerene–like CPx
  Chemical Physics Letters, 2006, 426(4-6), 374-379.
 Web of Science® Times Cited: 22

Per Eklund, Chariya Virojanadara, Jens Emmerlich, Leif Johansson, Hans Högberg and Lars Hultman
  Photoemission studies of Ti3SiC2 and nanocrystalline-TiC/amorphous-SiC nanocomposite thin films
  Physical Review B. Condensed Matter and Materials Physics, 2006, 74(4), 045417.
 Web of Science® Times Cited: 30

Hans Högberg, Per Eklund, Jens Emmerlich, Jens Birch and Lars Hultman
  Epitaxial Ti2GeC, Ti3GeC2, and Ti4GeC3 MAX-phase thin films grown by magnetron sputtering
  Journal of Materials Research, 2005, 20(4), 779-782.
 Web of Science® Times Cited: 75

Jörg Neidhardt, Hans Högberg and Lars Hultman
  Cryogenic deposition of carbon nitride thin solid films by reactive magnetron sputtering, Suppression of the chemical desorption processes
  Thin Solid Films, 2005, 478(1-2), 34-41.
 Web of Science® Times Cited: 11

Hans Högberg, Lars Hultman, Jens Emmerlich, Torbjörn Joelsson, Per Eklund, Jon M. Molina-Aldareguia, Jens-Petter Palmquist, Ola Wilhelmsson and Ulf Jansson
  Growth and characterization of MAX-phase thin films
  Surface & Coatings Technology, 2005, 193(1-3), 6-10.
 Web of Science® Times Cited: 86

Martin Magnuson, Jens-Petter Palmquist, M. Mattesini, Sa Li, Rajeev Ahuja, Olle Eriksson, Jens Emmerlich, Ola Wilhelmsson, Per Eklund, Hans Högberg, Lars Hultman and Ulf Jansson
  Electronic structure investigation of Ti3AlC2 , Ti3SiC2 , and Ti3GeC2 by soft x-ray emission spectroscopy
  Physical Review B. Condensed Matter and Materials Physics, 2005, 72(24), .
   Fulltext  PDF  
 Web of Science® Times Cited: 28

Per Eklund, Jens Emmerlich, Hans Högberg, Ola Wilhelmsson, Peter Isberg, Jens Birch, Per O. Å. Persson, Ulf Jansson and Lars Hultman
  Structural, electrical, and mechanical properties of nc-TiC/a-SiC nanocomposite thin films
  Journal of Vacuum Science & Technology B, 2005, 23(6), 2486-2495.
 Web of Science® Times Cited: 44

Per Eklund, JP Palmquist, O Wilhelmsson, U Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
  Comment on "Pulsed laser deposition and properties of M(n+1)AX(x) phase formulated Ti3SiC2 thin films''
  Tribology letters, 2004, 17(4), 977-978.
 Web of Science® Times Cited: 6

Jörg Neidhardt, Hans Högberg and Lars Hultman
  Arrhenius-type temperature dependence of the chemical desorption processes active during deposition of fullerene-like carbon nitride thin films
  Surface Science, 2004, 569( 1-3), .
 Web of Science® Times Cited: 3

Jens Emmerlich, Hans Högberg, Szilvia Sasvári, Per Persson, Lars Hultman, Jens-Petter Palmquist, Ulf Jansson, Jon M. Molina-Aldareguia and Zsolt Czigány
  Growth of Ti3SiC2 thin films by elemental target magnetron sputtering
  Journal of Applied Physics, 2004, 96(9), 4817-4826.
 Web of Science® Times Cited: 103

Jens-Petter Palmquist, Sa Li, Per Persson, Jens Emmerlich, Ola Wilhelmsson, Hans Högberg, M. I. Katsnelson, Börje Johansson, Rajeev Ahuja, Olle Eriksson, Lars Hultman and Ulf Jansson
  Mn+1AXn phases in the Ti-Si-C system studied by thin-film synthesis and ab initio calculations
  Physical Review B. Condensed Matter and Materials Physics, 2004, 70(16), 165401.
 Web of Science® Times Cited: 120

Per Eklund, Jens-Petter Palmquist, Ola Wilhelmsson, Ulf Jansson, Jens Emmerlich, Hans Högberg and Lars Hultman
  Comment on "Pulsed laser deposition and properties of Mn+1AXx phase formulated Ti3SiC2 thin films"
  Tribology letters, 2004, 17(4), 977-978.
 Web of Science® Times Cited: 6

H.W. Hugosson, Hans Högberg, M. Algren, M. Rodmar and T.I. Selinder
  Theory of the effects of substitutions on the phase stabilities of Ti1-xAlxN
  Journal of Applied Physics, 2003, 93(8), 4505-4511.
 Web of Science® Times Cited: 49

L. Landstrlom, Zs. Marton, N. Arnold, Hans Högberg, M. Boman and P. Heszler
  In situ monitoring of size distributions and characterization of nanoparticles during W ablation in N2 atmosphere
  Journal of Applied Physics, 2003, 94(3), 2011-2017.
 Web of Science® Times Cited: 10

J. Sundqvist, H. Hogberg and A. Harsta
  Atomic layer deposition of Ta2O5 using the TaI 5 and O2 precursor combination
  Chemical Vapor Deposition, 2003, 9(5), 245-248.
 Web of Science® Times Cited: 13

Hans Högberg, Jens Birch, MP Johansson, Lars Hultman and U Jansson
  Deposition of epitaxial transition metal carbide films and superlattices by simultaneous direct current metal magnetron sputtering and C-60 evaporation
  Journal of Materials Research, 2001, 16(3), 633-643.
 Web of Science® Times Cited: 11

Conference Articles

M. Chubarov, Henrik Pedersen, Hans Högberg, Stanislav Filippov, J.A. A. Engelbrecht, J. O'Connel and Anne Henry
  Characterization of Boron Nitride Thin Films
  2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR), 2013.


Hans Högberg, Jens Emmerlich, Per Eklund, Ola Wilhelmsson, Jens-Petter Palmquist, Ulf Jansson and Lars Hultman
  Growth and characterization of epitaxial MAX-phase thin films from the Tin+1(Si,Ge,Sn)Cn systems
  11th International Ceramics Congress, CIMTEC,2006, 2006.


Per Eklund, Jens Emmerlich, Hans Högberg, Lars Hultman, Ola Wilhelmsson, Ulf Jansson and Peter Isberg
  Synthesis and characterization of Ti-Si-C compounds for electrical contact applications
  IEEE Holm Conference on Electrical Contacts,2005, 2005.


 Web of Science® Times Cited: 6

Ph.D. Theses

Mattias Samuelsson
  Fundamental aspects of HiPIMS under industrial conditions
  2012.


  Fulltext PDF

Jonas Lauridsen
  TiC-based nanocomposite coatings as electrical contacts
  2011.


  Fulltext PDF

Jenny Frodelius
  Thick and Thin Ti2AlC Coatings
  2010.


  Fulltext PDF

David Huy Trinh
  Nanocrystalline Alumina-Zirconia Thin Films Grown by Magnetron Sputtering
  2008.


  Fulltext PDF

Per Eklund
  Multifunctional nanostructured Ti-Si-C thin films
  2007.


  Fulltext PDF

Licentiate Theses

Lina Tengdelius
  Growth and Characterization of ZrB2 Thin Films
  2013.


  Fulltext PDF

David Huy Trinh
  Synthesis and Characterisation of Magnetron Sputtered Alumina-Zirconia Thin Films
  2006.


  Fulltext PDF

* Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.