Publications for Hans Arwin
Co-author map based on ISI articles 2007-

Publications mentioned in social media 9 times*

Keywords

thickness spectroscopic spectral spectra scarab reflection reflected polarized polarization optical mueller-matrix model incidence film em> ellipsometry dielectric beetles beetle angle

Journal Articles

Iryna Valyukh, Z. Jiao, Hans Arwin and X. W. Sun
  Optical Properties of Hydrated Tungsten Trioxide 3WO3ˑH2O
  Thin Solid Films, 2014, , .
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Roger Magnusson, Ching-Lien Hsiao, Jens Birch, Hans Arwin and Kenneth Järrendahl
  Chiral nanostructures producing near circular polarization
 
Altmetric usage: 2

  Optical Materials Express, 2014, 4(7), 1389-1403.
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Roger Magnusson, Jens Birch, Per Sandström, Ching-Lien Hsiao, Hans Arwin and Kenneth Järrendahl
  Optical Mueller Matrix Modeling of Chiral AlxIn1-xN Nanospirals
  Thin Solid Films, 2014, , .
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Hans Arwin, Lia Fernández del Río and Kenneth Järrendahl
  Comparison and analysis of Mueller-matrix spectra from exoskeletons of blue, green and red Cetonia aurata
  Thin Solid Films, 2014, 571, 739-743.
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Eloy Muñoz-Pineda, Kenneth Järrendahl, Hans Arwin and Arturo Mendoza-Galván
  Symmetries and relationships between elements of the Mueller matrix spectra of the cuticle of the beetle Cotinis mutabilis
  Thin Solid Films, 2014, 571, 660-665.
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Arturo Mendoza-Galván, Eloy Muñoz-Pineda, Kenneth Järrendahl and Hans Arwin
  Evidence for a dispersion relation of optical modes in the cuticle of the scarab beetle Cotinis mutabilis
 
Altmetric usage: 2

  Optical Materials Express, 2014, 4(12), 2484-2496.

Lia Fernández del Río, Hans Arwin and Kenneth Järrendahl
  Polarizing properties and structural characteristics of the cuticle of the scarab Beetle Chrysina gloriosa
  Thin Solid Films, 2013, , .
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Eloy Muñoz-Pineda, Kenneth Järrendahl, Hans Arwin and Arturo Mendoza-Galván
  Symmetries and relationships between elements of the Mueller matrix spectra of the cuticle of the beetle Cotinis mutabilis
  Thin Solid Films, 2013, , .
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Pia Lansåker, Enis Tuncer, Iryna Valyukh, Hans Arwin, Gunnar Niklasson and Claes Göran Granqvist
  Spectral  density analysis of thin gold films: Thickness and structure dependence of the optical properties
  Proceedings, 2013, , 443-447.
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Hans Arwin, Torun Berlind, Blaine Johs and Kenneth Järrendahl
  Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data
 
Altmetric usage: 4

  Optics Express, 2013, 21(19), 22645-22656.
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Rebecca Hollertz, Hans Arwin, Bertrand Faure, Yujia Zhang, Lennart Bergstrom and Lars Wagberg
  Dielectric properties of lignin and glucomannan as determined by spectroscopic ellipsometry and Lifshitz estimates of non-retarded Hamaker constants
  Cellulose (London), 2013, 20(4), 1639-1648.
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V Karpus, S Tumenas, A Suchodolskis, Hans Arwin and W Assmus
  Optical spectroscopy and electronic structure of the face-centered icosahedral quasicrystals Zn-Mg-R (R=Y, Ho, Er)
  Physical Review B. Condensed Matter and Materials Physics, 2013, 88(9), .
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Jonas Bergqvist, Scott Mauger, Kristofer Tvingstedt, Hans Arwin and Olle Inganäs
  In situ reflectance imaging of organic thin film formation from solution deposition
  Solar Energy Materials and Solar Cells, 2013, 114, 89-98.
 Web of Science® Times Cited: 2

Malin B. Johansson, Gustavo Baldissera, Iryna Valyukh, Clas Persson, Hans Arwin, Gunnar A. Niklasson and Lars Osterlund
  Electronic and optical properties of nanocrystalline WO3 thin films studied by optical spectroscopy and density functional calculations
  Journal of Physics: Condensed Matter, 2013, 25(20), 205502.
 Web of Science® Times Cited: 6

Robert Rehammar, Farzan Alavian Ghavanini, Roger Magnusson, Jari Kinaret, Peter Enoksson, Hans Arwin and Eleanor Campbell
  Electromechanically Tunable Carbon Nanofiber Photonic Crystal
  Nano letters (Print), 2013, 13(2), 397-401.
 Web of Science® Times Cited: 2

Arturo Mendoza-Galván, Kenneth Järrendahl, Alexander Dmitriev, T. Pakizeh, Mikael Käll and Hans Arwin
  Fano interference in supported gold nanosandwiches with weakly coupled nanodisks
  Optics Express, 2012, 20(28), 29646-29658.
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 Web of Science® Times Cited: 1

Hjalmar Granberg,, Ludovic Coppel,, Mohamed Eita, Eduardo de Mayolo, Hans Arwin and Lars Wågberg
  Dynamics of moisture interaction with polyelectrolyte multilayers containing nanofibrillated cellulose
  Nordic Pulp & Paper Research Journal, 2012, 27(2), 496-499.
 Web of Science® Times Cited: 2

Saulius Tumėnas, Vytautas Karpus, Klemensas Bertulis and Hans Arwin
  Dielectric function and refractiveindex of GaBixAs1-x(x = 0.035, 0.052, 0.075)
  Physica Status Solidi. C, Current topics in solid state physics, 2012, 9(7), 1633-1635.
 Web of Science® Times Cited: 2

Iryna Valyukh, S V Green, C G Granqvist, K Gunnarsson, Hans Arwin and G A Niklasson
  Ellipsometrically determined optical properties of nickel-containing tungsten oxide thin films: Nanostructure inferred from effective medium theory
  Journal of Applied Physics, 2012, 112(4), 044308.
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 Web of Science® Times Cited: 2

Sergiy Valyukh, V. Chigrinov, H. S. Kwok and Hans Arwin
  On liquid crystal diffractive optical elements utilizing inhomogeneous alignment
  Optics Express, 2012, 20(14), 15209-15221.
 Web of Science® Times Cited: 1

Hans Arwin, Roger Magnusson, Jan Landin and Kenneth Järrendahl
  Chirality-induced polarization effects in the cuticle of scarab beetles: 100 years after Michelson
  Philosophical Magazine, 2012, 92(12), 1583-1599.
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 Web of Science® Times Cited: 11

Mohamed Eita, Hans Arwin, Hjalmar Granberg and Lars Wagberg
  Addition of silica nanoparticles to tailor the mechanical properties of nanofibrillated cellulose thin films
  Journal of Colloid and Interface Science, 2011, 363(2), 566-572.
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 Web of Science® Times Cited: 7

A. Mendoza-Galvan, Kenneth Järrendahl, A. Dmitriev, T. Pakizeh, M. Käll and Hans Arwin
  Optical response of supported gold nanodisks
  Optics Express, 2011, 19(13), 12093-12107.
 Web of Science® Times Cited: 11

C Akerlind, Hans Arwin, Fredrik Jakobsson, H Kariis and Kenneth Järrendahl
  Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study
  THIN SOLID FILMS, 2011, 519(11), 3582-3586.
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 Web of Science® Times Cited: 1

Emily D Cranston, Mohamed Eita, Erik Johansson, Julia Netrval, Michaela Salajkova, Hans Arwin and Lars Wagberg
  Determination of Youngs Modulus for Nanofibrillated Cellulose Multilayer Thin Films Using Buckling Mechanics
  BIOMACROMOLECULES, 2011, 12(4), 961-969.
 Web of Science® Times Cited: 16

Daniel Schmidt, Christian Müller, Tino Hofmann, Olle Inganäs, Hans Arwin, Eva Schubert and Mathias Schubert
  Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer
  THIN SOLID FILMS, 2011, 519(9), 2645-2649.
 Web of Science® Times Cited: 4

Hans Arwin
  Application of ellipsometry techniques to biological materials
  THIN SOLID FILMS, 2011, 519(9), 2589-2592.
 Web of Science® Times Cited: 10

Blaine Johs, Hans Arwin, Thomas Wagner, David Appel and Dimitrios Peros
  Accuracy of color determination from spectroscopic ellipsometry measurements
  THIN SOLID FILMS, 2011, 519(9), 2711-2714.
 Web of Science® Times Cited: 2

A A Wronkowska, Hans Arwin, F Firszt, S Legowski, A Wronkowski and L Skowronski
  Optical spectra of Zn1-xBexTe mixed crystals determined by IR-VIS-UV ellipsometry and photoluminescence measurements
  THIN SOLID FILMS, 2011, 519(9), 2795-2800.

S Tumenas, V Karpus, Hans Arwin and W Assmus
  Optical conductivity of fci-ZnMgRE quasicrystals
  THIN SOLID FILMS, 2011, 519(9), 2951-2954.
 Web of Science® Times Cited: 1

Thomas W H Oates, Mukesh Ranjan, Stefan Facsko and Hans Arwin
  Highly anisotropic effective dielectric functions of silver nanoparticle arrays
  OPTICS EXPRESS, 2011, 19(3), 2014-2028.
 Web of Science® Times Cited: 19

S Tumenas, I Kasalynas, V Karpus and Hans Arwin
  Infrared Reflectance Kramers--Kronig Analysis by Anchor-Window Technique
  ACTA PHYSICA POLONICA A, 2011, 119(2), 140-142.
 Web of Science® Times Cited: 1

Arturo Mendoza-Galvan, M Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
  Spectroscopic ellipsometry study on the dielectric function of bulk Ti2AlN,Ti2AlC, Nb2AlC, (Ti0.5,Nb0.5)2AlC, and Ti3GeC2 MAX-phases
  Journal of Applied Physics, 2011, 109, 013530.
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 Web of Science® Times Cited: 6

Torun Berlind, Pentti Tengvall, Lars Hultman and Hans Arwin
  Protein adsorption on thin films of carbon and carbon nitride monitored with in situ ellipsometry
  ACTA BIOMATERIALIA, 2011, 7(3), 1369-1378.
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 Web of Science® Times Cited: 11

B Gallas, N Guth, J Rivory, Hans Arwin, Roger Magnusson, G Guida, J Yang and K Robbie
  Nanostructured chiral silver thin films: A route to metamaterials at optical frequencies
  THIN SOLID FILMS, 2011, 519(9), 2650-2654.
 Web of Science® Times Cited: 3

Christian Muller, Jonas Bergqvist, Koen Vandewal, Kristofer Tvingstedt, Ana Sofia Anselmo, Roger Magnusson, M .Isabel Alonso, Ellen Moons, Hans Arwin, Mariano Campoy-Quiles and Olle Inganäs
  Phase behaviour of liquid-crystalline polymer/fullerene organic photovoltaic blends: thermal stability and miscibility
 
Altmetric usage: 1

  Journal of Materials Chemistry, 2011, 21(29), 10676-10684.
 Web of Science® Times Cited: 27

Iryna Valyukh, S V Green, C G Granqvist, G A Niklasson, Sergiy Valyukh and Hans Arwin
  Optical properties of thin films of mixed Ni-W oxide made by reactive DC magnetron sputtering
  THIN SOLID FILMS, 2011, 519(9), 2914-2918.
 Web of Science® Times Cited: 3

T W H Oates, H Wormeester and Hans Arwin
  Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry
  Progress in Surface Science, 2011, 86(11-12), 328-376.
 Web of Science® Times Cited: 28

Sergiy Valyukh, Iryna Valyukh, V Chigrinov, H S Kwok and Hans Arwin
  Liquid crystal light deflecting devices based on nonuniform anchoring
  APPLIED PHYSICS LETTERS, 2010, 97(23), 231120.
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 Web of Science® Times Cited: 3

Gunilla Wingqvist, Ferenc Tasnadi, Agne Zukauskaite, Jens Birch, Hans Arwin and Lars Hultman
  Increased electromechanical coupling in w-ScxAl1-xN
  Applied Physics Letters, 2010, 97(11), 112902.
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 Web of Science® Times Cited: 24

I Valyukh, S Green, Hans Arwin, G A Niklasson, E Wackelgard and C G Granqvist
  Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition
  SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2010, 94(5), 724-732.
 Web of Science® Times Cited: 21

Torun Berlind, Michal Poksinski, Pentti Tengvall and Hans Arwin
  Formation and cross-linking of fibrinogen layers monitored with in situ spectroscopic ellipsometry
  Colloids and Surfaces B: Biointerfaces, 2010, 75(2), 410-417.
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 Web of Science® Times Cited: 12

R Rehammar, Roger Magnusson, A I Fernandez-Dominguez, Hans Arwin, J M Kinaret, S A Maier and E E B Campbell
  Optical properties of carbon nanofiber photonic crystals
  NANOTECHNOLOGY, 2010, 21(46), 465203.
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 Web of Science® Times Cited: 2

Arturo Mendoza-Galvan, Kenneth Järrendahl, Hans Arwin, Yi-Fan Huang, Li-Chyong Chen and Kuei-Hsien Chen
  Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching
  APPLIED OPTICS, 2009, 48(26), 4996-5004.
 Web of Science® Times Cited: 3

Hans Arwin and D.E. Aspnes
  Follow the light: Ellipsometry and polarimetry
  Physics Today, 2009, 62(5), 70-71.
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 Web of Science® Times Cited: 1

Torun Berlind, Andrej Furland, Zs. Czigany, Jörg Neidhardt, Lars Hultman and Hans Arwin
  Spectroscopic ellipsometry characterization of amorphous carbon and amorphous,graphitic and fullerene-like carbon nitride thin films
  Thin Solid Films, 2009, 517(24), 6652-6658.
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 Web of Science® Times Cited: 5

Vytautas Karpus, Gintautas-Jurgis Babonas, Alfonsas Reza, Saulius Tumenas, Hans Arwin, Wolf Assmus and Stefan Bruehne
  Optical response of si-ZnMgHo quasicrystal
  ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2009, 224(1-2), 39-41.
 Web of Science® Times Cited: 2

Christina Åkerlind, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
  Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions
  Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5(5), 1089-1092.

Henrik Wiklund, Hans Arwin and Kenneth Järrendahl
  A FEM-based application for numerical calculations of ellipsometric data
  Physica Status Solidi (a) applications and materials science, 2008, 205(4), 945-948.

Nilton Souxa Dantas, Hans Arwin, Gabriel Nzulu, Paulo Henrique de Olivera Rappl, Antonio Ferreira da Silva and Clas Persson
  Optical characterization of rocksalt Pb1-xSnxTe alloys
  physica status solidi (a): Applications and Materials Science, 2008, 205(4), 837-840.

Hans Arwin, Michal Poksinski and Knut Johansen
  Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions
  Physica Status Solidi (a) applications and materials science, 2008, 205(4), 817-820.
 Web of Science® Times Cited: 12

B. Gallas, J. Rivory, Hans Arwin, F. Vidal and V.H. Etgens
  Changes in optical properties of MnAs thin films on GaAs(001) induced by a- to B-phase transition
  Physica Status Solidi (a) applications and materials science, 2008, 205(4), 859-862.
 Web of Science® Times Cited: 6

B. Gallas, J. Rivory, Hans Arwin, F. Vidal and M. Stchakovsky
  Monitoring the a to B-phase transition in MnAs/GaAs(001) thin films as funcion of temperature
  Physica Status Solidi (a) applications and materials science, 2008, 205(4), 863-866.
 Web of Science® Times Cited: 5

A.A. Wronkowska, L. Skowronski, A. Wronkowski, F. Firszt, H. Meczynska, S. Legowski, K. Strzalkowski and Hans Arwin
  Spectroscopic ellipsometry and photoluminescence investigation of Zn1-x-yBexMgySe and Cd1-x-yBexZnySe Crystals
  Physica Status Solidi (a) applications and materials science, 2008, 205(4), 854-858.
 Web of Science® Times Cited: 4

Jimmy W.P. Bakker, Hans Arwin, Ingemar Lundström and Daniel Filippini
  Immunodetection using computer screen photo-assisted ellipsometry
  Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5(5), 1431-1433.
 Web of Science® Times Cited: 2

Hans Arwin, Agneta Askendal, Pentti Tengvall, Daniel W. Thompson and John A. Woollam
  Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers
  Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5(5), 1438-1441.
 Web of Science® Times Cited: 5

M. Campoy-Quiles, J. Nelson, P.G. Etchegoin, D.D.C. Bradley, V Zhokhavets, G. Gobsch, H. Vaughan, A, Monkman, Olle Inganäs, Nils-Krister Persson, Hans Arwin, M. Garriga, M.I. Alonso, G. Herrmann, M. Becker, W. Scholdei, M. Jahja and C. Bubeck
  On the determination of anistropy in polymer thin films: A comparative study of optical techniques
  Physica Status Solidi. C: Current Topics in Solid State Physics, 2008, 5(5), 1270-1273.
 Web of Science® Times Cited: 11

A.A. Wronskowska, Hans Arwin, A. Bukaluk, L. Skowronski, M. Trzcinski, K. Okulewicz and A. Wronkowksi
  IR-VIS-UV ellipsometry, XRD and AES investigation of In/Cu and In/Pd thin films
  Physica Status Solidi. C, Current topics in solid state physics, 2008, 5(5), 1141-1144.

A.A. Wronkowska, L. Skowronski, A. Wronkowski, L. Zielinski, F. Firszt, A. Marasek, W. Paszkowicz and Hans Arwin
  Lattice absorption of Be-containing semiconductor alloys determined by spectroscopic ellipsometry
  Physica Status Solidi (a) applications and materials science, 2008, 205(4), 849-853.
 Web of Science® Times Cited: 4

Torun Berlind, G. K. Pribi, D. Thompson, J. O. Woollam and Hans Arwin
  Effects of ion concentration on refractive indices offluids measured by the minimum deviation technique
  Physica Status Solidi. C, Current topics in solid state physics, 2008, 5(5), 1249-1252.
 Web of Science® Times Cited: 9

Vanya Darakchieva, T. Paskova, M. Schubert, Plamen Paskov, Hans Arwin, Bo Monemar, D. Hommel, M. Heuken, J. Off, B.A. Haskell, P.T. Fini, J.S. Speck and S. Nakamura
  Effect of anisotropic strain on phonons in a-plane and c-plane GaN layers
  Journal of Crystal Growth, 2007, 300(1), 233-238.
 Web of Science® Times Cited: 4

Martina Levin, Per Wiklund and Hans Arwin
  Adsorption and film growth of N-methylamino substituted triazoles on copper surfaces in dydrocarbon media
  Applied Surface Science, 2007, 254, 1528-1533.
 Web of Science® Times Cited: 6

Iryna Valyukh, Sergiy Valyukh, Hans Arwin and Vladimir Chigrinov
  Characteristic functions for uniformly twisted birefringent media
  Journal of Applied Physics, 2007, 102(6), .
 Web of Science® Times Cited: 1

Michal Poksinski and Hans Arwin
  Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces
  Optics Letters, 2007, 32(10), 1308-1310.
 Web of Science® Times Cited: 17

Vanya Darakchieva, Tanja Paskova, M. Schubert, Hans Arwin, Plamen Paskov, Bo Monemar, D. Hommel, J. Off, F. Scholz, M. Heuken, B.A. Haskell, P.T. Fini, S.J. Speck and S. Nakamura
  Anisotropic strain and phonon deformation potentials in GaN
  Physical Review B. Condensed Matter and Materials Physics, 2007, 75(19), 195217.
 Web of Science® Times Cited: 49

Vanya Darakchieva, Tanja Paskova, Plamen Paskov, Hans Arwin, M Schubert, Bo Monemar, S Figge, D Hommel, BA Haskell, PT Fini and S Nakamura
  Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
  Physica status solidi. B, Basic research, 2006, 243(7), 1594-1598.
 Web of Science® Times Cited: 2

Masato Tazawa, Hiroshi Kakiuchida, Gang Xu, Ping Jin and Hans Arwin
  Optical constants of vacuum evaporated SiO film and an application
  Journal of Electroceramics, 2006, 16(4), 511-515.
 Web of Science® Times Cited: 12

Hans Arwin, M P M A Baroni, M. Ventura Conceicao, R.R. Rosa, C. Persson, E.F. da Silva Jr, L.S. Roman, O. Nakamura, I. Pepe and A. Ferreira da Silva
  Optical and morphological properties of porous diamond-like-carbon films deposited by magnetron sputtering
  Journal of Non-Crystalline Solids, 2006, 352( 32-35), 3734-3738.
 Web of Science® Times Cited: 2

Hans Arwin, A A Wronkowska, F Firszt, A Wronkowski, M Wakula, K Strzalkowski and W Paszkowicz
  Characterisation of Cd1-x-yZnxBeySe crystals by spectroscopic ellipsometry and luminescence
  Physica Status Solidi. C, Current topics in solid state physics, 2006, , 1193-1196.
 Web of Science® Times Cited: 2

Jimmy W.P. Bakker, Hans Arwin, Ingemar Lundström and Daniel Filippini
  Computer screen photo-assisted off-null ellipsometry
  Applied Optics, 2006, 45(30), 7795-7799.
 Web of Science® Times Cited: 12

Hans Arwin, Linda Karlsson, A. Kozarcanin, D.W. Thompson, T. Tiwald and J.A. Woollam
  Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry
  Physica status solidi. A, Applied research, 2005, 202, 1688-1692.
 Web of Science® Times Cited: 1

Linda Karlsson, Hans Arwin, Mattias Schubert and N. Ashkenov
  Adsorption of human serum albumin in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
  Physica status solidi, 2005, 2, 3293-3297.

Nils-Krister Persson, Hans Arwin and Olle Inganäs
  Optical optimization of polyfluorene-fullerene blend photodiodes
  Journal of Applied Physics, 2005, 97(3), 034503-1-034503-8.
 Web of Science® Times Cited: 67

Hans Arwin, Theeraphon Piacham, Åsa Josell, Virapong Prachayasittikul and Lei Ye
  Molecularly imprinted polymer thin films on quartz crystal microbalance using a surface bound photo-radical initiator
  Analytica Chimica Acta, 2005, 536, 191-196.
 Web of Science® Times Cited: 44

Irina Buyanova, Morteza Izadifard, A. Kasic, Hans Arwin, Weimin Chen, H. P. Xin, Y. G. Hong and C. W. Tu
  Analysis of band anticrossing in GaNxP1-x alloys
  Physical review. B, Condensed matter and materials physics, 2004, 70, 085209.
 Web of Science® Times Cited: 31

Linda Karlsson, Mattias Scubert, N. Ashkenov and Hans Arwin
  Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
  Elsevier Science, 2004, 455-456, 726-730.
 Web of Science® Times Cited: 21

A.A. Wronkowska, K. Bejtka, Hans Arwin, A. Wronkowski, F. Firszt, S. Legowski, H Meczynska and A. Marasek
  IR ellipsometry and photoluminescence investigations of ZN1-xBexSe and Zn1-x-yBexMnySe mixed crystals
  Elsevier Science, 2004, 455-456, 256-260.
 Web of Science® Times Cited: 5

Michal Poksinski and Hans Arwin
  Protein monolayers monitored by internal reflection ellipsometry
  Thin Solid Films, 2004, 455-456, 716-721.
 Web of Science® Times Cited: 65

Mattias Schubert, C. Bundesmann, G. Jacopic, H. Maresch, Hans Arwin, Nils-Krister Persson, Fengling Zhang and Olle Inganäs
  Infrared ellipsometry characterization of conducting thin organic films
  Elsevier Science, 2004, 455-456, 295-300.
 Web of Science® Times Cited: 10

Mattias Schubert, C. Bundesmann, G. Jacopic, H. Maresch and Hans Arwin
  Infrared dielectric function and vibrational modes of pentacene thin films
  Applied Physics Letters, 2004, 84(2), 200-202.
 Web of Science® Times Cited: 11

Michael Tulldahl, K. Ove Steinvall and Hans Arwin
  Simulation of sea surface wave influence on small target detection with airborne laser depth sounding
  , 2004, , .
 Web of Science® Times Cited: 7

Guoliang Wang, Hans Arwin and Roger Jansson
  Optimization of off-null ellipsometry in sensor applications
  , 2004, , .
 Web of Science® Times Cited: 7

M. Tazawa, G. Xu, P. Jin and Hans Arwin
  A memory application of light reflection from anisotropic microstructured thin films
  Elsevier Science, 2004, 455-456, 824-827.

O.P.A. Lindquist, Mattias Schubert, Hans Arwin and Kenneth Järrendahl
  Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
  Elsevier Science, 2004, 455-456, 235-238.
 Web of Science® Times Cited: 1

Hans Arwin, Michal Poksinski and Knut Johansen
  Total internal reflection ellipsometry: principles and applications
  Applied Optics, 2004, 43(15), 3028-3036.
 Web of Science® Times Cited: 76

A.A. Wronkowska, Hans Arwin, M. Trzcinski, A. Wronkowski, M. Rozwadowski and A. Bukaluk
  Ellipsometric and AES investigation of thin polycrystaline In/Cu and In/Ag couples
  Elsevier Science, 2004, 74, 163-167.
 Web of Science® Times Cited: 5

Mattias Schubert, C. Bundesmann, H. v. Wenckstern, G. Jakopic, A. Haase, Nils-Krister Persson, Fengling Zhang, Hans Arwin and Olle Inganäs
  Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry
  Applied Physics Letters, 2004, 84, 1311-1313.
 Web of Science® Times Cited: 12

Jimmy. W. P. Bakker, G. Bryntse and Hans Arwin
  Determination of refractive index of printed and unprinted paper using spectroscopic ellipsometry.
  Thin Solid Films, 2004, 455-456, 361-365.
 Web of Science® Times Cited: 5

Guoliang Wang, Hans Arwin and Roger Jansson
  Optimization of azimuth angle settings in polarizer-compensator-sample-analyzer off-null ellipsometry
  Applied Optics, 2003, 42(1), 38-44.
 Web of Science® Times Cited: 10

J Isidorsson, IAME Giebels, Hans Arwin and R Griessen
  Optical properties of MgH2 measured in situ by ellipsometry and spectrophotometry
  Physical Review B. Condensed Matter and Materials Physics, 2003, 68(11), .
 Web of Science® Times Cited: 80

N. Ashkenov, B.N. Mbenkum, C. Bundesmann, V. Riede, M. Lorenz, D. Spemann, E.M. Kaidashev, A. Kasic, M. Schubert, M. Grundmann, G. Wagner, H. Neumann, Vanya Darakchieva, Hans Arwin and Bo Monemar
  Infrared dielectric functions and phonon modes of high-quality ZnO films
  Journal of Applied Physics, 2003, 93(1), 126-133.
 Web of Science® Times Cited: 320

L M Karlsson, Pentti Tengvall, Ingemar Lundström and Hans Arwin
  Penetration and loading of human serum albumin in porous silicon layers with different pore sizes and thicknesses
  Journal of Colloid and Interface Science, 2003, 266(1), 40-47.
 Web of Science® Times Cited: 38

Michal Poksinski and Hans Arwin
  In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry
  Sensors and actuators. B, Chemical, 2003, 94(3), 247-252.
 Web of Science® Times Cited: 18

Michal Poksinski, Hasan Dzuho and Hans Arwin
  Copper corrosion monitoring with total internal reflection ellipsometry
  Journal of the Electrochemical Society, 2003, 150(11), B536-B539.
 Web of Science® Times Cited: 7

Guoliang Wang, Hans Arwin and Roger Jansson
  An optical gas sensor based on ellipsometric readout
  IEEE Sensors Journal, 2003, 3(6), 739-743.
 Web of Science® Times Cited: 7

Guoliang Wang and Hans Arwin
  Return-path ellipsometry in gas sensing
  Measurement science and technology, 2003, 15, 216-220.
 Web of Science® Times Cited: 2

V. Darakchieva, Plamen Paskov, Mattias Schubert, Tanja Paskova, Hans Arwin, Bo Monemar, H. Amano and I. Akasaki
  Strain evolution and phonons in AlN/GaN superlattices
  , 2003, , .

Jimmy W. P. Bakker, Hans Arwin, Guoliang Wang and K. Järrendahl
  Improvement of porous silicon based gas sensors by polymer modification
  Physica Status Solidi (A), 2003, 197(2), 378-381.
 Web of Science® Times Cited: 16

Guoliang Wang and Hans Arwin
  Modification of vapor sensitivity in ellipsometric gas sensing by copper deposition in porous silicon
  Sensors and actuators. B, Chemical, 2002, 85(1-2), 95-103.
 Web of Science® Times Cited: 11

L M Karlsson, Pentti Tengvall, Ingemar Lundström and Hans Arwin
  Back-side etching A tool for making morphology gradients in porous silicon
  Journal of the Electrochemical Society, 2002, 149(12), .
 Web of Science® Times Cited: 13

R. Ahuja, Hans Arwin, Silva A.F. Da, C. Persson, J.M. Osorio-Guillen, De Almeida J. Souza, C.M. Araujo, E. Veje, N. Veissid, C.Y. An, I. Pepe and B. Johansson
  Electronic and optical properties of lead iodide
  Journal of Applied Physics, 2002, 92(12), 7219-7224.
 Web of Science® Times Cited: 23

Hans Arwin
  Spectroscopic ellipsometry for characterization and monitoring of organic layers
  Physica status solidi. A, Applied research, 2001, 188(4), 1331-1338.
 Web of Science® Times Cited: 5

C. Wongmanerod, S. Zangooie and Hans Arwin
  Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry
  Applied Surface Science, 2001, 172(1-2), 117-125.
 Web of Science® Times Cited: 44

A. Bukaluk, A.A. Wronkowska, A. Wronkowski, Hans Arwin, F. Firszt, S. Legowski, H. Meczynska and J. Szatkowski
  Auger electron spectroscopy, ellipsometry and photoluminescence investigations of Zn1-XBeXSe alloys
  Applied Surface Science, 2001, 175-176, 531-537.
 Web of Science® Times Cited: 5

S. Zangooie and Hans Arwin
  Surface, Pore Morphology, and Optical Properties of Porous 4H-SiC
  Journal of the Electrochemical Society, 2001, 148(6), .
 Web of Science® Times Cited: 8

Roger Jansson, S. Zangooie, T. Kugler and Hans Arwin
  Optical and microstructural characterization of thin films of photochromic fulgides
  Journal of Physics and Chemistry of Solids, 2001, 62(7), 1219-1228.
 Web of Science® Times Cited: 8

Hans Arwin
  Is ellipsometry suitable for sensor applications?
  Sensors and Actuators A-Physical, 2001, 92(1-3), 43-51.
 Web of Science® Times Cited: 47

Annika Rantzer, Hans Arwin, Jens Birch, B. Hjörvarsson, J.W.P. Bakker and Kenneth Järrendahl
  Optical properties of intrinsic and doped a-Si:H films grown by d.c. magnetron sputter deposition
  Thin Solid Films, 2001, 394(1-2), 255-262.
 Web of Science® Times Cited: 4

Roger Jansson, S Zangooie, Hans Arwin and Kenneth Järrendahl
  Characterization of 3C-SiC by spectroscopic ellipsometry
  Physica status solidi. B, Basic research, 2000, 218(1), R1-R2.
 Web of Science® Times Cited: 6

S Zangooie, Per Persson, JN Hilfiker, Lars Hultman and Hans Arwin
  Microstructural and infrared optical properties of electrochemically etched highly doped 4H-SiC
  Journal of Applied Physics, 2000, 87(12), 8497-8503.
 Web of Science® Times Cited: 24

K Johansen, Hans Arwin, Ingemar Lundström and Bo Liedberg
  Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations
  Review of Scientific Instruments, 2000, 71(9), 3530-3538.
 Web of Science® Times Cited: 106

S Zangooie, JA Woollam and Hans Arwin
  Self-organization in porous 6H-SiC
  Journal of Materials Research, 2000, 15(9), 1860-1863.
 Web of Science® Times Cited: 16

Hans Arwin, M Gavutis, J Gustafsson, M Schultzberg, S Zangooie and Pentti Tengvall
  Protein adsorption in thin porous silicon layers
  Physica status solidi. A, Applied research, 2000, 182(1), 515-520.
 Web of Science® Times Cited: 35

S Zangooie and Hans Arwin
  Porous anodic 4H-SiC: Thickness dependent anisotropy in pore propagation and ellipsometric characterization
  Physica status solidi. A, Applied research, 2000, 182(1), 213-219.
 Web of Science® Times Cited: 5

S Zangooie, Hans Arwin, Ingemar Lundström and Anita Lloyd-Spets
  Ozone treatment of SiC for improved performance of gas sensitive Schottky diodes
  Materials Science Forum, 2000, 338-3, 1085-1088.
 Web of Science® Times Cited: 20

OPA Lindquist, Hans Arwin, Urban Forsberg, JP Bergman and Kenneth Järrendahl
  Optical characterization of 4H-SiC by variable angle of incidence spectroscopic ellipsometry
  Materials Science Forum, 2000, 338-3, 575-578.
 Web of Science® Times Cited: 2

Hans Arwin
  Ellipsometry on thin organic layers of biological interest: Characterization and applications
  Thin Solid Films, 2000, 377-378, 48-56.
 Web of Science® Times Cited: 83

Å. A. Johansson, Kenneth Järrendahl, Jens Birch, B. Hjörvarsson and Hans Arwin
  Intrinsic, n- and p-doped a-Si:H thin films grown by DC magnetron sputtering with doped targets
  Materials Research Society Symposium Proceedings, 1999, 557, 31-36.

Chapters in Books

Hans Arwin
  Adsorption of Proteins at Solid Surfaces
  Ellipsometry of Functional Surfaces and Films, Springer Berlin/Heidelberg, 2014, 29-46.


Kenneth Järrendahl and Hans Arwin
  Polarizing Natural Nanostructures
  Ellipsometry of Functional Organic Surfaces and Films, Springer Berlin/Heidelberg, 2014, 155-169.


Hans Arwin
  TIRE and SPR-enhanced SE for adsorption processes
  Ellipsometry of Functional Organic Surface and Films, Springer Berlin/Heidelberg, 2014, 249-264.


Hans Arwin
  Ellipsometry-Based Sensor Systems
  Encyclopedia of Sensors Vol. 3, American Scientific Publishers, 2006, 329-358.


Hans Arwin and Michal Poksinski
  Total Internal Reflection Ellipsometry: monitoring of proteins on thin metal films
  Proteins on surfaces, Springer Verlag, 2006, 105-118.


Hans Arwin
  Ellipsometry in Life Science
  Handbook of Ellipsometry, William Andrew Publishing/SpringerVerlag, 2005, 799-855.


Conference Articles

C Gustafsson, Jiaxin Chen, Hans Arwin and B Forsgren
  Corrosion Kinetics of Nickel-base Alloys in Simulated BWR Conditions under High Flow Velocity
  16th International Conference on Environmental Degradation of Materials in Nuclear Power Systems- Water Reactors, 11-15 August 2013, Asheville, NC, USA, 2013.


Hans Arwin, Lia Fernández del Río and Kenneth Järrendahl
  Comparison and Analysis of Mueller-Matrix Spectra from Exoskeletons of Blue, Green and Red Cetonia aurata
  6th International Conference on Spectroscopic Ellipsometry (ICSE-VI), May 26 – 31, 2013, Kyoto, 2013.


  Fulltext PDF

Sergiy Valyukh, Hans Arwin, Christina Åkerlind and Kenneth Järrendahl
  Simulation of light scattering from biological helicoidal structures
  7th Workshop Ellipsometry, 2012.


Sergiy Valyukh, Hans Arwin and Kenneth Järrendahl
  Light Scattering and Colour Generation in exoskeletons of Jewelled Beetle
  Photonics Global Conference, 2012.


Jonas Bergqvist, Hans Arwin and Olle Inganäs
  Determination of optical constants and phase transition temperatures in polymer fullerene thin films for polymer solar cells
  7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.


  Fulltext PDF

Jonas Bergqvist, Hans Arwin and Olle Inganäs
  In situ reflectance imaging of organic thin film formation from solution
  5th International Symposium Technologies for Polymer Electronics (TPE 2012), May 22-24, 2012, Rudolstadt, Germany, 2012.


Jonas Bergqvist, Kristofer Tvingstedt, Hans Arwin and Olle Inganäs
  In situ reflectance imaging of organic thin film formation from solution
  The 4th international Conference on Hybrid and Organic Photovoltaics, HOPV12, May 6-9, 2012, Uppsala, 2012.


Lia Fernández del Río, Hans Arwin, Jan Landin, Roger Magnusson and Kenneth Järrendahl
  A Mueller Matrix Spectroscopic Ellipsometry Study of Scarab Beetles of the Chrysina Genus
  7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.


Eloy Guadalupe Muñoz-Pineda, Arturo Mendoza-Galván, Reina Araceli Mauricio-Sánchez, Jan Landin, Kenneth Järrendahl and Hans Arwin
  Polarization properties and structural color of the scarab beetle Cotinis mutabilis (Mayatl)
  XXI International Materials Research Congress (IMRC 2012), August 12 - 17, 2012, Cancun, Mexico, 2012.


Hans Arwin
  Analysis of photonic structures in beetles using Mueller-matrix data
  7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.


  Fulltext PDF

Hans Arwin, Blaine Johs and Kenneth Järrendahl
  Analysis of Mueller-matrix data from chiral structures in exoskeletons of scarab beetles
  E-MRS 2012 Spring meeting, May 14-18, 2012, Strasbourg, France, 2012.


Hans Arwin
  Structural and optical properties of chiral natural photonic structures determined from spectroscopic Mueller-matrix data
  E-MRS 2012 Fall Meeting, 2012.


Hans Arwin, Torun Berlind, Jens Birch, Lia Fernández del Río, Johan Gustafson, Jan Landin, Roger Magnusson, Christina Åkerlind and Kenneth Järrendahl
  Polarization effects in reflection from the cuticle of scarab beetles studied by spectroscopic Mueller-matrix ellipsometry
  AES 2012, Advanced Electromagnetics Symposium, 2012.


Hans Arwin
  Polarized reflection and nanostructure in scarab beetles studied by spectroscopic Mueller-matrix ellipsometry
  XXI International Materials Research Congress (IMRC 2012), August 12 - 17, 2012, Cancun, Mexico, 2012.


Kenneth Järrendahl, Jens Birch, Roger Magnusson, Ching-Lien Hsiao, Per Sandström, Torun Berlind, Johan L.I. Gustafson, Lia Fernández del Río, Jan Landin and Hans Arwin
  Polarization of Light Reflected from Chiral Structures - Calculations Compared with Mueller Matrix Ellipsometry Measurements on Natural and Synthetic Samples
  7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.


Robert Rehammar, Roger Magnusson, Andreas Lassesson, Hans Arwin, Jari Kinaret and Eleanor Campbell
  Carbon nanofiber-based photonic crystals – fabrication, diffraction and ellipsometry investigations
  Carbon-Based Electronic Devices - Processing, Performance and Reliability, 2011.


Hans Arwin, Kenneth Järrendahl, Jan Landin, J. Boulenquez and S. Berthier
  Ellipsometry applied to natural biophotonic structures: a review
  1st European Workshop on Polarization Based Optical Techniques in Biology and Bedicine, massy, 30-31 March, 2009, 2009.


Kenneth Järrendahl, Jan Landin and Hans Arwin
  Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab Beetles
  AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13, 2009, 2009.


Kenneth Järrendahl, Jan Landin and Hans Arwin
  Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab
  AVS 56th Int. Symp. & Exhibition, San José, CA USA, November 8-13 2009, 2009.


Roger Magnusson, Robert Rehammar and Hans Arwin
  Lattices of Freestanding Carbon Nanofibres Characterized by Spectroscopic Ellipsometry
  AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13, 2009, 2009.


Hans Arwin
  Spectroscopic Ellipsometry on Protein layers: Characterization and Sensor applications
  AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13 2009, 2009.


Hans Arwin, Kenneth Järrendahl, Jan Landin, J. Boulenquez and S. Berthier
  Optical activity in the cuticle of the beetle Cetonia aurata studied by Mueller-matrix ellipsometry
  1st European Workshop on Polarization Based Optical Techniques in Biology and Bedicine, massy, 30-31 March, 2009, 2009.


Hans Arwin, A. Mendoza-Galván, Kenneth Järrendahl, A. Dmitriev, T. Pakizeh and M. Käll
  Artificial Magnetism in Gold-Silica-Gold Metamaterials - an ellipsometric Study
  5th Workshop Ellipsometry, Zweibrücken, Germany March 2-4, 2009, 2009.


Hans Arwin
  Characterization of Metamaterials with Ellipsometry
  5th Workshop ellipsometry, Zweibrücken, Germany March 2-4 2009, 2009.


Iryna Valyukh, S. Green, Hans Arwin, G.A. Niklasson, Ewa Wäckelgård and C.G. Granqvist
  Optical Properties of Amorphous Tungsten Osice Films Deposited by Reactive DC magnetron sputtering
  5th Workshop ellipsometry, Zweibrücken, Germany, March 2-4, 2009.


Christina Åkerlind, Hans Arwin, Fredrik L.E. Jakobsson, Hans Kariis and Kenneth Järrendahl
  Optical Properties and Switching of a Rose Bengal Derivativ
  5th Workshop ellipsometry, Zweibrücken, Germany, March 2-4 2009, 2009.


Hans Arwin, Jan Landin, Kenneth Järrendahl, J Boulenguez and S. Berthier
  Optical Activity in the Cuticle of the Beetle Cetonia Aurata
  5th Workshop Ellipsometry, Zweibrücken, Germany, March 2-4 2009, 2009.


Arturo Mendoza-Galván, Kenneth Järrendahl, Hans Arwin, I.F. Huang and K.H Chen
  Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching
  5th Workshop Ellipsometry, Zweibrücken, Germany, 2009.


Kenneth Järrendahl, Jan Landin and Hans Arwin
  Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab Beerles (conf. France)
  First NanoCharm Workshop on Advanced Polarimetric Instrumentation, Palaiseay, France, 7-9, Dec. 2009, 2009.


Arturo Mendoza-Galvan, Marcin Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
  Spectroscopic Ellipsometry of Bulk MAX-phases
  Proceedings of the AVS 56th International Symposium & Exhibition, 2009, 2009.


Hans Arwin, Jan Landin and Kenneth Järrendahl
  Optical activity in the cuticle of the beetle Cetonia aurata
  Optikdagen 2008,2008, 2008.


Hans Arwin, Jan Landin and Kenneth Järrendahl
  Optical active cuticle structures in the beetle Cetonia aurata
  European Optical Society Meeting 2008, 2008.


Christina Åkerlind, Hans Arwin, Fredrik Jakobsson, Hans Kariis and Kenneth Järrendahl
  Optical properties and switching of a rose bengal derivative studied by spectroscopic ellipsometry
  European Optical Society Meeting 2008, 2008.


Hans Arwin, Jan Landin and Kenneth Järrendahl
  Spectral confinement of circularly polarized reflection from the cuticle of Cetonia aurata measured by spectroscopic Mueller-matrix ellipsometry
  E-MRS,2008, 2008.


V. Karpus, G-J. Babonas, A. Reza, S. Tumenas, Hans Arwin, NN Wassmus and S. Brühne
  Optical responce of si-ZnMgHo quasicrystal
  10th International Conference on Quasicrystals,2008, 2008.


Iryna Valyukh, Hans Arwin, Vladimir Chigrinov and Sergiy Valyukh
  UV-induced in-plane anisotropy in layers of mixture of the azo-dyes SD-1/SDA-2 characterized by spectroscopic ellipsometry
  Physica Status Solidi. C, Current topics in solid state physics: Special Issue: 4th International Conference on Spectroscopic Ellipsometry (ICSE4), 2008.


Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
  Protein Adsorption on Carbon Nitride Films Studied with in situ Ellipsometry
  4th International Conference on Spectroscopic Ellipsometry,2007, 2007.


I. Valyukh, Hans Arwin and V. Chiginov
  UV-induced in-plane anistropy in layers of mixtures of the azo-dyes SD1/SD2 characterized by spectroscopic ellipsometry
  4th International Conference on Spectroscopic Ellipsometry,2007, 2007.


Torun Berlind, G.K. Pribil, Daniel W. Thompson, John A. Woollam and Hans Arwin
  Effects of Ion Concentration on Refractive Indices of Fluids Measured by the Minimum Deviation Technique
  4th International Conference on Spectroscopic Ellipsometry,2007, 2007.


Christina Nilsson, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
  Combining Spectroscopic Ellipsometry and Vector Network Analysis to obtain Electromagnetic Response in a Wide Wavelength Region
  4th International Conference on Spectroscopic Ellipsometry,2007, 2007.


Julie Boulenguez, Hans Arwin, Kenneth Järrendahl and Serge Berthier
  Ellipsometric study of photonic structures in wing scales of butterflies
  4th International Conference on Spectroscopic Ellipsometry, 2007, 2007.


Hans Arwin, Julie Boulenguez, Kenneth Järrendahl and Serge Bertier
  Ellipsometric study of photonic structures in wing scales of butterflies
  Optik i Sverige,2007, 2007.


Hans Arwin
  Analysis of protein layer structure using real-time ellipsometry
  Deutsche Physikalische Gesellschaft DPG Srping Meeting,2007, 2007.


Iryna Valyukh, Hans Arwin, Vladimir Chigrinov and Sergiy Valyukh
  Characterization of the Photo-Alignment Material SD-1/SDA-2 with Spectroscopic Ellipsometry
  <em></em>14th  International Display Workshops, 2007, 2007.


Hans Arwin, Sabyasachi Sarkar and J. Woollam
  Investigation of the use of IR ellipsometry for the detection of biological molecules
  American Vacuum Society 53 Int Symposium,2006, 2006.


Hans Arwin, D.W. Thompson and J.A. Woollam
  Temperature Stability of Protein Monolayers Studied by Ellipsometry in the Infrared, Visible and Ultraviolet Spectral Regions
  American Vacuum Society 53 Int Symposium,2006, 2006.


Hans Arwin, Henrik Wiklund and Kenneth Järrendahl
  Calculation of optical properties of complex surface structures using FEM
  Optikdagen 2006,2006, 2006.


Hans Arwin and Kenneth Järrendahl
  Ellipsometric studies of the wings of the butterfly Morpho rhetenor
  Optikdagen 2006,2006, 2006.


Torun Berlind, G. Pribil, D. Thompson, J.A. Woollam and Hans Arwin
  Effects of Ion Concentration on Refractive Indices of Fluids Measured by the Minimum Deviation Technique
  Optikdagen 2006,2006, 2006.


Hans Arwin, Henrik Wiklund and Kenneth Järrendahl
  Calculation of optical properties of complex surface structures using FEM
  European Optical Society Annual Meeting,2006, 2006.


Hans Arwin and K. Järrendahl
  Ellipsometric studies of the wings of the butterfly Morpho rhetenor
  European Optical Society Annual Meeting,2006, 2006.


Hans Arwin, Jimmy Bakker, Ingemar Lundström and Daniel Filippini
  A computer as imaging ellipsometer: biosensing at home
  Europtrode VIII,2006, 2006.


Hans Arwin, D.W. Thompson and J.A. Woollam
  Infrared Ellipsometry Studies on Protein Layers: Model Dielectric Functions and Temperature Effects
  4th Workshop Ellipsometry,2006, 2006.


Hans Arwin and Michal Poksinski
  Total Internal Reflection Ellipsometry: a tool for analysis of ultrathin films on metal surfaces
  4th Workshop Ellipsometry,2006, 2006.


Hans Arwin, Ingemar Lundström, Daniel Filippini and Jimmy Bakker
  Computer screen photo-assisted ellipsometry
  4th Workshop Ellipsometry,2006, 2006.


Hans Arwin, Vanya Darakchieva, Tanja Paskova, Plamen Paskov, Bo Monemar, Mattias Schubert, S Figge, D Hommel, B A Haskell, P T Fini and S Nakamura
  Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
  ICSN-6,2005, 2005.


Hans Arwin, M Tazawa, H Kakiuchida, G Xu and P Jin
  Optical constants of vacuum evaporated SiO film and an application
  MRS-ICAM2005,2005, 2005.


Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
  Adsorption of human serum albumin on carbon nitride films studied with in-situ ellipsometry
  American Vacuum Society 52 Int Symposium and Exhibition,2005, 2005.


Hans Arwin, John A. Woollam and Dan W. Thompson
  Model dielectric functions for adsorbed protein layers
  American Vacumm Society 52 Int Symposium and Exhibition,2005, 2005.


Hans Arwin, Agneta Askendal, Torun Berlind, Pentti Tengvall, Dan W Thompson, T Tiwald and John A. Woollam
  Infrared ellipsometry studies of temperature effects on multilayers of ANTI-human serum albumin and its antigen
  E-MRS,2005, 2005.


Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
  Bioadsorption studies on carbon nitride films using in-situ ellipsometry
  E-MRS spring meeting,2005, 2005.


Irina Buyanova, Morteza Izadifard, A. Kasic, Hans Arwin, Weimin Chen, H.P. Xin, Y.G. Hong and C.W. Tu
  Compositional Dependence of conduction band states in GaNP alloys
  5th International Conference on Low Dimensional Structures and Devices,2004, 2004.


Hans Arwin and Michal Poksinski
  Protein-Surface Interactions Studied with Internal Reflection Ellipsometry
  AVS 51st International Symposium Exhibition,2004, 2004.


Hans Arwin
  Summaries of contributions to the conference of the Swedish Optical Society
  Optik i Sverige 2004,2004, 2004.


Hans Arwin
  Porous Semiconductors . Science and Technology
  Materials of the 4th International Conference,2004, 2004.


L M Karlsson, Pentti Tengvall, Ingemar Lundström and Hans Arwin
  Adsorption of human serum albumin in porous silicon gradients
  , 2003.


 Web of Science® Times Cited: 14

Hans Arwin, Guoliang Wang and Roger Jansson
  Gas sensing based on ellipsometric measurement on porous silicon
  Physica status solidi. A, Applied research, 2003.


 Web of Science® Times Cited: 4

A.A. Wronkowska, A. Wronkowski, A. Bukaluk, M. Stefanski, Hans Arwin, F. Firszt, S. Legowski, H. Meczynska and K. Hradil
  Investigations of Cd1-xMnxTe crystals by means of ellipsometry and Auger electron spectroscopy
  Applied Surface Science, 2003.


 Web of Science® Times Cited: 5

Guoliang Wang, Hans Arwin and Roger Jansson
  An optical gas sensor based on ellipsometric readout
  IEEE Sensors Journal, 2003.


 Web of Science® Times Cited: 7

OPA Lindquist, Hans Arwin, Anne Henry and Kenneth Järrendahl
  Infrared optical properties of 3C, 4H and 6H silicon carbide
  Materials Science Forum, Vols. 433-436, 2003.


A.A. Wronkowska, A. Wronkowski, Hans Arwin, F. Firszt, S. Legowski, H. Meczynska and J. Szatkowski
  Characterisation of Cd1-xMgxSe solid solutions by spectroscopic ellipsometry
  Vacuum, 2001.


 Web of Science® Times Cited: 7

S Zangooie, Per Persson, JN Hilfiker, Lars Hultman, Hans Arwin and Qamar Ul Wahab
  Microstructural, optical and electronic investigation of anodized 4H-SiC
  Materials Science Forum, Vols. 338-342, 2000.


 Web of Science® Times Cited: 4

Michal Poksinski, Hasan Dzuho, Jan-Ove Järrhed and Hans Arwin
  Total internal reflection ellipsometry
  Eurosensors XIV: The 14th European Conference on Solid-State Transducers : Book of Abstracts, 2000.


Ph.D. Theses

Roger Magnusson
  Mueller matrix ellipsometry studies of nanostructured materials
  2014.


  Fulltext PDF

Torun Berlind
  Carbon Nitride: Characterization and Protein Interactions
  2009.


  Fulltext PDF

Jimmy W. P. Bakker
  Optical Detection Using Computer Screen Photo-assisted Techniques and Ellipsometry
  2006.


  Fulltext PDF

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