Publications for Hans Arwin
Co-author map based on ISI articles 2007-
Publications mentioned in social media 1 times*
Journal Articles
Robert Rehammar, Farzan Alavian Ghavanini, Roger Magnusson, Jari Kinaret, Peter Enoksson, Hans Arwin and Eleanor Campbell
Electromechanically Tunable Carbon Nanofiber Photonic Crystal
Nano letters (Print), 2012, 13(2), 397-401.
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Arturo Mendoza-Galván, Kenneth Järrendahl, Alexander Dmitriev, T. Pakizeh, Mikael Käll and Hans Arwin
Fano interference in supported gold nanosandwiches with weakly coupled nanodisks
Optics Express, 2012, 20(28), 29646-29658.
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Hjalmar Granberg,, Ludovic Coppel,, Mohamed Eita, Eduardo de Mayolo, Hans Arwin and Lars Wågberg
Dynamics of moisture interaction with polyelectrolyte multilayers containing nanofibrillated cellulose
Nordic Pulp & Paper Research Journal, 2012, 27(2), 496-499.
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Saulius Tumėnas, Vytautas Karpus, Klemensas Bertulis and Hans Arwin
Dielectric function and refractiveindex of GaBixAs1-x(x = 0.035, 0.052, 0.075)
Physica Status Solidi. C, Current topics in solid state physics, 2012, 9(7), 1633-1635.
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Iryna Valyukh, S V Green, C G Granqvist, K Gunnarsson, Hans Arwin and G A Niklasson
Ellipsometrically determined optical properties of nickel-containing tungsten oxide thin films: Nanostructure inferred from effective medium theory
Journal of Applied Physics, 2012, 112(4), 044308.
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Sergiy Valyukh, V. Chigrinov, H. S. Kwok and Hans Arwin
On liquid crystal diffractive optical elements utilizing inhomogeneous alignment
Optics Express, 2012, 20(14), 15209-15221.
Web of Science® Times Cited: 1 |
Hans Arwin, Roger Magnusson, Jan Landin and Kenneth Järrendahl
Chirality-induced polarization effects in the cuticle of scarab beetles: 100 years after Michelson
Philosophical Magazine, 2012, 92(12), 1583-1599.
Fulltext Web of Science® Times Cited: 4 |
T W H Oates, H Wormeester and Hans Arwin
Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry
Progress in Surface Science, 2011, 86(11-12), 328-376.
Web of Science® Times Cited: 10 |
Mohamed Eita, Hans Arwin, Hjalmar Granberg and Lars Wagberg
Addition of silica nanoparticles to tailor the mechanical properties of nanofibrillated cellulose thin films
Journal of Colloid and Interface Science, 2011, 363(2), 566-572.
Fulltext Web of Science® Times Cited: 3 |
A. Mendoza-Galvan, Kenneth Järrendahl, A. Dmitriev, T. Pakizeh, M. Käll and Hans Arwin
Optical response of supported gold nanodisks
Optics Express, 2011, 19(13), 12093-12107.
Web of Science® Times Cited: 5 |
Christian Muller, Jonas Bergqvist, Koen Vandewal, Kristofer Tvingstedt, Ana Sofia Anselmo, Roger Magnusson, M .Isabel Alonso, Ellen Moons, Hans Arwin, Mariano Campoy-Quiles and Olle Inganäs
Phase behaviour of liquid-crystalline polymer/fullerene organic photovoltaic blends: thermal stability and miscibility
Journal of Materials Chemistry, 2011, 21(29), 10676-10684.
Web of Science® Times Cited: 10 |
C Akerlind, Hans Arwin, Fredrik Jakobsson, H Kariis and Kenneth Järrendahl
Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study
THIN SOLID FILMS, 2011, 519(11), 3582-3586.
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Emily D Cranston, Mohamed Eita, Erik Johansson, Julia Netrval, Michaela Salajkova, Hans Arwin and Lars Wagberg
Determination of Youngs Modulus for Nanofibrillated Cellulose Multilayer Thin Films Using Buckling Mechanics
BIOMACROMOLECULES, 2011, 12(4), 961-969.
Web of Science® Times Cited: 7 |
Daniel Schmidt, Christian Müller, Tino Hofmann, Olle Inganäs, Hans Arwin, Eva Schubert and Mathias Schubert
Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer
THIN SOLID FILMS, 2011, 519(9), 2645-2649.
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Hans Arwin
Application of ellipsometry techniques to biological materials
THIN SOLID FILMS, 2011, 519(9), 2589-2592.
Web of Science® Times Cited: 3 |
B Gallas, N Guth, J Rivory, Hans Arwin, Roger Magnusson, G Guida, J Yang and K Robbie
Nanostructured chiral silver thin films: A route to metamaterials at optical frequencies
THIN SOLID FILMS, 2011, 519(9), 2650-2654.
Web of Science® Times Cited: 1 |
Blaine Johs, Hans Arwin, Thomas Wagner, David Appel and Dimitrios Peros
Accuracy of color determination from spectroscopic ellipsometry measurements
THIN SOLID FILMS, 2011, 519(9), 2711-2714.
Web of Science® Times Cited: 2 |
A A Wronkowska, Hans Arwin, F Firszt, S Legowski, A Wronkowski and L Skowronski
Optical spectra of Zn1-xBexTe mixed crystals determined by IR-VIS-UV ellipsometry and photoluminescence measurements
THIN SOLID FILMS, 2011, 519(9), 2795-2800.
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Iryna Valyukh, S V Green, C G Granqvist, G A Niklasson, Sergiy Valyukh and Hans Arwin
Optical properties of thin films of mixed Ni-W oxide made by reactive DC magnetron sputtering
THIN SOLID FILMS, 2011, 519(9), 2914-2918.
Web of Science® Times Cited: 2 |
S Tumenas, V Karpus, Hans Arwin and W Assmus
Optical conductivity of fci-ZnMgRE quasicrystals
THIN SOLID FILMS, 2011, 519(9), 2951-2954.
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Thomas W H Oates, Mukesh Ranjan, Stefan Facsko and Hans Arwin
Highly anisotropic effective dielectric functions of silver nanoparticle arrays
OPTICS EXPRESS, 2011, 19(3), 2014-2028.
Web of Science® Times Cited: 13 |
S Tumenas, I Kasalynas, V Karpus and Hans Arwin
Infrared Reflectance Kramers--Kronig Analysis by Anchor-Window Technique
ACTA PHYSICA POLONICA A, 2011, 119(2), 140-142.
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Arturo Mendoza-Galvan, M Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
Spectroscopic ellipsometry study on the dielectric function of bulk Ti2AlN,Ti2AlC, Nb2AlC, (Ti0.5,Nb0.5)2AlC, and Ti3GeC2 MAX-phases
Journal of Applied Physics, 2011, 109, 013530.
Fulltext Web of Science® Times Cited: 2 |
Torun Berlind, Pentti Tengvall, Lars Hultman and Hans Arwin
Protein adsorption on thin films of carbon and carbon nitride monitored with in situ ellipsometry
ACTA BIOMATERIALIA, 2011, 7(3), 1369-1378.
Fulltext Web of Science® Times Cited: 6 |
Sergiy Valyukh, Iryna Valyukh, V Chigrinov, H S Kwok and Hans Arwin
Liquid crystal light deflecting devices based on nonuniform anchoring
APPLIED PHYSICS LETTERS, 2010, 97(23), 231120.
Fulltext Web of Science® Times Cited: 2 |
R Rehammar, Roger Magnusson, A I Fernandez-Dominguez, Hans Arwin, J M Kinaret, S A Maier and E E B Campbell
Optical properties of carbon nanofiber photonic crystals
NANOTECHNOLOGY, 2010, 21(46), 465203.
Fulltext Web of Science® Times Cited: 2 |
Gunilla Wingqvist, Ferenc Tasnadi, Agne Zukauskaite, Jens Birch, Hans Arwin and Lars Hultman
Increased electromechanical coupling in w-ScxAl1-xN
Applied Physics Letters, 2010, 97(11), 112902.
Fulltext Web of Science® Times Cited: 11 |
I Valyukh, S Green, Hans Arwin, G A Niklasson, E Wackelgard and C G Granqvist
Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2010, 94(5), 724-732.
Web of Science® Times Cited: 16 |
Torun Berlind, Michal Poksinski, Pentti Tengvall and Hans Arwin
Formation and cross-linking of fibrinogen layers monitored with in situ spectroscopic ellipsometry
Colloids and Surfaces B, 2010, 75(2), 410-417.
Fulltext Web of Science® Times Cited: 8 |
Arturo Mendoza-Galvan, Kenneth Järrendahl, Hans Arwin, Yi-Fan Huang, Li-Chyong Chen and Kuei-Hsien Chen
Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching
APPLIED OPTICS, 2009, 48(26), 4996-5004.
Web of Science® Times Cited: 2 |
Hans Arwin and D.E. Aspnes
Follow the light: Ellipsometry and polarimetry
Physics Today, 2009, 62(5), 70-71.
Fulltext Web of Science® Times Cited: 1 |
Torun Berlind, Andrej Furland, Zs. Czigany, Jörg Neidhardt, Lars Hultman and Hans Arwin
Spectroscopic ellipsometry characterization of amorphous carbon and amorphous,graphitic and fullerene-like carbon nitride thin films
Thin Solid Films, 2009, 517(24), 6652-6658.
Fulltext Web of Science® Times Cited: 3 |
Vytautas Karpus, Gintautas-Jurgis Babonas, Alfonsas Reza, Saulius Tumenas, Hans Arwin, Wolf Assmus and Stefan Bruehne
Optical response of si-ZnMgHo quasicrystal
ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2009, 224(1-2), 39-41.
Web of Science® Times Cited: 1 |
Iryna Valyukh, Hans Arwin, Vladimir Chigrinov and Sergiy Valyukh
UV-induced in-plane anistropy in layers of mixture of the azo-dyes SD-1/SDA-2 characterized by spectroscopic ellipsometry
Physica status solidi, 2008, 5, 1274-1277.
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Christina Åkerlind, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions
Physica status solidi, 2008, 5, 1089-1092.
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Henrik Wiklund, Hans Arwin and Kenneth Järrendahl
A FEM-based application for numerical calculations of ellipsometric data
Physica status solidi, 2008, 4, 945-948.
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Nilton Souxa Dantas, Hans Arwin, Gabriel Nzulu, Paulo Henrique de Olivera Rappl, Antonio Ferreira da Silva and Clas Persson
Optical characterization of rocksalt Pb1-xSnxTe alloys
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Hans Arwin, Michal Poksinski and Knut Johansen
Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions
Physica Status Solidi (a) applications and materials science, 2008, 205(4), 817-820.
Web of Science® Times Cited: 9 |
B. Gallas, J. Rivory, Hans Arwin, F. Vidal and V.H. Etgens
Changes in optical properties of MnAs thin films on GaAs(001) induced by a- to B-phase transition
Physica status solidi, 2008, 4, 859-862.
Web of Science® Times Cited: 4 |
B. Gallas, J. Rivory, Hans Arwin, F. Vidal and M. Stchakovsky
Monitoring the a to B-phase transition in MnAs/GaAs(001) thin films as funcion of temperature
Physica status solidi, 2008, 4, 863-866.
Web of Science® Times Cited: 5 |
A.A. Wronkowska, L. Skowronski, A. Wronkowski, F. Firszt, H. Meczynska, S. Legowski, K. Strzalkowski and Hans Arwin
Spectroscopic ellipsometry and photoluminescence investigation of Zn1-x-yBexMgySe and Cd1-x-yBexZnySe Crystals
Physica status solidi, 2008, 4, 854-858.
Web of Science® Times Cited: 4 |
Jimmy W.P. Bakker, Hans Arwin, Ingemar Lundström and Daniel Filippini
Immunodetection using computer screen photo-assisted ellipsometry
Physica status solidi, 2008, 5, 1431-1433.
Web of Science® Times Cited: 2 |
Hans Arwin, Agneta Askendal, Pentti Tengvall, Daniel W. Thompson and John A. Woollam
Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers
Physica status solidi, 2008, 5, 1438-1441.
Web of Science® Times Cited: 3 |
M. Campoy-Quiles, J. Nelson, P.G. Etchegoin, D.D.C. Bradley, V Zhokhavets, G. Gobsch, H. Vaughan, A, Monkman, Olle Inganäs, Nils-Krister Persson, Hans Arwin, M. Garriga, M.I. Alonso, G. Herrmann, M. Becker, W. Scholdei, M. Jahja and C. Bubeck
On the determination of anistropy in polymer thin films: A comparative study of optical techniques
Physica status solidi, 2008, 5, 1270-1273.
Web of Science® Times Cited: 4 |
A.A. Wronskowska, Hans Arwin, A. Bukaluk, L. Skowronski, M. Trzcinski, K. Okulewicz and A. Wronkowksi
IR-VIS-UV ellipsometry, XRD and AES investigation of In/Cu and In/Pd thin films
Physica status solidi, 2008, 5, 1141-1144.
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A.A. Wronkowska, L. Skowronski, A. Wronkowski, L. Zielinski, F. Firszt, A. Marasek, W. Paszkowicz and Hans Arwin
Lattice absorption of Be-containing semiconductor alloys determined by spectroscopic ellipsometry
Physica status solidi, 2008, 4, 849-853.
Web of Science® Times Cited: 4 |
Torun Berlind, G. K. Pribi, D. Thompson, J. O. Woollam and Hans Arwin
Effects of ion concentration on refractive indices offluids measured by the minimum deviation technique
Physica Status Solidi. C, Current topics in solid state physics, 2008, 5(5), 1249-1252.
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Iryna Valyukh, Hans Arwin, Vladimir Chigrinov and Sergiy Valyukh
UV-induced in-plane anisotropy in layers of mixture of the azo-dyes SD-1/SDA-2 characterized by spectroscopic ellipsometry
Physica Status Solidi. C, Current topics in solid state physics, 2008, 5(5), 1274-1277.
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Vanya Darakchieva, T. Paskova, M. Schubert, Plamen Paskov, Hans Arwin, Bo Monemar, D. Hommel, M. Heuken, J. Off, B.A. Haskell, P.T. Fini, J.S. Speck and S. Nakamura
Effect of anisotropic strain on phonons in a-plane and c-plane GaN layers
Journal of Crystal Growth, 2007, 300(1), 233-238.
Web of Science® Times Cited: 4 |
Martina Levin, Per Wiklund and Hans Arwin
Adsorption and film growth of N-methylamino substituted triazoles on copper surfaces in dydrocarbon media
Applied Surface Science, 2007, 254, 1528-1533.
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Michal Poksinski and Hans Arwin
Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces
Optics Letters, 2007, 32(10), 1308-1310.
Web of Science® Times Cited: 15 |
Vanya Darakchieva, Tanja Paskova, M. Schubert, Hans Arwin, Plamen Paskov, Bo Monemar, D. Hommel, J. Off, F. Scholz, M. Heuken, B.A. Haskell, P.T. Fini, S.J. Speck and S. Nakamura
Anisotropic strain and phonon deformation potentials in GaN
Physical Review B. Condensed Matter and Materials Physics, 2007, 75(19), 195217.
Web of Science® Times Cited: 40 |
Iryna Valyukh, Sergiy Valyukh, Hans Arwin and Vladimir Chigrinov
Characteristic functions for uniformly twisted birefringent media
Journal of Applied Physics, 2007, 102(6), .
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Vanya Darakchieva, Tanja Paskova, Plamen Paskov, Hans Arwin, M Schubert, Bo Monemar, S Figge, D Hommel, BA Haskell, PT Fini and S Nakamura
Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
Physica status solidi. B, Basic research, 2006, 243(7), 1594-1598.
Web of Science® Times Cited: 2 |
Masato Tazawa, Hiroshi Kakiuchida, Gang Xu, Ping Jin and Hans Arwin
Optical constants of vacuum evaporated SiO film and an application
Journal of Electroceramics, 2006, 16(4), 511-515.
Web of Science® Times Cited: 10 |
Hans Arwin, M P M A Baroni, M. Ventura Conceicao, R.R. Rosa, C. Persson, E.F. da Silva Jr, L.S. Roman, O. Nakamura, I. Pepe and A. Ferreira da Silva
Optical and morphological properties of porous diamond-like-carbon films deposited by magnetron sputtering
Journal of Non-Crystalline Solids, 2006, 352( 32-35), 3734-3738.
Web of Science® Times Cited: 2 |
Hans Arwin, A A Wronkowska, F Firszt, A Wronkowski, M Wakula, K Strzalkowski and W Paszkowicz
Characterisation of Cd1-x-yZnxBeySe crystals by spectroscopic ellipsometry and luminescence
Physica Status Solidi. C, Current topics in solid state physics, 2006, , 1193-1196.
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Jimmy W.P. Bakker, Hans Arwin, Ingemar Lundström and Daniel Filippini
Computer screen photo-assisted off-null ellipsometry
Applied Optics, 2006, 45(30), 7795-7799.
Web of Science® Times Cited: 10 |
Hans Arwin, Linda Karlsson, A. Kozarcanin, D.W. Thompson, T. Tiwald and J.A. Woollam
Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry
Physica status solidi. A, Applied research, 2005, 202, 1688-1692.
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Linda Karlsson, Hans Arwin, Mattias Schubert and N. Ashkenov
Adsorption of human serum albumin in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
Physica status solidi, 2005, 2, 3293-3297.
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Nils-Krister Persson, Hans Arwin and Olle Inganäs
Optical optimization of polyfluorene-fullerene blend photodiodes
Journal of Applied Physics, 2005, 97(3), 034503-1-034503-8.
Web of Science® Times Cited: 60 |
Hans Arwin, Theeraphon Piacham, Åsa Josell, Virapong Prachayasittikul and Lei Ye
Molecularly imprinted polymer thin films on quartz crystal microbalance using a surface bound photo-radical initiator
Analytica Chimica Acta, 2005, 536, 191-196.
Web of Science® Times Cited: 34 |
Irina Buyanova, Morteza Izadifard, A. Kasic, Hans Arwin, Weimin Chen, H. P. Xin, Y. G. Hong and C. W. Tu
Analysis of band anticrossing in GaNxP1-x alloys
Physical review. B, Condensed matter and materials physics, 2004, 70, 085209.
Web of Science® Times Cited: 16 |
Linda Karlsson, Mattias Scubert, N. Ashkenov and Hans Arwin
Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
Elsevier Science, 2004, 455-456, 726-730.
Web of Science® Times Cited: 19 |
A.A. Wronkowska, K. Bejtka, Hans Arwin, A. Wronkowski, F. Firszt, S. Legowski, H Meczynska and A. Marasek
IR ellipsometry and photoluminescence investigations of ZN1-xBexSe and Zn1-x-yBexMnySe mixed crystals
Elsevier Science, 2004, 455-456, 256-260.
Web of Science® Times Cited: 5 |
Michal Poksinski and Hans Arwin
Protein monolayers monitored by internal reflection ellipsometry
Thin Solid Films, 2004, 455-456, 716-721.
Web of Science® Times Cited: 51 |
Mattias Schubert, C. Bundesmann, G. Jacopic, H. Maresch, Hans Arwin, Nils-Krister Persson, Fengling Zhang and Olle Inganäs
Infrared ellipsometry characterization of conducting thin organic films
Elsevier Science, 2004, 455-456, 295-300.
Web of Science® Times Cited: 7 |
Mattias Schubert, C. Bundesmann, G. Jacopic, H. Maresch and Hans Arwin
Infrared dielectric function and vibrational modes of pentacene thin films
Applied Physics Letters, 2004, 84(2), 200-202.
Web of Science® Times Cited: 11 |
Michael Tulldahl, K. Ove Steinvall and Hans Arwin
Simulation of sea surface wave influence on small target detection with airborne laser depth sounding
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Web of Science® Times Cited: 5 |
Guoliang Wang, Hans Arwin and Roger Jansson
Optimization of off-null ellipsometry in sensor applications
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Web of Science® Times Cited: 7 |
M. Tazawa, G. Xu, P. Jin and Hans Arwin
A memory application of light reflection from anisotropic microstructured thin films
Elsevier Science, 2004, 455-456, 824-827.
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O.P.A. Lindquist, Mattias Schubert, Hans Arwin and Kenneth Järrendahl
Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
Elsevier Science, 2004, 455-456, 235-238.
Web of Science® Times Cited: 1 |
Hans Arwin, Michal Poksinski and Knut Johansen
Total internal reflection ellipsometry: principles and applications
Applied Optics, 2004, 43(15), 3028-3036.
Web of Science® Times Cited: 65 |
A.A. Wronkowska, Hans Arwin, M. Trzcinski, A. Wronkowski, M. Rozwadowski and A. Bukaluk
Ellipsometric and AES investigation of thin polycrystaline In/Cu and In/Ag couples
Elsevier Science, 2004, 74, 163-167.
Web of Science® Times Cited: 5 |
Mattias Schubert, C. Bundesmann, H. v. Wenckstern, G. Jakopic, A. Haase, Nils-Krister Persson, Fengling Zhang, Hans Arwin and Olle Inganäs
Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry
Applied Physics Letters, 2004, 84, 1311-1313.
Web of Science® Times Cited: 11 |
Jimmy. W. P. Bakker, G. Bryntse and Hans Arwin
Determination of refractive index of printed and unprinted paper using spectroscopic ellipsometry.
Thin Solid Films, 2004, 455-456, 361-365.
Web of Science® Times Cited: 3 |
Guoliang Wang, Hans Arwin and Roger Jansson
Optimization of azimuth angle settings in polarizer-compensator-sample-analyzer off-null ellipsometry
Applied Optics, 2003, 42(1), 38-44.
Web of Science® Times Cited: 10 |
J Isidorsson, IAME Giebels, Hans Arwin and R Griessen
Optical properties of MgH2 measured in situ by ellipsometry and spectrophotometry
Physical Review B. Condensed Matter and Materials Physics, 2003, 68(11), .
Web of Science® Times Cited: 70 |
N. Ashkenov, B.N. Mbenkum, C. Bundesmann, V. Riede, M. Lorenz, D. Spemann, E.M. Kaidashev, A. Kasic, M. Schubert, M. Grundmann, G. Wagner, H. Neumann, Vanya Darakchieva, Hans Arwin and Bo Monemar
Infrared dielectric functions and phonon modes of high-quality ZnO films
Journal of Applied Physics, 2003, 93(1), 126-133.
Web of Science® Times Cited: 248 |
Laila Karlsson, Pentti Tengvall, Ingemar Lundström and Hans Arwin
Penetration and loading of human serum albumin in porous silicon layers with different pore sizes and thicknesses
Journal of Colloid and Interface Science, 2003, 266(1), 40-47.
Web of Science® Times Cited: 34 |
Michal Poksinski and Hans Arwin
In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry
Sensors and actuators. B, Chemical, 2003, 94(3), 247-252.
Web of Science® Times Cited: 16 |
Michal Poksinski, Hasan Dzuho and Hans Arwin
Copper corrosion monitoring with total internal reflection ellipsometry
Journal of the Electrochemical Society, 2003, 150(11), B536-B539.
Web of Science® Times Cited: 4 |
Guoliang Wang, Hans Arwin and Roger Jansson
An optical gas sensor based on ellipsometric readout
IEEE Sensors Journal, 2003, 3(6), 739-743.
Web of Science® Times Cited: 6 |
Guoliang Wang and Hans Arwin
Return-path ellipsometry in gas sensing
Measurement science and technology, 2003, 15, 216-220.
Web of Science® Times Cited: 2 |
V. Darakchieva, Plamen Paskov, Mattias Schubert, Tanja Paskova, Hans Arwin, Bo Monemar, H. Amano and I. Akasaki
Strain evolution and phonons in AlN/GaN superlattices
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Jimmy W. P. Bakker, Hans Arwin, Guoliang Wang and K. Järrendahl
Improvement of porous silicon based gas sensors by polymer modification
Physica Status Solidi (A), 2003, 197(2), 378-381.
Web of Science® Times Cited: 13 |
Guoliang Wang and Hans Arwin
Modification of vapor sensitivity in ellipsometric gas sensing by copper deposition in porous silicon
Sensors and actuators. B, Chemical, 2002, 85(1-2), 95-103.
Web of Science® Times Cited: 9 |
Laila Karlsson, Pentti Tengvall, Ingemar Lundström and Hans Arwin
Back-side etching A tool for making morphology gradients in porous silicon
Journal of the Electrochemical Society, 2002, 149(12), .
Web of Science® Times Cited: 12 |
R. Ahuja, Hans Arwin, Silva A.F. Da, C. Persson, J.M. Osorio-Guillen, De Almeida J. Souza, C.M. Araujo, E. Veje, N. Veissid, C.Y. An, I. Pepe and B. Johansson
Electronic and optical properties of lead iodide
Journal of Applied Physics, 2002, 92(12), 7219-7224.
Web of Science® Times Cited: 22 |
Hans Arwin
Spectroscopic ellipsometry for characterization and monitoring of organic layers
Physica status solidi. A, Applied research, 2001, 188(4), 1331-1338.
Web of Science® Times Cited: 5 |
C. Wongmanerod, S. Zangooie and Hans Arwin
Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry
Applied Surface Science, 2001, 172(1-2), 117-125.
Web of Science® Times Cited: 41 |
A. Bukaluk, A.A. Wronkowska, A. Wronkowski, Hans Arwin, F. Firszt, S. Legowski, H. Meczynska and J. Szatkowski
Auger electron spectroscopy, ellipsometry and photoluminescence investigations of Zn1-XBeXSe alloys
Applied Surface Science, 2001, 175-176, 531-537.
Web of Science® Times Cited: 4 |
S. Zangooie and Hans Arwin
Surface, Pore Morphology, and Optical Properties of Porous 4H-SiC
Journal of the Electrochemical Society, 2001, 148(6), .
Web of Science® Times Cited: 7 |
Roger Jansson, S. Zangooie, T. Kugler and Hans Arwin
Optical and microstructural characterization of thin films of photochromic fulgides
Journal of Physics and Chemistry of Solids, 2001, 62(7), 1219-1228.
Web of Science® Times Cited: 7 |
Hans Arwin
Is ellipsometry suitable for sensor applications?
Sensors and Actuators A-Physical, 2001, 92(1-3), 43-51.
Web of Science® Times Cited: 40 |
Annika Rantzer, Hans Arwin, Jens Birch, B. Hjörvarsson, J.W.P. Bakker and Kenneth Järrendahl
Optical properties of intrinsic and doped a-Si:H films grown by d.c. magnetron sputter deposition
Thin Solid Films, 2001, 394(1-2), 255-262.
Web of Science® Times Cited: 4 |
Roger Jansson, S Zangooie, Hans Arwin and Kenneth Järrendahl
Characterization of 3C-SiC by spectroscopic ellipsometry
Physica status solidi. B, Basic research, 2000, 218(1), R1-R2.
Web of Science® Times Cited: 6 |
S Zangooie, Per Persson, JN Hilfiker, Lars Hultman and Hans Arwin
Microstructural and infrared optical properties of electrochemically etched highly doped 4H-SiC
Journal of Applied Physics, 2000, 87(12), 8497-8503.
Web of Science® Times Cited: 23 |
K Johansen, Hans Arwin, Ingemar Lundström and Bo Liedberg
Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations
Review of Scientific Instruments, 2000, 71(9), 3530-3538.
Web of Science® Times Cited: 92 |
S Zangooie, JA Woollam and Hans Arwin
Self-organization in porous 6H-SiC
Journal of Materials Research, 2000, 15(9), 1860-1863.
Web of Science® Times Cited: 15 |
Hans Arwin, M Gavutis, J Gustafsson, M Schultzberg, S Zangooie and Pentti Tengvall
Protein adsorption in thin porous silicon layers
Physica status solidi. A, Applied research, 2000, 182(1), 515-520.
Web of Science® Times Cited: 34 |
S Zangooie and Hans Arwin
Porous anodic 4H-SiC: Thickness dependent anisotropy in pore propagation and ellipsometric characterization
Physica status solidi. A, Applied research, 2000, 182(1), 213-219.
Web of Science® Times Cited: 5 |
S Zangooie, Hans Arwin, Ingemar Lundström and Anita Lloyd-Spets
Ozone treatment of SiC for improved performance of gas sensitive Schottky diodes
Materials Science Forum, 2000, 338-3, 1085-1088.
Web of Science® Times Cited: 20 |
OPA Lindquist, Hans Arwin, Urban Forsberg, JP Bergman and Kenneth Järrendahl
Optical characterization of 4H-SiC by variable angle of incidence spectroscopic ellipsometry
Materials Science Forum, 2000, 338-3, 575-578.
Web of Science® Times Cited: 2 |
Hans Arwin
Ellipsometry on thin organic layers of biological interest: Characterization and applications
Thin Solid Films, 2000, 377-378, 48-56.
Web of Science® Times Cited: 78 |
Å. A. Johansson, Kenneth Järrendahl, Jens Birch, B. Hjörvarsson and Hans Arwin
Intrinsic, n- and p-doped a-Si:H thin films grown by DC magnetron sputtering with doped targets
Materials Research Society Symposium Proceedings, 1999, 557, 31-36.
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Chapters in Books
Conference Articles
Sergiy Valyukh, Hans Arwin, Christina Åkerlind and Kenneth Järrendahl
Simulation of light scattering from biological helicoidal structures
7th Workshop Ellipsometry, 2012.
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Sergiy Valyukh, Hans Arwin and Kenneth Järrendahl
Light Scattering and Colour Generation in exoskeletons of Jewelled Beetle
Photonics Global Conference, 2012.
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Jonas Bergqvist, Hans Arwin and Olle Inganäs
Determination of optical constants and phase transition temperatures in polymer fullerene thin films for polymer solar cells
7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.
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Jonas Bergqvist, Hans Arwin and Olle Inganäs
In situ reflectance imaging of organic thin film formation from solution
5th International Symposium Technologies for Polymer Electronics (TPE 2012), May 22-24, 2012, Rudolstadt, Germany, 2012.
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Jonas Bergqvist, Kristofer Tvingstedt, Hans Arwin and Olle Inganäs
In situ reflectance imaging of organic thin film formation from solution
The 4th international Conference on Hybrid and Organic Photovoltaics, HOPV12, May 6-9, 2012, Uppsala, 2012.
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Lia Fernández del Río, Hans Arwin, Jan Landin, Roger Magnusson and Kenneth Järrendahl
A Mueller Matrix Spectroscopic Ellipsometry Study of Scarab Beetles of the Chrysina Genus
7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.
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Eloy Guadalupe Muñoz-Pineda, Arturo Mendoza-Galván, Reina Araceli Mauricio-Sánchez, Jan Landin, Kenneth Järrendahl and Hans Arwin
Polarization properties and structural color of the scarab beetle Cotinis mutabilis (Mayatl)
XXI International Materials Research Congress (IMRC 2012), August 12 - 17, 2012, Cancun, Mexico, 2012.
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Hans Arwin
Analysis of photonic structures in beetles using Mueller-matrix data
7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.
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Hans Arwin, Blaine Johs and Kenneth Järrendahl
Analysis of Mueller-matrix data from chiral structures in exoskeletons of scarab beetles
E-MRS 2012 Spring meeting, May 14-18, 2012, Strasbourg, France, 2012.
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Hans Arwin
Structural and optical properties of chiral natural photonic structures determined from spectroscopic Mueller-matrix data
E-MRS 2012 Fall Meeting, 2012.
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Hans Arwin, Torun Berlind, Jens Birch, Lia Fernández del Río, Johan Gustafson, Jan Landin, Roger Magnusson, Christina Åkerlind and Kenneth Järrendahl
Polarization effects in reflection from the cuticle of scarab beetles studied by spectroscopic Mueller-matrix ellipsometry
AES 2012, Advanced Electromagnetics Symposium, 2012.
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Hans Arwin
Polarized reflection and nanostructure in scarab beetles studied by spectroscopic Mueller-matrix ellipsometry
XXI International Materials Research Congress (IMRC 2012), August 12 - 17, 2012, Cancun, Mexico, 2012.
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Kenneth Järrendahl, Jens Birch, Roger Magnusson, Ching-Lien Hsiao, Per Sandström, Torun Berlind, Johan L.I. Gustafson, Lia Fernández del Río, Jan Landin and Hans Arwin
Polarization of Light Reflected from Chiral Structures - Calculations Compared with Mueller Matrix Ellipsometry Measurements on Natural and Synthetic Samples
7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.
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Hans Arwin, Kenneth Järrendahl, Jan Landin, J. Boulenquez and S. Berthier
Ellipsometry applied to natural biophotonic structures: a review
1st European Workshop on Polarization Based Optical Techniques in Biology and Bedicine, massy, 30-31 March, 2009, 2009.
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Kenneth Järrendahl, Jan Landin and Hans Arwin
Mueler-Matrix Ellipsometry Studies of Optically Active Structures in Scarab Beerles (conf. France)
First NanoCharm Workshop on Advanced Polarimetric Instrumentation, Palaiseay, France, 7-9, Dec. 2009, 2009.
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Kenneth Järrendahl, Jan Landin and Hans Arwin
Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab Beetles
AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13, 2009, 2009.
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Arturo Mendoza-Galvan, Marcin Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum
Spectroscopic Ellipsometry of Bulk MAS-phases
AVS 56th Int. Symp. & Exhibition, San Jose, CA ,USA, November 8-13, 2009, 2009.
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Kenneth Järrendahl, Jan Landin and Hans Arwin
Mueller-Matrix Ellipsometry Studies of Optically Active Structures in Scarab
AVS 56th Int. Symp. & Exhibition, San José, CA USA, November 8-13 2009, 2009.
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Roger Magnusson, Robert Rehammar and Hans Arwin
Lattices of Freestanding Carbon Nanofibres Characterized by Spectroscopic Ellipsometry
AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13, 2009, 2009.
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Hans Arwin
Spectroscopic Ellipsometry on Protein layers: Characterization and Sensor applications
AVS 56th Int. Symp. & Exhibition, San Jose, CA, USA, November 8-13 2009, 2009.
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Hans Arwin, Kenneth Järrendahl, Jan Landin, J. Boulenquez and S. Berthier
Optical activity in the cuticle of the beetle Cetonia aurata studied by Mueller-matrix ellipsometry
1st European Workshop on Polarization Based Optical Techniques in Biology and Bedicine, massy, 30-31 March, 2009, 2009.
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Hans Arwin, A. Mendoza-Galván, Kenneth Järrendahl, A. Dmitriev, T. Pakizeh and M. Käll
Artificial Magnetism in Gold-Silica-Gold Metamaterials - an ellipsometric Study
5th Workshop Ellipsometry, Zweibrücken, Germany March 2-4, 2009, 2009.
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Hans Arwin
Characterization of Metamaterials with Ellipsometry
5th Workshop ellipsometry, Zweibrücken, Germany March 2-4 2009, 2009.
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Iryna Valyukh, S. Green, Hans Arwin, G.A. Niklasson, Ewa Wäckelgård and C.G. Granqvist
Optical Properties of Amorphous Tungsten Osice Films Deposited by Reactive DC magnetron sputtering
5th Workshop ellipsometry, Zweibrücken, Germany, March 2-4, 2009.
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Christina Åkerlind, Hans Arwin, Fredrik L.E. Jakobsson, Hans Kariis and Kenneth Järrendahl
Optical Properties and Switching of a Rose Bengal Derivativ
5th Workshop ellipsometry, Zweibrücken, Germany, March 2-4 2009, 2009.
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Hans Arwin, Jan Landin, Kenneth Järrendahl, J Boulenguez and S. Berthier
Optical Activity in the Cuticle of the Beetle Cetonia Aurata
5th Workshop Ellipsometry, Zweibrücken, Germany, March 2-4 2009, 2009.
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Arturo Mendoza-Galván, Kenneth Järrendahl, Hans Arwin, I.F. Huang and K.H Chen
Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching
5th Workshop Ellipsometry, Zweibrücken, Germany, 2009.
Web of Science® Times Cited: 2
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Hans Arwin, Jan Landin and Kenneth Järrendahl
Optical activity in the cuticle of the beetle Cetonia aurata
Optikdagen 2008,2008, 2008.
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Hans Arwin, Jan Landin and Kenneth Järrendahl
Optical active cuticle structures in the beetle Cetonia aurata
European Optical Society Meeting 2008,2008, 2008.
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Christina Åkerlind, Hans Arwin, Fredrik Jakobsson, Hans Kariis and Kenneth Järrendahl
Optical properties and switching of a rose bengal derivative studied by spectroscopic ellipsometry
European Optical Society Meeting 2008,2008, 2008.
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Hans Arwin, Jan Landin and Kenneth Järrendahl
Spectral confinement of circularly polarized reflection from the cuticle of Cetonia aurata measured by spectroscopic Mueller-matrix ellipsometry
E-MRS,2008, 2008.
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V. Karpus, G-J. Babonas, A. Reza, S. Tumenas, Hans Arwin, NN Wassmus and S. Brühne
Optical responce of si-ZnMgHo quasicrystal
10th International Conference on Quasicrystals,2008, 2008.
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L. Skowronski, A.A. Wronkowska, A. Wronkowski, F. Firszt, H. Meczynska, S, Legowski, K. Strzalkowski and Hans Arwin
Spectroscopic Ellipsometry and Photoluminescence Investigation of Zn1!x!yBexMgySe and Cd1-x-yBexZnySe Crystals
4th Internationa Conference on Spectroscopic Ellipsometry,2007, 2007.
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L. Skowronski, A.A. Wronkowska, A. Wronkowski, L. Zielinski, F. Firszt, A. Marasek, W. Paszkowics and Hans Arwin
Lattice absorption of Be-containing semiconductor alloys determined by spectroscopic ellipsometry
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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N.S. Dantas, Hans Arwin, G. Nzulu, P.H.O. Rappl, Antonio Ferreira da Silva and C. Persson
Optical characterization of rocksalt pb1-xSnxTe alloys
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Hans Arwin, Agneta Askendal, Pentti Tengvall, Daniel W. Thompson and John A. Woollam
Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
Protein Adsorption on Carbon Nitride Films Studied with in situ Ellipsometry
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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B. Gallas, J. Rivory, Hans Arwin, F. Vidal, V. Etgens and M. Stchakovsky
Monitoring the a to B phase transition in MnAs/GaAs (001) thin films as function of temperature
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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I. Valyukh, Hans Arwin and V. Chiginov
UV-induced in-plane anistropy in layers of mixtures of the azo-dyes SD1/SD2 characterized by spectroscopic ellipsometry
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Torun Berlind, G.K. Pribil, Daniel W. Thompson, John A. Woollam and Hans Arwin
Effects of Ion Concentration on Refractive Indices of Fluids Measured by the Minimum Deviation Technique
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
Web of Science® Times Cited: 6
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Christina Nilsson, A. Jänis, Hans Kariis, Hans Arwin and Kenneth Järrendahl
Combining Spectroscopic Ellipsometry and Vector Network Analysis to obtain Electromagnetic Response in a Wide Wavelength Region
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Julie Boulenguez, Hans Arwin, Kenneth Järrendahl and Serge Berthier
Ellipsometric study of photonic structures in wing scales of butterflies
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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M. Campoy-Quiles, J. Nelson, D.D.C. Bradley, V. Zhokhavets, G. Gobsch, H. Vaughan, A. Monkman, Olle Inganäs, Hans Arwin, M.I. Alonso, M. Garriga, G. Herrmann, M. Becker, W. Scholdei, M. Jahja and C. Bubeck
On the determination of anisotropy in polymer thin films: A comparative study of optical techniques
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Hans Arwin, Michal Poksinski and Knut Johansen
Enhancement in ellipsometric thin film sensivity near surface plasmon resonance conditions
4th Internations Conference on Spectroscopic Ellipsometry,2007, 2007.
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Daniel W. Thompson, L.G. Castro, Hans Arwin, G. Pfeiffer, T.E. Tiwald and J.A. Woollam
Effects of temperature fluctuations at solid liquid interfaces on ellipsometric and surface plasmon resonance measurements
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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A.A. Wronkowska, A. Wronkowski, A. Bukaluk, L. Skowronski, M. Trzcinski, K. Okulewics and Hans Arwin
IR-UV ellipsometry, XRD and AES investigation of In/Cu and In/Pd thin films
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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B. Gallas, J. Rivory, Hans Arwin, F. Vidal and V. Etgens
Changes in optical properties of MnAs thin films on GaAs (001) induced by a to B phase transitions
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Henrik Wiklund, Hans Arwin and Kenneth Järrendahl
A FEM-based application for numerical calculations of ellipsometric data: A tool for analysis of advanced optical structures
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Jimmy Bakker, Hans Arwin, Ingemar Lundström and Daniel Filippini
Immunodetection using computer screen photo-assisted ellipsometry
4th International Conference on Spectroscopic Ellipsometry,2007, 2007.
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Hans Arwin, Julie Boulenguez, Kenneth Järrendahl and Serge Bertier
Ellipsometric study of photonic structures in wing scales of butterflies
Optik i Sverige,2007, 2007.
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Hans Arwin
Analysis of protein layer structure using real-time ellipsometry
Deutsche Physikalische Gesellschaft DPG Srping Meeting,2007, 2007.
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Iryna Valyukh, Hans Arwin, Vladimir Chigrinov and Sergiy Valyukh
Characterization of the Photo-Alignment Material SD-1/SDA-2 with Spectroscopic Ellipsometry
<em></em>14th International Display Workshops, 2007, 2007.
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Hans Arwin, Sabyasachi Sarkar and J. Woollam
Investigation of the use of IR ellipsometry for the detection of biological molecules
American Vacuum Society 53 Int Symposium,2006, 2006.
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Hans Arwin, D.W. Thompson and J.A. Woollam
Temperature Stability of Protein Monolayers Studied by Ellipsometry in the Infrared, Visible and Ultraviolet Spectral Regions
American Vacuum Society 53 Int Symposium,2006, 2006.
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Hans Arwin, Henrik Wiklund and Kenneth Järrendahl
Calculation of optical properties of complex surface structures using FEM
Optikdagen 2006,2006, 2006.
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Hans Arwin and Kenneth Järrendahl
Ellipsometric studies of the wings of the butterfly Morpho rhetenor
Optikdagen 2006,2006, 2006.
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Torun Berlind, G. Pribil, D. Thompson, J.A. Woollam and Hans Arwin
Effects of Ion Concentration on Refractive Indices of Fluids Measured by the Minimum Deviation Technique
Optikdagen 2006,2006, 2006.
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Hans Arwin, Henrik Wiklund and Kenneth Järrendahl
Calculation of optical properties of complex surface structures using FEM
European Optical Society Annual Meeting,2006, 2006.
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Hans Arwin and K. Järrendahl
Ellipsometric studies of the wings of the butterfly Morpho rhetenor
European Optical Society Annual Meeting,2006, 2006.
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Hans Arwin, Jimmy Bakker, Ingemar Lundström and Daniel Filippini
A computer as imaging ellipsometer: biosensing at home
Europtrode VIII,2006, 2006.
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Hans Arwin, D.W. Thompson and J.A. Woollam
Infrared Ellipsometry Studies on Protein Layers: Model Dielectric Functions and Temperature Effects
4th Workshop Ellipsometry,2006, 2006.
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Hans Arwin and Michal Poksinski
Total Internal Reflection Ellipsometry: a tool for analysis of ultrathin films on metal surfaces
4th Workshop Ellipsometry,2006, 2006.
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Hans Arwin, Ingemar Lundström, Daniel Filippini and Jimmy Bakker
Computer screen photo-assisted ellipsometry
4th Workshop Ellipsometry,2006, 2006.
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Hans Arwin, Vanya Darakchieva, Tanja Paskova, Plamen Paskov, Bo Monemar, Mattias Schubert, S Figge, D Hommel, B A Haskell, P T Fini and S Nakamura
Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
ICSN-6,2005, 2005.
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Hans Arwin, M Tazawa, H Kakiuchida, G Xu and P Jin
Optical constants of vacuum evaporated SiO film and an application
MRS-ICAM2005,2005, 2005.
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Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
Adsorption of human serum albumin on carbon nitride films studied with in-situ ellipsometry
American Vacuum Society 52 Int Symposium and Exhibition,2005, 2005.
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Hans Arwin, John A. Woollam and Dan W. Thompson
Model dielectric functions for adsorbed protein layers
American Vacumm Society 52 Int Symposium and Exhibition,2005, 2005.
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Hans Arwin, Agneta Askendal, Torun Berlind, Pentti Tengvall, Dan W Thompson, T Tiwald and John A. Woollam
Infrared ellipsometry studies of temperature effects on multilayers of ANTI-human serum albumin and its antigen
E-MRS,2005, 2005.
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Torun Berlind, Michal Poksinski, Lars Hultman, Pentti Tengvall and Hans Arwin
Bioadsorption studies on carbon nitride films using in-situ ellipsometry
E-MRS spring meeting,2005, 2005.
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Irina Buyanova, Morteza Izadifard, A. Kasic, Hans Arwin, Weimin Chen, H.P. Xin, Y.G. Hong and C.W. Tu
Compositional Dependence of conduction band states in GaNP alloys
5th International Conference on Low Dimensional Structures and Devices,2004, 2004.
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Hans Arwin and Michal Poksinski
Protein-Surface Interactions Studied with Internal Reflection Ellipsometry
AVS 51st International Symposium Exhibition,2004, 2004.
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Hans Arwin
Summaries of contributions to the conference of the Swedish Optical Society
Optik i Sverige 2004,2004, 2004.
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Hans Arwin
Porous Semiconductors . Science and Technology
Materials of the 4th International Conference,2004, 2004.
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OPA Lindquist, Hans Arwin, Anne Henry and Kenneth Järrendahl
Infrared optical properties of 3C, 4H and 6H silicon carbide
Materials Science Forum, Vols. 433-436, 2003.
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Laila Karlsson, Pentti Tengvall, Ingemar Lundström and Hans Arwin
Adsorption of human serum albumin in porous silicon gradients
Physica status solidi. A, Applied research, 2003.
Web of Science® Times Cited: 14
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Hans Arwin, Guoliang Wang and Roger Jansson
Gas sensing based on ellipsometric measurement on porous silicon
Physica status solidi. A, Applied research, 2003.
Web of Science® Times Cited: 4
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A.A. Wronkowska, A. Wronkowski, A. Bukaluk, M. Stefanski, Hans Arwin, F. Firszt, S. Legowski, H. Meczynska and K. Hradil
Investigations of Cd1-xMnxTe crystals by means of ellipsometry and Auger electron spectroscopy
Applied Surface Science, 2003.
Web of Science® Times Cited: 5
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Guoliang Wang, Hans Arwin and Roger Jansson
An optical gas sensor based on ellipsometric readout
IEEE Sensors Journal, 2003.
Web of Science® Times Cited: 6
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A.A. Wronkowska, A. Wronkowski, Hans Arwin, F. Firszt, S. Legowski, H. Meczynska and J. Szatkowski
Characterisation of Cd1-xMgxSe solid solutions by spectroscopic ellipsometry
Vacuum, 2001.
Web of Science® Times Cited: 3
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Michal Poksinski, Hasan Dzuho, Jan-Ove Järrhed and Hans Arwin
Total internal reflection ellipsometry
Eurosensors XIV: The 14th European Conference on Solid-State Transducers : Book of Abstracts, 2000.
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S Zangooie, Per Persson, JN Hilfiker, Lars Hultman, Hans Arwin and Qamar Ul Wahab
Microstructural, optical and electronic investigation of anodized 4H-SiC
Materials Science Forum, Vols. 338-342, 2000.
Web of Science® Times Cited: 4
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Ph.D. Theses
* Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.
Ph.D., Lic. Theses
