Publications for Fredrik Eriksson
Co-author map based on ISI articles 2007-
Journal Articles
Simon Olsson, Fredrik Eriksson, Jens Birch and Lars Hultman
Formation of alpha-approximant and quasicrystalline Al-Cu-Fe thin films
Thin Solid Films, 2012, 526, 74-80.
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Manfred Beckers, Fredrik Eriksson, Jonas Lauridsen, C. Baehtz, Jens Jensen and Lars Hultman
Formation of basal plane fiber-textured Ti2AlN films on amorphous substrates
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2010, 4(05-Jun), 121-123.
Web of Science® Times Cited: 1 |
Naureen Ghafoor, Fredrik Eriksson, Arkady Mikhaylushkin, Igor Abrikosov, Eric M. Gullikson, Manfred Beckers, U. Kressing, Lars Hultman and Jens Birch
Effects of O and N impurities on the nanostructural evolution during growth of Cr/Sc multilayers
Journal of Materials Research, 2009, 24(1), 79-95.
Web of Science® Times Cited: 2 |
Naureen Ghafoor, Fredrik Eriksson, Per O.Å Persson, Lars Hultman and Jens Birch
Effects of ion-assisted growth on the layer definition in Cr/Sc multilayers
Thin Solid Films, 2008, 516(6), 982-990.
Fulltext Web of Science® Times Cited: 6 |
Fredrik Eriksson, Naureen Ghafoor, Lars Hultman and Jens Birch
Reflectivity and structural evolution of Cr/Sc and nitrogen containing Cr/Sc multilayers during thermal annealing
Journal of Applied Physics, 2008, 104(6), 063516.
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Naureen Ghafoor, Fredrik Eriksson, Eric M Gullikson, Lars Hultman and Jens Birch
Incorporation of nitrogen in Cr/Sc multilayers giving improved soft x-ray reectivity
Applied Physics Letters, 2008, 92(9), 091913.
Web of Science® Times Cited: 5 |
Fredrik Eriksson, Naureen Ghafoor, F. Schäfers, E. M. Gullikson, S. Aouadi, S. Rohde, Lars Hultman and Jens Birch
Atomic scale interface engineering by modulated ion-assisted deposition applied to soft x-ray multilayer optics
Applied Optics, 2008, 47(23), 4196-4204.
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Fredrik Eriksson, Naureen Ghafoor, Franz Schäfers, Eric M. Gullikson and Jens Birch
Interface engineering of short-period Ni/V multilayer X-ray mirrors
Thin Solid Films, 2006, 500(1-2), 84-95.
Web of Science® Times Cited: 10 |
Naureen Ghafoor, Per O. Å. Persson, Fredrik Eriksson, Franz Schäfers and Jens Birch
Interface engineered ultra-short period Cr/Ti multilayers as high reflectance mirrors and polarizers for soft X-rays of lambda=2.74 nm wavelength
Applied Optics, 2006, 45(1), 137-143.
Web of Science® Times Cited: 2 |
Jens Birch, Torbjörn Joelsson, Fredrik Eriksson, Naureen Ghafoor and Lars Hultman
Single crystal CrN/ScN superlattice soft X-ray mirrors: epitaxial growth, structure, and properties
Thin Solid Films, 2006, 514(1-2), 10-19.
Web of Science® Times Cited: 10 |
H M Hertz, G A Johansson, H Stollberg, J de Groot, O Hemberg, A Holmberg, S Rehbein, P Jansson, Fredrik Eriksson and Jens Birch
Table-top X-ray microscopy: Sources, optics and applications
Journal de Physique IV, 2003, 104, 115-119.
Web of Science® Times Cited: 9 |
Fredrik Eriksson, GA Johansson, HM Hertz, EM Gullikson, U Kreissig and Jens Birch
14.5% near-normal incidence reflectance of Cr/Sc x-ray multilayer mirrors for the water window
Optics Letters, 2003, 28(24), 2494-2496.
Web of Science® Times Cited: 14 |
Fredrik Eriksson, G.A. Johansson, H.M. Hertz and Jens Birch
Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition
Optical Engineering, 2002, 41(11), 2903-2909.
Web of Science® Times Cited: 16 |
G.A. Johansson, M. Berglund, Fredrik Eriksson, Jens Birch and H.M. Hertz
Compact soft x-ray reflectometer based on a line-emitting laser-plasma source
Review of Scientific Instruments, 2001, 72(1 I), 58-62.
Web of Science® Times Cited: 14 |
Conference Articles
Licentiate Theses
Ph.D., Lic. Theses
