Publications for Fredrik Eriksson
Co-author map based on ISI articles 2007-

Keywords

°c x-ray soft si reflectivity quasicrystalline periods nm n multilayers multilayer mirrors magnetron ion incidence flux film energy cr/sc annealing

Journal Articles

Hans Högberg, Lina Tengdelius, Mattias Samuelsson, Fredrik Eriksson, Esteban Broitman, Jun Lu, Jens Jensen and Lars Hultman
  Reactive sputtering of delta-ZrH2 thin films by high power impulse magnetron sputtering and direct current magnetron sputtering
  Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2014, 32(4), 041510.
   Fulltext  PDF  

Simon Olsson, Fredrik Eriksson, Jens Jensen, Magnus Garbrecht, Jens Birch and Lars Hultman
  Structure and Composition of Al(Si)CuFe Approximant Thin Films Formed by Si Substrate Diffusion
  Thin Solid Films, 2014, 550(1), 105-109.

Simon Olsson, Fredrik Eriksson, Jens Birch and Lars Hultman
  Formation of α-approximant and quasicrystalline Al-Cu-Fe thin films
  Thin Solid Films, 2012, 526, 74-80.
   Fulltext  PDF  
 Web of Science® Times Cited: 2

Manfred Beckers, Fredrik Eriksson, Jonas Lauridsen, C. Baehtz, Jens Jensen and Lars Hultman
  Formation of basal plane fiber-textured Ti2AlN films on amorphous substrates
  PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2010, 4(05-Jun), 121-123.
 Web of Science® Times Cited: 2

Naureen Ghafoor, Fredrik Eriksson, Arkady Mikhaylushkin, Igor Abrikosov, Eric M. Gullikson, Manfred Beckers, U. Kressing, Lars Hultman and Jens Birch
  Effects of O and N impurities on the nanostructural evolution during growth of Cr/Sc multilayers
  Journal of Materials Research, 2009, 24(1), 79-95.
 Web of Science® Times Cited: 2

Fredrik Eriksson, Naureen Ghafoor, F. Schäfers, E. M. Gullikson, S. Aouadi, S. Rohde, Lars Hultman and Jens Birch
  Atomic scale interface engineering by modulated ion-assisted deposition applied to soft x-ray multilayer optics
  Applied Optics, 2008, 47(23), 4196-4204.
 Web of Science® Times Cited: 6

Naureen Ghafoor, Fredrik Eriksson, Eric M Gullikson, Lars Hultman and Jens Birch
  Incorporation of nitrogen in Cr/Sc multilayers giving improved soft x-ray reectivity
  Applied Physics Letters, 2008, 92(9), 091913.
 Web of Science® Times Cited: 7

Fredrik Eriksson, Naureen Ghafoor, Lars Hultman and Jens Birch
  Reflectivity and structural evolution of Cr/Sc and nitrogen containing Cr/Sc multilayers during thermal annealing
  Journal of Applied Physics, 2008, 104(6), 063516.
 Web of Science® Times Cited: 4

Naureen Ghafoor, Fredrik Eriksson, Per O.Å Persson, Lars Hultman and Jens Birch
  Effects of ion-assisted growth on the layer definition in Cr/Sc multilayers
  Thin Solid Films, 2008, 516(6), 982-990.
   Fulltext  PDF  
 Web of Science® Times Cited: 7

Fredrik Eriksson, Naureen Ghafoor, Franz Schäfers, Eric M. Gullikson and Jens Birch
  Interface engineering of short-period Ni/V multilayer X-ray mirrors
  Thin Solid Films, 2006, 500(1-2), 84-95.
 Web of Science® Times Cited: 15

Jens Birch, Torbjörn Joelsson, Fredrik Eriksson, Naureen Ghafoor and Lars Hultman
  Single crystal CrN/ScN superlattice soft X-ray mirrors: epitaxial growth, structure, and properties
  Thin Solid Films, 2006, 514(1-2), 10-19.
 Web of Science® Times Cited: 10

Naureen Ghafoor, Per O. Å. Persson, Fredrik Eriksson, Franz Schäfers and Jens Birch
  Interface engineered ultra-short period Cr/Ti multilayers as high reflectance mirrors and polarizers for soft X-rays of lambda=2.74 nm wavelength
  Applied Optics, 2006, 45(1), 137-143.
 Web of Science® Times Cited: 3

H M Hertz, G A Johansson, H Stollberg, J de Groot, O Hemberg, A Holmberg, S Rehbein, P Jansson, Fredrik Eriksson and Jens Birch
  Table-top X-ray microscopy: Sources, optics and applications
  Journal de Physique IV: Colloque, 2003, 104, 115-119.
 Web of Science® Times Cited: 10

Fredrik Eriksson, GA Johansson, HM Hertz, EM Gullikson, U Kreissig and Jens Birch
  14.5% near-normal incidence reflectance of Cr/Sc x-ray multilayer mirrors for the water window
  Optics Letters, 2003, 28(24), 2494-2496.
 Web of Science® Times Cited: 20

Fredrik Eriksson, G.A. Johansson, H.M. Hertz and Jens Birch
  Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition
  Optical Engineering: The Journal of SPIE, 2002, 41(11), 2903-2909.
 Web of Science® Times Cited: 17

G.A. Johansson, M. Berglund, Fredrik Eriksson, Jens Birch and H.M. Hertz
  Compact soft x-ray reflectometer based on a line-emitting laser-plasma source
  Review of Scientific Instruments, 2001, 72(1 I), 58-62.
 Web of Science® Times Cited: 14

Conference Articles

Andrew L. Aquila, Fahrad Salmassi, Eric M. Gullikson, Fredrik Eriksson and Jens Birch
  Measurements of the optical constants of scandium in the 50-1300 eV range
  SPIE 5538, Optical Constants of Materials for UV to X-Ray Wavelengths, 2004.


Jens Birch, Fredrik Eriksson, G.A. Johansson and H.M. Hertz
  Recent advances in ion-assisted growth of Cr/Sc multilayer X-ray mirrors for the water window
  , 2002.


 Web of Science® Times Cited: 11

Fredrik Eriksson, G.A. Johansson, H.M. Hertz and Jens Birch
  Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion assisted sputter deposition
  Proceedings of SPIE, the International Society for Optical Engineering, 2001.


Ph.D. Theses

Simon Olsson
  Al-based Thin Film Quasicrystals and Approximants
  2013.


  Fulltext PDF

Licentiate Theses

Simon Olsson
  Approximant Phases in Quasicrystalline AlCuFe Thin Films
  2012.