Publications for Farrokh Ghani Zadegan
Co-author map based on ISI articles 2007-

Journal Articles

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
  Access Time Analysis for IEEE P1687
  I.E.E.E. transactions on computers (Print), 2012, 61(10), 1459-1472.
   Fulltext  PDF  
 Web of Science® Times Cited: 3

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
  Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
  IEEE Design & Test of Computers, 2012, 29(2), 79-88.
   Fulltext  PDF  
 Web of Science® Times Cited: 4

Conference Articles

Farrokh Ghani Zadegan, Gunnar Carlsson and Erik Larsson
  Scenario-Based Network Design for P1687
  SSoCC'13, 2013.


Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson and Gunnar Carlsson
  A Study of Instrument Reuse and Retargeting in P1687
  <em>IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011), MNIT Jaipur, India, November 25-26, 2011.</em>, 2011.


Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
  Automated Design for IEEE P1687
  <em>The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011.</em>, 2011.


Golnaz Asani, Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
  Test Scheduling with Constraints for IEEE P1687 (poster)
  International Test Conference (ITC11), Anaheim, CA, USA, September 18-23, 2011., 2011.


Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson and Erik Larsson
  Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
  20th IEEE Asian Test Symposium (ATS11), New Delhi, India, November 21-23, 2011., 2011.


Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
  Design Automation for IEEE P1687
  Design, Automation and Test in Europe (DATE 2011), Grenoble, France., 2011.


Erik Larsson, Farrokh Ghani Zadegan, Urban Ingelsson and Gunnar Carlsson
  Test scheduling on IJTAG
  Nordic Test Forum (NTF 2010), Drammen, Norway., 2010.


Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
  Test Time Analysis for IEEE P1687
  <em>Proceedings of the Asian Test Symposium</em>, 2010.