Publications for Farrokh Ghani Zadegan
Co-author map based on ISI articles 2007-
Journal Articles
Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
Access Time Analysis for IEEE P1687
I.E.E.E. transactions on computers (Print), 2012, 61(10), 1459-1472.
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Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
IEEE Design & Test Magazine, 2012, 29(2), 79-88.
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Conference Articles
Farrokh Ghani Zadegan, Gunnar Carlsson and Erik Larsson
Scenario-Based Network Design for P1687
<em>The 12th Swedish System-on-Chip Conference (SSoCC 2013), Ystad, Sweden, May 6-7, 2013 (not reviewed, not printed).</em>, 2013.
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Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson and Gunnar Carlsson
A Study of Instrument Reuse and Retargeting in P1687
<em>IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011), MNIT Jaipur, India, November 25-26, 2011.</em>, 2011.
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Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
Design Automation for IEEE P1687
Design, Automation and Test in Europe (DATE 2011), Grenoble, France., 2011.
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Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson and Erik Larsson
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
20th IEEE Asian Test Symposium (ATS11), New Delhi, India, November 21-23, 2011., 2011.
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Golnaz Asani, Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
Test Scheduling with Constraints for IEEE P1687 (poster)
International Test Conference (ITC11), Anaheim, CA, USA, September 18-23, 2011., 2011.
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Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
Automated Design for IEEE P1687
<em>The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011.</em>, 2011.
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Erik Larsson, Farrokh Ghani Zadegan, Urban Ingelsson and Gunnar Carlsson
Test scheduling on IJTAG
Nordic Test Forum (NTF 2010), Drammen, Norway., 2010.
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Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson and Erik Larsson
Test Time Analysis for IEEE P1687
<em>19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.</em>, 2010.
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Ph.D., Lic. Theses
