Publications for Ching-Lien Hsiao
Co-author map based on ISI articles 2007-

Keywords

stress sputtering sputter spectroscopy reactive polarization peak nanorods nanorod microscopy magnetron inn gan ev epitaxy epitaxial energy composition alsub>n (0001)

Journal Articles

Junaid Muhammad, Per Sandström, Justinas Palisaitis, Vanya Darakchieva, Ching-Lien Hsiao, Per Persson, Lars Hultman and Jens Birch
  Stress Evolution during Growth of GaN (0001)/Al2O3 (0001) by Reactive DC Magnetron Sputter Epitaxy
  Journal of Physics D: Applied Physics, 2014, 47(14), 145301.

Roger Magnusson, Jens Birch, Per Sandström, Ching-Lien Hsiao, Hans Arwin and Kenneth Järrendahl
  Optical Mueller Matrix Modeling of Chiral AlxIn1-xN Nanospirals
  Thin Solid Films, 2014, , .
   Fulltext  PDF  

Justinas Palisaitis, Ching-Lien Hsiao, Lars Hultman, Jens Birch and Per Persson
  Thermal stability of Al1−xInxN (0 0 0 1) throughout the compositional range as investigated during in situ thermal annealing in a scanning transmission electron microscope
  Acta Materialia, 2013, 61(12), 4683-4688.
   Fulltext  PDF  

Ruei-San Chen, Chih-Che Tang, Ching-Lien Hsiao, Per Olof Holtz and Jens Birch
  Electronic transport properties in aluminum indium nitride nanorods grown by magnetron sputter epitaxy
  Applied Surface Science, 2013, 285, 625-628.
   Fulltext  PDF  

Ching-Lien Hsiao, Justinas Palisaitis, Muhammad Junaid, Per O A Persson, Jens Jensen, Qingxiang Zhao, Lars Hultman, Li-Chyong Chen, Kuei-Hsien Chen and Jens Birch
  Room-temperature heteroepitaxy of single-phase Al1-xInxN films with full composition range on isostructural wurtzite templates
  Thin Solid Films, 2012, 524, 113-120.
   Fulltext  PDF  
 Web of Science® Times Cited: 2

Junaid Muhammad, Daniel Lundin, Justinas Palisaitis, Ching-Lien Hsiao, Vanya Darakchieva, Jens Jensen, Per Persson, Per Sandström, W-J Lai, L-C Chen, K-H Chen, Ulf Helmersson, Lars Hultman and Jens Birch
  Two-domain formation during the epitaxial growth of GaN (0001) on c-plane Al2O3 (0001) by high power impulse magnetron sputtering
  Journal of Applied Physics, 2011, 110(12), 123519.
   Fulltext  PDF  
 Web of Science® Times Cited: 7

Ching-Lien Hsiao, Justinas Palisaitis, Junaid Muhammad, Ruei-San Chen, Per Persson, Per Sandström, Per-Olof Holtz, Lars Hultman and Jens Birch
  Spontaneous Formation of AlInN Core–Shell Nanorod Arrays by Ultrahigh-Vacuum Magnetron Sputter Epitaxy
  Applied Physics Express, 2011, 4(115002), .
   Fulltext  PDF  
 Web of Science® Times Cited: 1

Justinas Palisaitis, Ching-Lien Hsiao, Muhammad Junaid, Jens Birch, Lars Hultman and Per O.Å. Persson
  Effect of strain on low-loss electron energy loss spectra of group III-nitrides
  Physical Review B. Condensed Matter and Materials Physics, 2011, 84(24), 245301.
   Fulltext  PDF  
 Web of Science® Times Cited: 5

Justinas Palisaitis, Ching-Lien Hsiao, Muhammad Junaid, Mengyao Xie, Vanya Darakchieva, Jean-Francois Carlin, Nicolas Grandjean, Jens Birch, Lars Hultman and Per O.Å. Persson
  Standard-free composition measurements of Alx In1–xN by low-loss electron energy loss spectroscopy
  physica status solidi (RRL) – Rapid Research Letters, 2011, 5(2), 50-52.
   Fulltext  PDF  
 Web of Science® Times Cited: 9

Muhammad Junaid, Ching-Lien Hsiao, Justinas Palisaitis, Jens Jensen, Per Persson, Lars Hultman and Jens Birch
  Electronic-grade GaN(0001)/Al2O3(0001) grown by reactive DC-magnetron sputter epitaxy using a liquid Ga target
  Applied Physics Letters, 2011, 98(14), 141915.
   Fulltext  PDF  
 Web of Science® Times Cited: 11

Vanya Darakchieva, N P Barradas, Mengyao Xie, K Lorenz, E Alves, M Schubert, Per Persson, Finn Giuliani, F Munnik, Ching-Lien Hsiao, L W Tu and W J Schaff
  Role of impurities and dislocations for the unintentional n-type conductivity in InN
  PHYSICA B-CONDENSED MATTER, 2009, 404(22), 4476-4481.
 Web of Science® Times Cited: 8

Conference Articles

Kenneth Järrendahl, Jens Birch, Roger Magnusson, Ching-Lien Hsiao, Per Sandström, Torun Berlind, Johan L.I. Gustafson, Lia Fernández del Río, Jan Landin and Hans Arwin
  Polarization of Light Reflected from Chiral Structures - Calculations Compared with Mueller Matrix Ellipsometry Measurements on Natural and Synthetic Samples
  7th Workshop Ellipsometry, Leipzig, March 5-7, 2012, 2012.