Publications for Chao Xia
Co-author map based on ISI articles 2007-
Publications mentioned in social media 4 times*
|Leif I. Johansson, Rickard Armiento, Jose Avila, Chao Xia, Stephan Lorcy, Abrikosov Igor A., Maria C. Asensio and Chariya Virojanadara|
Multiple π-bands and Bernal stacking of multilayer graphene on C-face SiC, revealed by nano-Angle Resolved Photoemission
Scientific Reports, 2014, 4(4157), .
|Somsakul Watcharinyanon, Leif I. Johansson, Chao Xia and Chariya Virojanadara|
Ytterbium oxide formation at the graphene-SiC interface studied by photoemission
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, 2013, 31(2), .
|Chao Xia, Somsakul Watcharinyanon, A A. Zakharov, Leif I. Johansson, Rositsa Yakimova and Chariya Virojanadara|
Detailed studies of Na intercalation on furnace-grown graphene on 6H-SiC(0001)
Surface Science, 2013, 613, 88-94.
Web of Science® Times Cited: 1
|Leif I Johansson, Chao Xia and Chariya Virojanadara|
Na induced changes in the electronic band structure of graphene grown on C-face SiC
Graphene, 2013, 2(1), 1-7.
|Leif Johansson, Chao Xia, Jawad ul Hassan, Tihomir Iakimov, Alexei A. Zarharov, Somsakul Watcharinyanon, Rositza Yakimova, Erik Janzén and Chariya Virojanadara|
Is the Registry Between Adjacent Graphene Layers Grown on C-Face SiC Different Compared to That on Si-Face SiC
Crystals, 2013, 3(1), 1-13.
|Somsakul Watcharinyanon, Leif I Johansson, Chao Xia and Chariya Virojanadara|
Changes in structural and electronic properties of graphene grown on 6H-SiC(0001) induced by Na deposition
Journal of Applied Physics, 2012, 111(8), 083711.
Web of Science® Times Cited: 5
|Chao Xia, Somsakul Watcharinyanon, A A Zakharov, Rositsa Yakimova, Lars Hultman, Leif I Johansson and Chariya Virojanadara|
Si intercalation/deintercalation of graphene on 6H-SiC(0001)
Physical Review B. Condensed Matter and Materials Physics, 2012, 85(4), 045418.
Web of Science® Times Cited: 21
* Social media data based on publications from 2011 to present and with a DOI; data delivered by Altmetric.com.