Publications for Agne Zukauskaite
Co-author map based on ISI articles 2007-

Journal Articles

Nebiha Ben Sedrine, Agne Zukauskaite, Jens Birch, Lars Hultman and Vanya Darakchieva
  Bandgap Engineering and Optical Constants of YxAl1-xN Alloys
  Japanese Journal of Applied Physics, 2013, 52(8), .

Agnė Žukauskaitė, Gunilla Wingqvist, Justinas Pališaitis, Jens Jensen, Per O. Å. Persson, Ramin Matloub, Paul Muralt, Yunseok Kim, Jens Birch and Lars Hultman
  Microstructure and Dielectric Properties of Piezoelectric Magnetron Sputtered w-ScxAl1-xN thin films
  Journal of Applied Physics, 2012, 111(9), 093527.
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 Web of Science® Times Cited: 11

Agnė Žukauskaitė, Christopher Tholander, Justinas Pališaitis, Per O. Å. Persson, Vanya Darakchieva, Nebiha Ben Sedrine, Ferenc Tasnádi, Björn Alling, Jens Birch and Lars Hultman
  YxAl1-xN Thin Films
  Journal of Physics D: Applied Physics, 2012, 45(42), 422001.
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 Web of Science® Times Cited: 4

Sit Kerdsongpanya, Ngo Van Nong, Nini Pryds, Agne Zukauskaite, Jens Jensen, Jens Birch, Jun Lu, Lars Hultman, Gunilla Wingqvist and Per Eklund
  Anomalously high thermoelectric power factor in epitaxial ScN thin films
  Applied Physics Letters, 2011, 99(23), 232113.
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 Web of Science® Times Cited: 10

Gunilla Wingqvist, Ferenc Tasnadi, Agne Zukauskaite, Jens Birch, Hans Arwin and Lars Hultman
  Increased electromechanical coupling in w-ScxAl1-xN
  Applied Physics Letters, 2010, 97(11), 112902.
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 Web of Science® Times Cited: 27

Carina Höglund, Jens Birch, Björn Alling, Javier Bareño, Zsolt Czigány, Per O. Å. Persson, Gunilla Wingqvist, Agne Zukauskaite and Lars Hultman
  Wurtzite-structure Sc1-xAlxN solid solution films grown by reactive magnetron sputter epitaxy: structural characterization and first-principles calculations
  Journal of Applied Physics, 2010, 107(12), 123515.
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 Web of Science® Times Cited: 22

Ph.D. Theses

Agnė Žukauskaitė
  Metastable ScAlN and YAlN Thin Films Grown by Reactive Magnetron Sputter Epitaxy

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Licentiate Theses

Agnė Žukauskaitė
  Metastable YAlN and ScAlN thin films: growth and characterization

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